US4447724A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Apparatus for the chemical analysis of samples
Assignee: Balzers und Leybold Deutschland Holding AG
•
Filing: 1982-01-07
•
Granted: 1984-05-08
•
Expires: 2002-01-07
Abstract
Abstract An apparatus for the chemical analysis of a sample ejects neutral and charged particles from the sample by ion bombardment from a primary ion source. An electric diaphragm passes only the ejected neutral particles for ioniziation in a plasma which is separate from the primary ion source and which serves only for the post-ionization of the neutral particles. The ionized particles are then analyzed by mass spectrometry. Charging of insulating samples by primary ions is prevented by rendering the diaphragm permeable to plasma electrons.
Inventors
- 👤 Hans Oechsner
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 08:41
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/02; H01J49/10; H01J49/105; G; G01; G01N; G01N23/00; G01N23/22; G01N23/225; G01N23/2255; H01J49/04; H01J49/0459; H01J49/0463
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
159 words
Apparatus for the chemical analysis of a sample, comprising: primary ion source means (3) bombarding the sample (1) with ions along an axis (5) for ejecting neutral and charged particles from the sample; electric diaphragm means (10) for being permeable along an axis (13) to the neutral particles ejected from the sample and impermeable at least to the charged particles ejected from the sample; plasma means (7) separate from the primary ion source means (3) and having a plasma along the axis (13) along which the electric diaphragm means (10) is permeable to the neutral particles and receiving the same therealong for ionizing the neutral particles with the plasma; and mass spectrometer means (8, 9) further along the axis (13) along which the electric diaphragm means is permeable than the plasma of the plasma means (7) to receive the now-ionized, formerly-neutral particles therefrom for performing the chemical analysis of the sample from the received ionized, formerly-neutral neutral particles thereof.
Claim 2
Dependent Claim
159 words
Apparatus for the chemical analysis of a sample, comprising: primary ion source means (3) bombarding the sample (1) with ions along an axis (5) for ejecting neutral and charged particles from the sample; electric diaphragm means (10) for being permeable along an axis (13) to the neutral particles ejected from the sample and impermeable at least to the charged particles ejected from the sample; plasma means (7) separate from the primary ion source means (3) and having a plasma along the axis (13) along which the electric diaphragm means (10) is permeable to the neutral particles and receiving the same therealong for ionizing the neutral particles with the plasma; and mass spectrometer means (8, 9) further along the axis (13) along which the electric diaphragm means is permeable than the plasma of the plasma means (7) to receive the now-ionized, formerly-neutral particles therefrom for performing the chemical analysis of the sample from the received ionized, formerly-neutral neutral particles thereof.
Claim 3
Dependent Claim
41 words
The apparatus of claim 1, wherein the electric diaphragm means comprises spaced plates each having an aperture aligned along the axis (13) for the permeability to the neutral particles therealong and electric potentials differing for the impermeability to the charged particles.
Claim 4
Dependent Claim
53 words
The apparatus of claim 2, wherein the plasma has electrons and the electric diaphragm means (10) further comprises means for permeability to at least some of the electrons from the plasma, whereby the electrons from the plasma can prevent insulating samples from being charged, the means comprising the electric potential on the plates.
Claim 5
Dependent Claim
42 words
An apparatus according to claim 2, wherein the axis of the ion source and the axis of the aperture plates are perpendicular to each other and the surface of the sample to be analyzed is located at the intersection of said axes.
Claim 6
Dependent Claim
21 words
An apparatus according to claim 4, wherein the surface of the sample forms an angle of about 45° with said axes.
Claim 7
Dependent Claim
22 words
An apparatus according to claim 2, further comprising means forming a potential barrier between the plasma means and the mass spectrometer means.
Claim 8
Dependent Claim
33 words
An apparatus according to claim 6, wherein the means forming the potential barrier comprises an ion optical device which precedes the mass spectrometer and is supplied with voltage to produce a retarding potential.
Claim 9
Dependent Claim
45 words
An apparatus according to claim 7, wherein the apertures of the plates of the electric diaphragm means and the ion optical device following the plasma are disposed on one axis (13) which forms an angle of about 30° with an axis into the mass spectrometer.
Claim 10
Dependent Claim
16 words
An apparatus according to claim 8, further comprising a particle lens following the primary ion source.
Claim 11
Dependent Claim
123 words
Apparatus for the chemical analysis of a sample comprising: a source for the ion bombardment of a sample, separate means for effective post-ionization of neutral particles ejected from the sample thereby, and a mass spectrometer, said apparatus being characterized by using the electron component of a low-pressure plasma maintained by electron cyclotron wave resonance as post-ionizing medium, by positioning an electric diaphragm comprising a row of aperture plates at different electric potential between the sample and the plasma, said diaphragm being permeable to neutral particles but impermeable to charged particles and including means for effecting same to be permeable in one arbitrary direction to particles having arbitrary charge, and by applying a retarding electric potential barrier between the plasma and the mass spectrometer.
Claim 12
Dependent Claim
123 words
Apparatus for the chemical analysis of a sample comprising: a source for the ion bombardment of a sample, separate means for effective post-ionization of neutral particles ejected from the sample thereby, and a mass spectrometer, said apparatus being characterized by using the electron component of a low-pressure plasma maintained by electron cyclotron wave resonance as post-ionizing medium, by positioning an electric diaphragm comprising a row of aperture plates at different electric potential between the sample and the plasma, said diaphragm being permeable to neutral particles but impermeable to charged particles and including means for effecting same to be permeable in one arbitrary direction to particles having arbitrary charge, and by applying a retarding electric potential barrier between the plasma and the mass spectrometer.
References Cited (Backward Citations)
US3084281A
Cited
US3136908A
Cited
US3376469A
Cited
US3660655A
Cited
US3665185A
Cited
US4132892A
Cited
JPS541248A
Cited
US4166952A
Cited
US4362936A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1987-05-08 | 1987-11-07 | 1988-05-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1991-05-08 | 1991-11-07 | 1992-05-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1995-05-08 | 1995-11-07 | 1996-05-08 | $7700.00 | Window Closed / Lapsed |