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US4426722A Expired / Lapsed US ⏱️ 0.0 years remaining

X-Ray microbeam generator

Assignee: AT&T Inc
•
Filing: 1981-03-12
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Granted: 1984-01-17
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Expires: 2001-03-12
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Abstract

Abstract An arrangement for generating x-ray microbeams includes an electron source for generating an electron beam. The electron beam is directed toward a target comprising discrete x-ray emissive spots. X-rays from the spots are formed into microbeams and directed through an examination field.

Inventors

  • 👤 Osamu Fujimura

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 18:13
CPC Classifications
H; H01; H01J; H01J35/00; H01J35/24; H01J35/30

Claims Analysis

Total Claims: 23
Claim 1
Independent Claim 172 words
An x-ray microbeam generator comprising an electron source for producing an electron beam, means for focusing said electron beam, means for deflecting said focused electron beam, a target responsive to the incidence of said deflected electron beam for producing x-rays, means for forming said x-rays into a microbeam directed through an examination field, characterized in that said target (135 or 235) comprises an anode (140 or 240) having a plurality of spaced spots (130), said spots including material for producing x-rays responsive to the incidence of said electron beam; said electron beam deflection means (112 or 212) comprises means for controlling said electron beam to impinge sequentially upon a plurality of said spots in a predetermined pattern to emit a corresponding sequence of x-rays; and said microbeam forming means (145 or 245) comprises means for selectively blocking said sequence of emitted x-rays so that at least one x-ray from each spot irradiates a different portion of the examination field, the location of said portions being correlated to said predetermined pattern of spots.
Claim 2
Dependent Claim 172 words
An x-ray microbeam generator comprising an electron source for producing an electron beam, means for focusing said electron beam, means for deflecting said focused electron beam, a target responsive to the incidence of said deflected electron beam for producing x-rays, means for forming said x-rays into a microbeam directed through an examination field, characterized in that said target (135 or 235) comprises an anode (140 or 240) having a plurality of spaced spots (130), said spots including material for producing x-rays responsive to the incidence of said electron beam; said electron beam deflection means (112 or 212) comprises means for controlling said electron beam to impinge sequentially upon a plurality of said spots in a predetermined pattern to emit a corresponding sequence of x-rays; and said microbeam forming means (145 or 245) comprises means for selectively blocking said sequence of emitted x-rays so that at least one x-ray from each spot irradiates a different portion of the examination field, the location of said portions being correlated to said predetermined pattern of spots.
Claim 3
Dependent Claim 46 words
Apparatus as in claim 1 further characterized in that said electron beam deflection means (112 or 212) comprises a matrix of aperture lenses (125 or 225) positioned between said means (115, 120 or 215, 220) for controlling said electron beam and said target (135 or 235).
Claim 4
Dependent Claim 39 words
Apparatus as in claim 1 characterized in that said target (135) is perpendicular to the longitudinal axis (106) of said generator (100), whereby x-rays produced responsive to the incidence of said deflected electron beam are transmitted through said target.
Claim 5
Dependent Claim 54 words
Apparatus as in claim 3 further characterized in that said anode (140) comprises a base (310) having a plurality of holes (320), an x-ray emissive plate (340) attached flat against said base (310); and said spots (130) comprise the surfaces of said x-ray emissive plate (340) which define the bottoms of said holes (320).
Claim 6
Dependent Claim 45 words
Apparatus as in claim 3 further characterized in that said anode (140) comprises an x-ray emissive plate (440) having a plurality of cavities (420); and said spots (130) comprise the surfaces of said x-ray emissive plate (440) which define the bottoms of said cavities (420).
Claim 7
Dependent Claim 20 words
Apparatus as in claims 4 or 5 further characterized in that said x-ray emissive plate (340 or 440) comprises tungsten.
Claim 8
Dependent Claim 20 words
Apparatus as in claims 4 or 5 further characterized in that said x-ray emissive plate (340 or 440) comprises gold.
Claim 9
Dependent Claim 48 words
Apparatus as in claim 3 further characterized in that said anode (140) comprises a base (510) having a plurality of x-ray emissive pellets (520) embedded on said base (510); and said spots (130) comprise the surfaces of said x-ray emissive pellets (520) which face said electron beam (550).
Claim 10
Dependent Claim 48 words
Apparatus as in claim 1 further characterized in that said target (235) is perpendicular to the angle between the longitudinal axis (206) and the lateral axis (207) of said generator (200), whereby x-rays produced responsive to the incidence of said deflected electron beam are reflected from said target.
Claim 11
Dependent Claim 47 words
Apparatus as in claim 9 further characterized in that said anode (240) comprises a base (810) having a plurality of x-ray emissive pellets (820) embedded on said base (810); and said spots comprise the surfaces of said x-ray emissive pellets (820) which face said electron beam (850).
Claim 12
Dependent Claim 20 words
Apparatus as in claims 8 or 10 further characterized in that said x-ray emissive pellets (520 or 820) comprise tungsten.
Claim 13
Dependent Claim 20 words
Apparatus as in claims 8 or 10 further characterized in that said x-ray emissive pellets (520 or 820) comprise gold.
Claim 14
Dependent Claim 64 words
Apparatus as in claims 3 or 9 further characterized in that said anode (140 or 240) comprises a plurality of horizontal and vertical bars (905, 910) forming a mesh, a plurality of x-ray emissive plates (920) attached at the intersections of said bars; and said spots (130) comprise the surfaces of said x-ray emissive plates (920) which face said electron source (105 or 205).
Claim 15
Dependent Claim 16 words
Apparatus as in claim 13 further characterized in that said x-ray emissive plates (920) comprise tungsten.
Claim 16
Dependent Claim 16 words
Apparatus as in claim 13 further characterized in that said x-ray emissive plates (920) comprise gold.
Claim 17
Dependent Claim 27 words
Apparatus as in claim 1 further characterized in that said microbeam forming means (145) comprises an x-ray absorptive shield (150) having at least one pinhole lens (155).
Claim 18
Dependent Claim 27 words
Apparatus as in claim 1 further characterized in that said microbeam forming means (145) comprises an x-ray absorptive shield (750) having at least one slit lens (755).
Claim 19
Dependent Claim 47 words
Apparatus as in claims 16 or 17 further characterized in that said generator (100) comprises means (170, 175, 180) for moving said x-ray forming means (145) longitudinally between said target and said examination field, whereby the spatial resolution of microbeams directed through said examination field is alterable.
Claim 20
Dependent Claim 77 words
Apparatus as in claim 1 further characterized in that said x-ray forming means (245) comprises a plurality of x-ray absorptive shields (246, 247, 248), said shields being spaced at different distances between said target (235) and said examination field, and said generator (200) comprises means (270, 280, 290) for selectively positioning any one of said shields in order to intercept x-rays from said target, whereby the spatial resolution of microbeams directed through said examination field is alterable.
Claim 21
Dependent Claim 23 words
Apparatus as in claim 19 further characterized in that said x-ray absorptive shields (246, 247, 248) each have at least one pinhole lens.
Claim 22
Dependent Claim 23 words
Apparatus as in claim 19 further characterized in that said x-ray absorptive shields (246, 247, 248) each have at least one slit lens.
Claim 23
Dependent Claim 35 words
Apparatus as in claim 1 further characterized in that said generator (100 or 200) comprises a detector (165 or 265) responsive to the attenuation of said microbeam within said irradiation field for generating radiopacity signals.

References Cited (Backward Citations)

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USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1987-01-16 1987-07-18 1988-01-17 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1991-01-16 1991-07-18 1992-01-17 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1995-01-16 1995-07-18 1996-01-17 $7700.00 Window Closed / Lapsed

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