Patent US4417945A successfully refreshed from Google Patents.
US4417945A
Expired / Lapsed
US
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Apparatus for chemical etching of a wafer material
Assignee: Shin-Etsu Handotai Co Ltd
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Filing: 1983-01-24
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Granted: 1983-11-29
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Expires: 2003-01-24
Abstract
Abstract An apparatus is provided for chemically etching, for example, a semiconductor wafer material in an etching solution to remove the surface strain caused by mechanical working such as lapping and polishing. The apparatus comprises a disk rotatable around an axis in the solution and provided on the surface with groove-like liquid flow channels and a means for holding the wafer closely side-by-side to face the rotatable disk and the rotatable disk and the wafer are each rotated around its own axis with simultaneous reciprocative movement of the wafer along a radial direction of the disk so that very high degree of uniformity is ensured in the etching effect on the wafer surface.
Inventors
- 👤 Yasuo Komatsuzaki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 14:42
CPC Classifications
H; H10; H10P; H10P50/00; C; C23; C23F; C23F1/00; C23F1/08; C30; C30B; C30B33/00
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
194 words
An apparatus for chemically etching a wafer material in an etching solution contained in an etching vat which comprises (a) a disk rotatable in the etching solution around an axis, said disk being provided with at least one liquid flow channel on at least one of the surfaces, (b) a means for rotating the rotatable disk around the axis thereof, (c) a means for holding the wafer material to face the surface of the rotatable disk provided with the liquid flow channel side-by-side in such a manner that the surface of the wafer material facing the rotatable disk is substantially in parallel with the surface of the rotatable disk and exposed free to the etching solution keeping a narrow gap space formed between the free surface of the wafer material and the surface of the rotatable disk, (d) a means for rotating the wafer material around the axis thereof, and (e) a means for reciprocatively moving the wafer material held by the holding means within a plane parallel with the surface of the rotatable disk in a radial direction of the rotatable disk while the rotatable disk and the wafer material are in rotation.
Claim 2
Independent Claim
194 words
An apparatus for chemically etching a wafer material in an etching solution contained in an etching vat which comprises (a) a disk rotatable in the etching solution around an axis, said disk being provided with at least one liquid flow channel on at least one of the surfaces, (b) a means for rotating the rotatable disk around the axis thereof, (c) a means for holding the wafer material to face the surface of the rotatable disk provided with the liquid flow channel side-by-side in such a manner that the surface of the wafer material facing the rotatable disk is substantially in parallel with the surface of the rotatable disk and exposed free to the etching solution keeping a narrow gap space formed between the free surface of the wafer material and the surface of the rotatable disk, (d) a means for rotating the wafer material around the axis thereof, and (e) a means for reciprocatively moving the wafer material held by the holding means within a plane parallel with the surface of the rotatable disk in a radial direction of the rotatable disk while the rotatable disk and the wafer material are in rotation.
Claim 3
Dependent Claim
25 words
The apparatus as claimed in claim 1 wherein the liquid flow channel is a groove engraved in the rotatable disk in a radial direction thereof.
Claim 4
Dependent Claim
25 words
The apparatus as claimed in claim 1 wherein the liquid flow channel is a spiral groove engraved in the rotatable disk around the center thereof.
Claim 5
Dependent Claim
43 words
The apparatus as claimed in claim 1 wherein the rotatable disk is provided on both of the surfaces each with at least one liquid flow channel and the means for holding the wafer material is provided at each side of the rotatable disk.
Claim 6
Dependent Claim
22 words
The apparatus as claimed in claim 1 wherein the means for holding the wafer material is a sucking unit operated with vacuum.
Claim 7
Dependent Claim
16 words
The apparatus as claimed in claim 1 wherein the disk is rotatable around a vertical axis.
Claim 8
Independent Claim
148 words
A method for chemically etching the surface of a wafer material in an etching solution contained in an etching vat which comprises the steps of (a) holding the wafer material with a holding means in the etching solution in such a manner that one of the surfaces of the wafer material is exposed free to the etching solution and the wafer material is held closely side-by-side to face a disk rotatable in the etching solution around an axis to make a narrow gap space between the free surface of the wafer material and the disk, said disk being provided on the surface facing the wafer material with at least one liquid flow channel, (b) rotating the disk around the axis thereof, (c) rotating the wafer material around the axis thereof, and (d) moving the wafer material reciprocative-ly in parallel with the rotating disk along a radial direction thereof.
Claim 9
Independent Claim
148 words
A method for chemically etching the surface of a wafer material in an etching solution contained in an etching vat which comprises the steps of (a) holding the wafer material with a holding means in the etching solution in such a manner that one of the surfaces of the wafer material is exposed free to the etching solution and the wafer material is held closely side-by-side to face a disk rotatable in the etching solution around an axis to make a narrow gap space between the free surface of the wafer material and the disk, said disk being provided on the surface facing the wafer material with at least one liquid flow channel, (b) rotating the disk around the axis thereof, (c) rotating the wafer material around the axis thereof, and (d) moving the wafer material reciprocative-ly in parallel with the rotating disk along a radial direction thereof.
Claim 10
Dependent Claim
86 words
The method as claimed in claim 7 wherein the rotatable disk is provided on each of the surfaces with at least one liquid flow channel and a pair of the holding means for wafer materials are provided each at one side of the rotatable disk, the wafer material held by a first holding means and having been etched on one surface being received by a second holding means to be held thereby and to expose the other surface to the etching solution to effect etching thereof.
References Cited (Backward Citations)
US2328533A
Cited
US3549439A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-11-28 | 1987-05-30 | 1987-11-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-11-28 | 1991-05-30 | 1991-11-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-11-28 | 1995-05-30 | 1995-11-29 | $7700.00 | Window Closed / Lapsed |