Patent US4414059A successfully refreshed from Google Patents.
US4414059A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Far UV patterning of resist materials
Assignee: International Business Machines Corp
•
Filing: 1982-12-09
•
Granted: 1983-11-08
•
Expires: 2002-12-09
Abstract
Abstract A technique is described for the fabrication of devices and circuits using multiple layers of materials, where patterned layers of resists are required to make the device or circuit. The fabrication process is characterized by the selective removal of portions of the resist layer by ablative photodecomposition. This decomposition is caused by the incidence of ultraviolet radiation of wavelengths less than 220 nm, and power densities sufficient to cause fragmentation of resist polymer chains and the immediate escape of the fragmented portions from the resist layer. Energy fluences in excess of 10 mJ/cm 2 /pulse are typically required. The deliverance of a large amount of energy in this wavelength range to the resist layer in a sufficiently short amount of time causes ablation of the polymer chain fragments. No subsequent development step is required for patterning the resist layer.
Inventors
- 👤 Samuel E. Blum
- 👤 Karen H. Brown
- 👤 Rangaswamy Srinivasan
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 18:06
CPC Classifications
H; H10; H10P; H10P34/00; H10P34/40; H10P34/42; G; G03; G03F; G03F7/00; G03F7/004; G03F7/039; G03F7/20; G03F7/2002; G03F7/2004; H10P50/00; H10P50/20; H10P50/28; H10P50/286; H05; H05K; H05K3/00; H05K3/0011; H05K3/0017; Y; Y10; Y10S; Y10S430/00; Y10S430/146; Y10S438/00; Y10S438/94; Y10S438/942; Y10S438/948; Y10S438/949
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
90 words
In a thin film fabrication process for producing a device or circuit, the steps as follows: providing a substrate including at least one layer therein, depositing a resist layer on said substrate, removing selected areas of said resist layer by irradiation of said selected areas with ultraviolet light of wavelengths less than 220 nm and having a sufficient power density to produce ablative photodecomposition of said irradiated areas to expose portions of said substrate, and causing a change to said exposed portions of said substrate through said patterned resist layer.
Claim 2
Dependent Claim
90 words
In a thin film fabrication process for producing a device or circuit, the steps as follows: providing a substrate including at least one layer therein, depositing a resist layer on said substrate, removing selected areas of said resist layer by irradiation of said selected areas with ultraviolet light of wavelengths less than 220 nm and having a sufficient power density to produce ablative photodecomposition of said irradiated areas to expose portions of said substrate, and causing a change to said exposed portions of said substrate through said patterned resist layer.
Claim 3
Dependent Claim
22 words
The process of claim 1, in which said ultraviolet radiation is pulse radiation having a fluence greater than 10 mJ/cm 2 /pulse.
Claim 4
Dependent Claim
24 words
The method of claim 2, where said ultraviolet radiation is produced by an ArF laser and the wavelength of said radiation is 193 nm.
Claim 5
Dependent Claim
16 words
The process of claim 1, where said resist is either a negative or a positive resist.
Claim 6
Dependent Claim
28 words
The process of claim 1, where the final step thereof is the addition of a layer to said exposed portions of said substrate through said patterned resist layer.
Claim 7
Dependent Claim
25 words
The process of claim 1, where the final step thereof is the etching of said exposed portions of said substrate through said patterned resist layer.
Claim 8
Dependent Claim
33 words
The process of claim 1, where the final step thereof includes the treatment of said exposed portions of said substrate through said patterned resist layer to modify the characteristics of said exposed portions.
Claim 9
Independent Claim
98 words
A method for patterning resist layers of the type used in lithography processes, comprising the steps of: depositing a layer of said resist on a substrate, and irradiating selected areas of said resist layer with ultraviolet radiation having wavelengths less than 220 nm and an energy fluence in excess of that required to break polymer chains in said resist layer to produce enough broken fragments of said chains in a given time that said broken fragments will ablate and escape from said resist, leaving etched areas corresponding to the pattern of ultraviolet radiation incident on said resist layer.
Claim 10
Independent Claim
98 words
A method for patterning resist layers of the type used in lithography processes, comprising the steps of: depositing a layer of said resist on a substrate, and irradiating selected areas of said resist layer with ultraviolet radiation having wavelengths less than 220 nm and an energy fluence in excess of that required to break polymer chains in said resist layer to produce enough broken fragments of said chains in a given time that said broken fragments will ablate and escape from said resist, leaving etched areas corresponding to the pattern of ultraviolet radiation incident on said resist layer.
Claim 11
Dependent Claim
21 words
The method of claim 8, where said resist layer is selected from the group consisting of positive and negative resist materials.
Claim 12
Dependent Claim
11 words
The method of claim 8, where said wavelength is 193 nm.
Claim 13
Dependent Claim
19 words
The method of claim 8, where the fluence of said radiation is in excess of 10 mJ/cm 2 .
Claim 14
Dependent Claim
17 words
The method of claim 8, where said radiation is produced by a laser, and is pulsed radiation.
Claim 15
Dependent Claim
40 words
The method of claim 8, where said radiation is pulse radiation, and wherein the incidence of pulses of radiation on said resist layer is repeated for a sufficient amount of time to remove the entire thickness of said resist layer.
Claim 16
Dependent Claim
19 words
The method of claim 8, where said resist layer is irradiated in small regions less than 1 micron wide.
Claim 17
Independent Claim
44 words
A method for patterning layers of resist material of the types used in lithographic processes, wherein selected areas of said resist layer are irradiated with ultraviolet radiation having wavelengths less than 220 nm and energy fluences in excess of about 10 mJ/cm 2 /pulse.
Claim 18
Independent Claim
44 words
A method for patterning layers of resist material of the types used in lithographic processes, wherein selected areas of said resist layer are irradiated with ultraviolet radiation having wavelengths less than 220 nm and energy fluences in excess of about 10 mJ/cm 2 /pulse.
Claim 19
Dependent Claim
21 words
The method of claim 15, where said radiation is produced by an ArF laser having an output wavelength of 193 nm.
Claim 20
Dependent Claim
34 words
The method of claim 15, where said ultraviolet radiation is pulsed radiation, the incidence of said pulses of radiation on said resist layer continuing until said resist layer is removed through its entire thickness.
References Cited (Backward Citations)
US3650796A
Cited
US3696742A
Cited
US4054094A
Cited
US4086091A
Cited
US4276369A
Cited
US4247496A
Cited
US4379299A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-11-07 | 1987-05-09 | 1987-11-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-11-07 | 1991-05-09 | 1991-11-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-11-07 | 1995-05-09 | 1995-11-08 | $7700.00 | Window Closed / Lapsed |