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US4412240A
Expired / Lapsed
US
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Semiconductor integrated circuit and wiring method
Assignee: Fujitsu Ltd
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Filing: 1980-02-22
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Granted: 1983-10-25
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Expires: 2000-02-22
Abstract
Abstract A large scale semiconductor integrated circuit and its wiring method employing a grid system where the layout space is partitioned in the form of a grid by vertical and horizontal line group having an interval larger than a length corresponding to a minimum dimension for a patterning in a manufacturing process; wiring patterns for making connection between each cell which is a unit of layout are depicted on such vertical and horizontal lines; and wirings are made on the basis of the wiring patterns. An interval (d) of these vertical and horizontal lines of the grid is the greatest common factor of the minimum wiring pitches of several overlapped wiring layers and is selected to a dimension which is smaller than said wiring pitch; and the vertical and horizontal line patterns are depicted on the vertical and horizontal lines having the same interval. The vertical and horizontal dimensions of the cell are an integer multiple of the interval (d) of the grid and cell terminals are disposed in an allowable wiring locations on the grid.
Inventors
- 👤 Hideo Kikuchi
- 👤 Shigenori Baba
- 👤 Shoji Sato
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 14:00
CPC Classifications
H; H03; H03K; H03K19/00; H03K19/02; H03K19/173; H03K19/1733; H03K19/1735; G; G06; G06F; G06F30/00; G06F30/30; G06F30/39; G06F30/394; H10; H10D; H10D89/00; H10D89/10
Claims Analysis
Total Claims: 15
Claim 1
Independent Claim
143 words
A semiconductor integrated circuit having a top side of overlapped wiring layers, each layer having a respective minimum wiring pitch, said circuit comprising: connection wirings formed on respective ones of said overlapped wiring layers, and spaced in accordance with a grid having square meshes with an interval which is larger than a length corresponding to a minimum dimension for patterning in a manufacturing process for making said integrated circuit and corresponding to the respective wiring pitches of the overlapped wiring layers, said respective wiring pitches being expressed by a maximum integer unit which is not a prime number; and circuit cells respectively connected to corresponding ones of said connection wirings, said circuit cells having vertical and horizontal dimensions corresponding to respective integer multiples of said interval, and terminals spaced in accordance with said grid, for connection to corresponding ones of said connection wirings.
Claim 2
Dependent Claim
143 words
A semiconductor integrated circuit having a top side of overlapped wiring layers, each layer having a respective minimum wiring pitch, said circuit comprising: connection wirings formed on respective ones of said overlapped wiring layers, and spaced in accordance with a grid having square meshes with an interval which is larger than a length corresponding to a minimum dimension for patterning in a manufacturing process for making said integrated circuit and corresponding to the respective wiring pitches of the overlapped wiring layers, said respective wiring pitches being expressed by a maximum integer unit which is not a prime number; and circuit cells respectively connected to corresponding ones of said connection wirings, said circuit cells having vertical and horizontal dimensions corresponding to respective integer multiples of said interval, and terminals spaced in accordance with said grid, for connection to corresponding ones of said connection wirings.
Claim 3
Dependent Claim
45 words
A semiconductor integrated circuit as claimed in claim 1, wherein the minimum wiring pitch of a first wiring layer is 10 μm, the minimum wiring pitch of a second wiring layer is 14 μm and the greatest common factor is selected to be 5 μm.
Claim 4
Dependent Claim
30 words
A semiconductor integrated circuit as claimed in claim 2, wherein the minimum wiring pitch of a third wiring layer is 17 μm and the greatest common factor is 5 μm.
Claim 5
Dependent Claim
23 words
A semiconductor integrated circuit as claimed in claim 1, wherein all said horizontal and vertical wirings are respectively disposed on different wiring layers.
Claim 6
Dependent Claim
23 words
A semiconductor integrated circuit as claimed in claim 1, wherein said vertical and horizontal wirings are disposed on the same said wiring layer.
Claim 7
Dependent Claim
36 words
A semiconductor integrated circuit as claimed in claim 1, wherein each of said circuit cells can be mounted in a first position and in a second position which is rotated 90 degrees from said first position.
Claim 8
Independent Claim
198 words
A method for wiring a semiconductor integrated circuit having a top side of overlapped wiring layers, each layer having a minimum wiring pitch, said method comprising the steps of: (a) partitioning the top side in the form of a grid with a vertical line group and a horizontal line group, the lines of the vertical and horizontal line groups having an interval larger than a length corresponding to a minimum dimension for patterning in a manufacturing process; (b) positioning circuit cells of the integrated circuit in accordance with the grid, each cell having dimensions corresponding to respective integer multiples of the interval; (c) forming wiring patterns for connection between the cells spaced in accordance with the vertical and horizontal lines, the vertical and horizontal wiring patterns being formed on the same or a different overlapped wiring layer in accordance with the vertical and horizontal lines having the interval, the interval of the vertical and horizontal lines of the grid being selected to be a dimension corresponding to the greatest common factor of the respective minimum wiring pitches of the overlapped wiring layers, the respective minimum wiring pitches being expressed by a maximum integer unit not a prime number.
Claim 9
Independent Claim
198 words
A method for wiring a semiconductor integrated circuit having a top side of overlapped wiring layers, each layer having a minimum wiring pitch, said method comprising the steps of: (a) partitioning the top side in the form of a grid with a vertical line group and a horizontal line group, the lines of the vertical and horizontal line groups having an interval larger than a length corresponding to a minimum dimension for patterning in a manufacturing process; (b) positioning circuit cells of the integrated circuit in accordance with the grid, each cell having dimensions corresponding to respective integer multiples of the interval; (c) forming wiring patterns for connection between the cells spaced in accordance with the vertical and horizontal lines, the vertical and horizontal wiring patterns being formed on the same or a different overlapped wiring layer in accordance with the vertical and horizontal lines having the interval, the interval of the vertical and horizontal lines of the grid being selected to be a dimension corresponding to the greatest common factor of the respective minimum wiring pitches of the overlapped wiring layers, the respective minimum wiring pitches being expressed by a maximum integer unit not a prime number.
Claim 10
Dependent Claim
87 words
A wiring method as claimed in claim 7, wherein in step (a), the interval corresponds to a value of 1/2 of the minimum wiring pitch of a first wiring layer being equal to 1/3 of the minimum wiring pitch of a second wiring layer; and wherein step (c) further includes forming the first wiring layer in accordance with the vertical and horizontal lines, using only every other line, and forming the second wiring layer in accordance with the vertical and horizontal lines, using every other two lines.
Claim 11
Dependent Claim
46 words
A wiring method as claimed in claim 7 or 8, wherein the minimum wiring pitch of a first wiring layer is 10 μm, the minimum wiring pitch of a second wiring layer is 14 μm and the greatest common factor is selected to be 5 μm.
Claim 12
Dependent Claim
29 words
A wiring method as claimed in claim 9, wherein the minimum wiring pitch of a third wiring layer is 17 μm and the greatest common factor is 5 μm.
Claim 13
Dependent Claim
22 words
A wiring method as claimed in claim 7, wherein said horizontal and vertical wiring patterns are respectively disposed on different wiring layers.
Claim 14
Dependent Claim
23 words
A wiring method as claimed in claim 7, wherein said vertical and horizontal wiring patterns are disposed on the same said wiring layer.
Claim 15
Dependent Claim
37 words
A wiring method as claimed in claim 7 or 8, wherein each of said circuit cells can be mounted in a first position and in a second position which is rotated 90 degrees from said first position.
References Cited (Backward Citations)
US4278897A
Cited
US4295149A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-10-24 | 1987-04-25 | 1987-10-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-10-24 | 1991-04-25 | 1991-10-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-10-24 | 1995-04-25 | 1995-10-25 | $7700.00 | Window Closed / Lapsed |