US4396996A
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Monolithic static memory cell and method for its operation
Assignee: Siemens AG
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Filing: 1981-08-19
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Granted: 1983-08-02
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Expires: 2001-08-19
Abstract
Abstract A monolithic static memory cell has two cross-coupled inverters each comprised of a series connection of a field effect switching transistor and a load element designed as a field effect transistor. The field effect transistors forming the load elements have their channel resistances of different values. A gate insulating layer of one of the load element field effect transistors has its charge state altered, preferably by electron beam writing, so that a change in a threshold voltage of the one transistor results in a change of its channel resistance relative to the channel resistance of the other load element transistor if it was under before the selective altering, or vice-versa.
Inventors
- 👤 William G. Oldham
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 21:40
CPC Classifications
G; G11; G11C; G11C7/00; G11C7/20
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
119 words
A monolithic static memory cell, comprising: two cross-coupled inverters each comprised of a series connection of a field effect switching transistor and a load element designed as a field effect transistor with a gate insulating layer and which is connected to a supply voltage; the field effect transistors forming the load elements having channel resistances of different values; and means for selectively altering charge state of said gate insulating layer of one of the load element field effect transistors such that a change in a threshold voltage of the one transistor results in a change of its channel resistance over the channel resistance of the other load element transistor if it was under before the selective altering, or vice-versa.
Claim 2
Dependent Claim
119 words
A monolithic static memory cell, comprising: two cross-coupled inverters each comprised of a series connection of a field effect switching transistor and a load element designed as a field effect transistor with a gate insulating layer and which is connected to a supply voltage; the field effect transistors forming the load elements having channel resistances of different values; and means for selectively altering charge state of said gate insulating layer of one of the load element field effect transistors such that a change in a threshold voltage of the one transistor results in a change of its channel resistance over the channel resistance of the other load element transistor if it was under before the selective altering, or vice-versa.
Claim 3
Dependent Claim
24 words
A cell according to claim 1 wherein the means for selectively altering comprises electron beam induced or written charge carriers in the insulating layer.
Claim 4
Dependent Claim
27 words
A monolithic static memory cell according to claim 1 wherein the field effect transistors forming the load elements have different quotients of channel width to channel length.
Claim 5
Dependent Claim
25 words
A monolithic static memory cell according to claim 1 wherein said means for selectively altering comprises a conducting layer inserted into the gate insulating layer.
Claim 6
Dependent Claim
21 words
A monolithic cell according to claim 1 wherein said means for selectively altering comprises impurities inserted into the gate insulating layer.
Claim 7
Dependent Claim
44 words
A monolithic static memory cell according to claim 1 wherein at least one of the field effect transistors which form the load elements is designed as a transistor whose gate-insulating layer comprises a SiO 2 layer and an adjacent Si 3 N 4 layer.
Claim 8
Independent Claim
190 words
A method for the operation of a monolithic static memory, comprising the steps of: providing two cross-coupled inverters each comprised of a series connection of a field effect switching transistor and a load element designed as a field effect transistor, the load element field effect transistors having differing channel resistances; selectively altering when operationally desired a charge state of a gate insulating layer of one of the load element field effect transistors such that a change in a threshold voltage of the one transistor results in a change of its channel resistance over the channel resistance of the other load element transistor if it was under before the selective altering or vice-versa; said selective altering including the steps of deflecting an electron beam of an electron beam writer such that it selectively scans the channel region of the field effect transistor, a current density, influence duration, and acceleration voltage of the electron beam being selected such that the beam generates in the gate insulating layer a positive charge which moves the value of the threshold voltage from a lower value existing without this charging to a higher value or vice-versa.
Claim 9
Independent Claim
190 words
A method for the operation of a monolithic static memory, comprising the steps of: providing two cross-coupled inverters each comprised of a series connection of a field effect switching transistor and a load element designed as a field effect transistor, the load element field effect transistors having differing channel resistances; selectively altering when operationally desired a charge state of a gate insulating layer of one of the load element field effect transistors such that a change in a threshold voltage of the one transistor results in a change of its channel resistance over the channel resistance of the other load element transistor if it was under before the selective altering or vice-versa; said selective altering including the steps of deflecting an electron beam of an electron beam writer such that it selectively scans the channel region of the field effect transistor, a current density, influence duration, and acceleration voltage of the electron beam being selected such that the beam generates in the gate insulating layer a positive charge which moves the value of the threshold voltage from a lower value existing without this charging to a higher value or vice-versa.
Claim 10
Dependent Claim
96 words
A method according to claim 7 including the further steps of commonly displacing threshold voltages of both field effect transistors forming the load elements by irradiation, both field effect transistor gates being positively charged, and following this, selectively irradiating a channel region of one of the two load element field effect transistors with an electron beam whose current density, influence duration, and acceleration voltage are selected such that the gate insulating layer of this field effect transistor heats to a temperature whereby it is again discharged so that its threshold voltage again assumes its original value.
Claim 11
Dependent Claim
117 words
A method for the operation of a monolithic static memory cell according to claim 7 including the further steps of first negatively charging gate insulating layers of both field effect transistors which form the load elements such that these field effect transistors experience a common shift of their threshold voltages and, following this, selectively irradiating a channel region of one of these field effect transistors with an electron beam of an electron beam writer whose current density, influence duration, and acceleration voltage are selected such that the gate insulating layer of the one field effect transistor heats to a temperature such that it is again discharged and has a threshold voltage which corresponds to the original value.
Claim 12
Independent Claim
143 words
A method for the operation of a monolithic static memory, comprising the steps of: providing two cross-coupled inverters each comprised of a series connection of a field effect switching transistor and a load element designed as a field effect transistor; providing differing channel resistances for the load element field effect transistors such that when the cell is energized, it switches to a first state automatically; and selectively altering when operationally desired a charge state of the gate insulating layer of one of the load element field effect transistors such that a change in a threshold voltage of the one transistor results in a change of its channel resistance over the channel resistance of the other load element transistor if it was under before the selective altering or vice-versa such that the memory cell will assume a second state rather than the first state.
Claim 13
Independent Claim
143 words
A method for the operation of a monolithic static memory, comprising the steps of: providing two cross-coupled inverters each comprised of a series connection of a field effect switching transistor and a load element designed as a field effect transistor; providing differing channel resistances for the load element field effect transistors such that when the cell is energized, it switches to a first state automatically; and selectively altering when operationally desired a charge state of the gate insulating layer of one of the load element field effect transistors such that a change in a threshold voltage of the one transistor results in a change of its channel resistance over the channel resistance of the other load element transistor if it was under before the selective altering or vice-versa such that the memory cell will assume a second state rather than the first state.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-08-01 | 1987-01-31 | 1987-08-02 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-08-01 | 1991-01-31 | 1991-08-02 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-08-01 | 1995-01-31 | 1995-08-02 | $7700.00 | Window Closed / Lapsed |