US4389273A
Expired / Lapsed
US
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Method of manufacturing a semiconductor device
Assignee: USPHILIPS Corp A CORP OF
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Filing: 1981-07-15
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Granted: 1983-06-21
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Expires: 2001-07-15
Abstract
Abstract A method of manufacturing a semiconductor device in which a monocrystalline material is epitaxially grown on a disc-shaped monocrystalline substrate. The substrate is placed in an elongate reactor and a gas flow in the longitudinal direction is passed over the substrate while a temperature gradient is maintained in the gas flow. The gas flow initially contains the reaction components in equilibrium with the material to be grown, and the gas flow becomes supersaturated with respect to the material to be grown as the temperature gradient is traversed. If the temperature gradient is selected so that the gas flow becomes undersaturated with respect to the material to be grown, etching will take place.
Inventors
- 👤 Jan Bloem
- 👤 Cornelis H. J. van den Brekel
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 14:29
CPC Classifications
C; C30; C30B; C30B25/00; C30B25/02; C30B25/16; C30B25/165
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
225 words
A method of manufacturing a semiconductor device in which monocrystalline material is epitaxially grown on disc-shaped monocrystalline substrates in an elongate reactor from a gas flow in the longitudinal direction of the reactor, wich comprises: establishing a temperature gradient in the gas flow within the reactor during the epitaxial growth in the direction of gas flow between a first upstream cross-section which is at a first temperature extreme and a second downstream cross-section which is at a second temperature extreme, both of said temperature extremes being above about 900° C.; locating said substrates in the reactor between said upstream and downstream cross-sections so that the substrates are positioned between said first and second temperature extremes and the epitaxial growth process occurs at different temperatures; providing the gas flow with the reaction components of the growth process in a composition which is in equilibrium with the material to be grown at said first temperature extreme upstream of the gas flow; and selecting said second temperature extreme with respect to said first temperature extreme such that the gas flow becomes supersaturated with respect to the material to be grown upon traversing said temperature gradient between said first and second temperature extremes, so that said growth process is substantially determined by diffusion and yet said monocrystalline material is epitaxially grown on said substrate in a substantially homogeneous manner.
Claim 2
Independent Claim
225 words
A method of manufacturing a semiconductor device in which monocrystalline material is epitaxially grown on disc-shaped monocrystalline substrates in an elongate reactor from a gas flow in the longitudinal direction of the reactor, wich comprises: establishing a temperature gradient in the gas flow within the reactor during the epitaxial growth in the direction of gas flow between a first upstream cross-section which is at a first temperature extreme and a second downstream cross-section which is at a second temperature extreme, both of said temperature extremes being above about 900° C.; locating said substrates in the reactor between said upstream and downstream cross-sections so that the substrates are positioned between said first and second temperature extremes and the epitaxial growth process occurs at different temperatures; providing the gas flow with the reaction components of the growth process in a composition which is in equilibrium with the material to be grown at said first temperature extreme upstream of the gas flow; and selecting said second temperature extreme with respect to said first temperature extreme such that the gas flow becomes supersaturated with respect to the material to be grown upon traversing said temperature gradient between said first and second temperature extremes, so that said growth process is substantially determined by diffusion and yet said monocrystalline material is epitaxially grown on said substrate in a substantially homogeneous manner.
Claim 3
Dependent Claim
37 words
A method as claimed in claim 1, wherein the disc-shaped substrates are placed with their major surfaces parallel to each other and at a short mutual distance apart as compared with the dimensions of the major surfaces.
Claim 4
Dependent Claim
23 words
A method as claimed in claim 1 or 2, wherein the temperature gradient is adjusted by heating via the wall of the reactor.
Claim 5
Dependent Claim
20 words
A method as claimed in claim 2, wherein the substrates are arranged parallel to the direction of the gas flow.
Claim 6
Dependent Claim
25 words
A method as claimed in claim 1, wherein, prior to the epitaxial growth, the substrates are arranged pairwise with their major surfaces against each other.
Claim 7
Dependent Claim
31 words
A method as claimed in claim 1, wherein a major surface of the substrates not to be processed is covered with a layer masking against growth prior to the epitaxial growth.
Claim 8
Dependent Claim
29 words
A method as claimed in claim 6, wherein a substrate is placed with its major surface to be processed located opposite to the masking layer of the adjacent substrate.
Claim 9
Dependent Claim
28 words
A method as claimed in claim 1, wherein an epitaxial silicon layer is grown on a silicon substrate from a gas flow containing silicon, a halogen and hydrogen.
Claim 10
Dependent Claim
14 words
A method as claimed in claim 8, wherein chlorine is chosen as the halogen.
Claim 11
Dependent Claim
29 words
A method as claimed in claim 1, wherein prior to the epitaxial growth the gas flow is equilibrated at the first temperature extreme with the material to be grown.
Claim 12
Dependent Claim
23 words
A method as claimed in claim 10, wherein the gas flow under equilibration comprises a halogen and hydrogen and is free from silicon.
Claim 13
Dependent Claim
174 words
A method as claimed in claim 1, wherein prior to the epitaxial growth the substrates are etched in said elongate reactor from a second gas flow in the longitudinal direction of the reactor, in which a temperature gradient in the direction of the second gas flow is maintained in the elongate reactor during etching in the second gas flow between a cross-section upstream of the gas flow where a third temperature extreme prevails and a cross-section downstream of the second gas flow where a fourth temperature extreme prevails, wherein during etching the substrates are situated in a temperature range between the last-mentioned temperature extremes and etching occurs at different temperatures, and wherein the starting point is a second gas flow which contains the reaction components of the etching process in a composition which is in equilibrium with the material to be etched at the third temperature extreme prevailing upstream of the second gas flow and, upon traversing the last-mentioned gradient, the second gas flow is undersaturated with respect to the material to be etched.
Claim 14
Dependent Claim
72 words
A method as claimed in claim 12, wherein the location of the substrates in the reactor where etching occurs is the same as that where the epitaxial growth occurs, the temperature gradients for etching and growth are the same, the second temperature extreme is equal to the third temperature extreme and the first temperature extreme is equal to the fourth temperature extreme, and the first and second gas flows have opposite directions.
Claim 15
Dependent Claim
39 words
A method as claimed in claim 1, wherein prior to the epitaxial growth the substrates are subjected to an isothermal treatment in a gas flow which is in equilibrium with the material to be etched at the treatment temperature.
Claim 16
Dependent Claim
25 words
A method as claimed in claim 14, wherein the major surface on which the epitaxial growth occurs is first subjected to an ion implantation treatment.
Claim 17
Dependent Claim
23 words
A method as claimed in claim 14 or 15, wherein the treatment temperature is equal to the first or the third temperature extreme.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-06-20 | 1986-12-20 | 1987-06-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-06-20 | 1990-12-20 | 1991-06-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-06-20 | 1994-12-20 | 1995-06-21 | $7700.00 | Window Closed / Lapsed |