US4389256A
Expired / Lapsed
US
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Method of manufacturing pn junction in group II-VI compound semiconductor
Assignee: Individual
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Filing: 1981-06-05
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Granted: 1983-06-21
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Expires: 2001-06-05
Abstract
Abstract A method of manufacturing a pn junction in a substantially n-type ZnSe compound semiconductor crystal grown by relying on a liquid growth method using temperature difference technique, by diffusing therein gold which is a p-type impurity or by forming therein a gold alloy in an inert gas atmosphere. This impurity has such a high diffusion velocity as can suppress the vaporization, from ZnSe crystal, of Se atoms having a vaporization speed lower than the diffusion speed of gold, and thus desired pn junction can be formed.
Inventors
- 👤 Jun-ichi Nishizawa
- 👤 Kazuomi Ito
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 21:43
CPC Classifications
H; H10; H10H; H10H20/00; H10H20/01; H10H20/011; H10H20/012; C; C30; C30B; C30B29/00; C30B29/10; C30B29/46; C30B29/48; C30B31/00; C30B31/02; H10D; H10D62/00; H10D62/80; H10D62/86; H10D62/864; H10P; H10P32/00; H10P32/10; H10P32/12; H10P32/14; H10P32/17; H10P95/00; H10P95/50; Y; Y10; Y10S; Y10S438/00; Y10S438/971
Claims Analysis
Total Claims: 17
Claim 1
Independent Claim
102 words
A method of manufacturing a pn junction with a II-VI compound semiconductor selected from ZnSe, CdS and ZnS, said method comprising: controlling the vapor pressure of that component element of the compound semiconductor having a higher vapor pressure than the other component element, to a predetermined level during crystal growth by the temperature difference liquid crystal growth method, thereby producing a II-VI compound semiconductor mono-crystal; and doping an acceptor impurity under controlled temperature conditions such that the stoichiometry of the mono-crystal remains substantially constant and the density of the donor level is not greater than the density of the acceptor impurity added.
Claim 2
Independent Claim
102 words
A method of manufacturing a pn junction with a II-VI compound semiconductor selected from ZnSe, CdS and ZnS, said method comprising: controlling the vapor pressure of that component element of the compound semiconductor having a higher vapor pressure than the other component element, to a predetermined level during crystal growth by the temperature difference liquid crystal growth method, thereby producing a II-VI compound semiconductor mono-crystal; and doping an acceptor impurity under controlled temperature conditions such that the stoichiometry of the mono-crystal remains substantially constant and the density of the donor level is not greater than the density of the acceptor impurity added.
Claim 3
Dependent Claim
24 words
The method according to claim 1 in which the II-VI compound semiconductor is ZnSe and Se is the element whose vapor pressure is controlled.
Claim 4
Dependent Claim
14 words
The method according to claim 1 or 2 in which the impurity is gold.
Claim 5
Dependent Claim
27 words
The method according to claim 1 or 2 in which: the impurity is thermally diffused into the mono-crystal which diffusion is conducted in an inert gas atmosphere.
Claim 6
Dependent Claim
13 words
The method according to claim 4 in which the inert gas is argon.
Claim 7
Dependent Claim
25 words
The method according to claim 4 in which the impurity thermally diffused at a temperature in the range of about 300° to about 400° C.
Claim 8
Dependent Claim
14 words
The method according to claim 1 in which the impurity is added by alloying.
Claim 9
Dependent Claim
31 words
The method according to claim 4 in which ZnSe is subjected to a heat treatment in a Zn-rich atmosphere prior to the addition of the acceptor impurity to the ZnSe mono-crystal.
Claim 10
Dependent Claim
25 words
The method according to claim 1 in which the injection luminescence from the resulting pn junction has a wavelength of not more than 5500 A.
Claim 11
Independent Claim
122 words
A method of manufacturing a ZnSe pn junction having an injection luminescence of not greater than 5500 A in a ZnSe compound semiconductor, said method comprising the steps of: (1) controlling the vapor pressure of Se during crystal growth by the temperature difference liquid crystal growth method so that substantially all of the Se remains in the ZnSe mono-crystal and the stoichiometry of the ZnSe mono-crystal remains substantially constant thereby producing a ZnSe semiconductor mono-crystal; and (2) introducing an acceptor impurity into the ZnSe compound semiconductor maintained in an inert gas atmosphere by doping while controlling the temperature conditions to maintain the stoichiometry of the ZnSe mono-crystal and thermally diffusing the acceptor impurity into the ZnSe mono-crystal in an inert gas atmosphere.
Claim 12
Independent Claim
122 words
A method of manufacturing a ZnSe pn junction having an injection luminescence of not greater than 5500 A in a ZnSe compound semiconductor, said method comprising the steps of: (1) controlling the vapor pressure of Se during crystal growth by the temperature difference liquid crystal growth method so that substantially all of the Se remains in the ZnSe mono-crystal and the stoichiometry of the ZnSe mono-crystal remains substantially constant thereby producing a ZnSe semiconductor mono-crystal; and (2) introducing an acceptor impurity into the ZnSe compound semiconductor maintained in an inert gas atmosphere by doping while controlling the temperature conditions to maintain the stoichiometry of the ZnSe mono-crystal and thermally diffusing the acceptor impurity into the ZnSe mono-crystal in an inert gas atmosphere.
Claim 13
Dependent Claim
13 words
The method according to claim 10 in which the acceptor impurity is gold.
Claim 14
Dependent Claim
33 words
The method according to claim 10 in which the acceptor impurity is thermally diffused into the ZnSe compound semiconductor in step (2) at a temperature of about 300° C. to about 400° C.
Claim 15
Independent Claim
177 words
A method of manufacturing a ZnSe pn junction having an injection luminescence of not greater than 5500 A in a ZnSe compound semiconductor, said method comprising the steps of: (a) providing a ZnSe crystal substrate having an ohmic contact on one surface thereof and a silver film vacuum deposited on the other surface thereof; (b) introducing the ZnSe crystal substrate into a closed container provided with means for flowing an inert gas over the ZnSe crystal substate; (c) introducing a vessel containing Se metal into the container; (d) evacuating the container then flowing an inert gas over the Se metal and, in turn, over the ZnSe substate; (e) maintaining the ZnSe crystal substrate at temperature T 1 and maintaining the Se metal at temperature T 2 ; and (f) independently controlling T 1 and T 2 to supply Se vapor to the inert gas while controlling the vaporization of Se from the ZnSe crystal substrate by heating the container to a temperature of about 300° C. to about 400° C., then allowing the heated chamber to cool.
Claim 16
Independent Claim
177 words
A method of manufacturing a ZnSe pn junction having an injection luminescence of not greater than 5500 A in a ZnSe compound semiconductor, said method comprising the steps of: (a) providing a ZnSe crystal substrate having an ohmic contact on one surface thereof and a silver film vacuum deposited on the other surface thereof; (b) introducing the ZnSe crystal substrate into a closed container provided with means for flowing an inert gas over the ZnSe crystal substate; (c) introducing a vessel containing Se metal into the container; (d) evacuating the container then flowing an inert gas over the Se metal and, in turn, over the ZnSe substate; (e) maintaining the ZnSe crystal substrate at temperature T 1 and maintaining the Se metal at temperature T 2 ; and (f) independently controlling T 1 and T 2 to supply Se vapor to the inert gas while controlling the vaporization of Se from the ZnSe crystal substrate by heating the container to a temperature of about 300° C. to about 400° C., then allowing the heated chamber to cool.
Claim 17
Dependent Claim
21 words
The method according to claim 13 in which the temperature of step (f) is about 330° C. to about 350° C.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-06-20 | 1986-12-20 | 1987-06-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-06-20 | 1990-12-20 | 1991-06-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-06-20 | 1994-12-20 | 1995-06-21 | $7700.00 | Window Closed / Lapsed |