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Photoelectrochemical cells

Assignee: AT&T Inc
•
Filing: 1981-02-13
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Granted: 1983-06-14
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Expires: 2001-02-13
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Abstract

Abstract Photovoltaic devices are fabricated by forming a thin passivating layer, for example, an oxide layer on a semiconductor material. The passivating layer on the semiconductor material is then contacted with an electrolyte such as an electrolyte containing vanadium ions. The resulting electrolyte/passivating layer/semiconductor (EPLS) structure exhibits excellent solar conversion efficiencies and good stability.

Inventors

  • 👤 Klaus J. Bachmann
  • 👤 Hans-Joachim Lewerenz
  • 👤 Maria T. A. S. Menezes

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-02 21:57
CPC Classifications
H; H01; H01G; H01G9/00; H01G9/20; H01M; H01M14/00; H01M14/005

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 112 words
A device comprising an electrolyte, a semiconductor electrode, and means for electrically contacting said electrolyte and said semiconductor electrode characterized in that a passivating layer is formed on said semiconductor electrode by a process comprising a cyclic electrolyte technique, wherein said passivating layer is continuous, and is sufficiently thin so that tunneling of electrons through said passivating layer is allowed, wherein the energy difference between the Fermi level and the majority carrier band of said semiconductor material is smaller than the energy difference at infinite separation between said majority carrier band and the redox level of said electrolyte, and whereby when light is absorbed in said semiconductor material electrical power is generated.
Claim 2
Independent Claim 112 words
A device comprising an electrolyte, a semiconductor electrode, and means for electrically contacting said electrolyte and said semiconductor electrode characterized in that a passivating layer is formed on said semiconductor electrode by a process comprising a cyclic electrolyte technique, wherein said passivating layer is continuous, and is sufficiently thin so that tunneling of electrons through said passivating layer is allowed, wherein the energy difference between the Fermi level and the majority carrier band of said semiconductor material is smaller than the energy difference at infinite separation between said majority carrier band and the redox level of said electrolyte, and whereby when light is absorbed in said semiconductor material electrical power is generated.
Claim 3
Dependent Claim 11 words
The device of claim 1 wherein said semiconductor material is InP.
Claim 4
Dependent Claim 15 words
The device of claim 1 or 2 wherein said passivating layer is a native film.
Claim 5
Dependent Claim 13 words
The device of claim 3 wherein said native film is a native oxide.
Claim 6
Dependent Claim 11 words
The device of claim 3 wherein said electrolyte contains vanadium ions.
Claim 7
Dependent Claim 11 words
The device of claim 1 wherein said electrolyte contains vanadium ions.
Claim 8
Dependent Claim 17 words
The device of claim 1 wherein said passivating layer is formed in an electrolyte containing vanadium ions.
Claim 9
Dependent Claim 16 words
The device of claim 1 wherein said means for contacting said electrolyte is a platinum electrode.

References Cited (Backward Citations)

US4343870A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-06-13 1986-12-13 1987-06-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-06-13 1990-12-13 1991-06-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-06-13 1994-12-13 1995-06-14 $7700.00 Window Closed / Lapsed

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