US4376891A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method and apparatus for producing electron beam diffraction patterns
Assignee: Individual
•
Filing: 1981-12-09
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Granted: 1983-03-15
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Expires: 2001-12-09
Abstract
Abstract A method is disclosed of producing electron beam diffraction patterns, in which the object to be examined is one which is liable to be altered substantially by an electron beam when that beam is accelerated by a predetermined voltage to the energy density necessary for the production of an image. The object is irradiated by an electron beam and the electrons of the electron beam, diffracted by the object, are imaged using an integrating image apparatus or an integrating image material, for example a photographic layer. One or more regions of the object corresponding in size to the cross section of the electron beam are irradiated intermittently using an electron beam accelerated by the pre-determined voltage, the electron beam having an electron density which is lower than the electron density at which the object is substantially altered. Irradiation is carried out for such a period of time that the electron density of the electron beam, integrated during this time, is at least equal to the electron density necessary to produce an image.
Inventors
- 👤 Gunter Rauscher
- 👤 Helmut Formanek
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-02 22:54
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/295; Y; Y10; Y10S; Y10S505/00; Y10S505/825; Y10S505/871
Claims Analysis
Total Claims: 18
Claim 1
Independent Claim
164 words
A method of producing electron beam diffraction patterns, in which an object to be examined is irradiated by means of an electron beam accelerated by a predetermined voltage, the electrons of an electron beam diffracted by the object producing an image on an integrating image apparatus or an integrating image material, the object being examined being an organic or biological substance having a periodic structure, wherein said electron beam has an electron density of less than one electron per square Angstrom, wherein at least one region of the object corresponding in size to the cross section of the electron beam is irradiated intermittently using an electron beam accelerated by the pre-determined voltage, and wherein irradiation is carried out over such a period of time that the electron density of the electron beam, integrated during this time, is at least equal to the electron density necessary to produce an image, whereby the amount of electron density received at each point of the object is limited.
Claim 2
Independent Claim
164 words
A method of producing electron beam diffraction patterns, in which an object to be examined is irradiated by means of an electron beam accelerated by a predetermined voltage, the electrons of an electron beam diffracted by the object producing an image on an integrating image apparatus or an integrating image material, the object being examined being an organic or biological substance having a periodic structure, wherein said electron beam has an electron density of less than one electron per square Angstrom, wherein at least one region of the object corresponding in size to the cross section of the electron beam is irradiated intermittently using an electron beam accelerated by the pre-determined voltage, and wherein irradiation is carried out over such a period of time that the electron density of the electron beam, integrated during this time, is at least equal to the electron density necessary to produce an image, whereby the amount of electron density received at each point of the object is limited.
Claim 3
Dependent Claim
48 words
A method according to claim 1, wherein a pre-determined continuous surface of the object is scanned by a continuous movement by the electron beam across said surface at least once, the electron beam being caused to pass over the continuous surface of the object in a pre-determined pattern.
Claim 4
Dependent Claim
22 words
A method according to claim 2, wherein the electron beam scans the continuous surface of the object in a continuous raster pattern.
Claim 5
Independent Claim
16 words
A method according to claims 2 or 3, wherein a square or rectangular surface is scanned.
Claim 6
Dependent Claim
27 words
A method according to claim 2, wherein the object is moved transversely perpendicularly to the electron beam according to the pre-determined pattern, the said beam remaining stationary.
Claim 7
Dependent Claim
25 words
A method according to claim 1, wherein the electron beam is periodically swung out to a position in which it does not irradiate the object.
Claim 8
Independent Claim
169 words
An apparatus for producing electron beam diffraction patterns, comprising an electron beam device for producing a focussed electron beam, said beam having a density which is less than one electron per square Angstrom; an object slide for the object to be examined, the object slide being located in the path of the focussed electron beam in a plane running transversely to the electron beam; an integrating image device or an integrating image material for producing an image of the electrons of the electron beam diffracted by the object, said object being an organic or biological substance having a periodic structure; and a driving device adapted to permit the electron beam to scan a pre-determined continuous surface of the object at least once, said driving device causing the electron beam to continuously scan the surface in a pre-determined pattern to thereby limit the amount of irradiation applied to each one point of the object to be examined to prevent said object from being altered by the application of excessive irradiation.
Claim 9
Independent Claim
169 words
An apparatus for producing electron beam diffraction patterns, comprising an electron beam device for producing a focussed electron beam, said beam having a density which is less than one electron per square Angstrom; an object slide for the object to be examined, the object slide being located in the path of the focussed electron beam in a plane running transversely to the electron beam; an integrating image device or an integrating image material for producing an image of the electrons of the electron beam diffracted by the object, said object being an organic or biological substance having a periodic structure; and a driving device adapted to permit the electron beam to scan a pre-determined continuous surface of the object at least once, said driving device causing the electron beam to continuously scan the surface in a pre-determined pattern to thereby limit the amount of irradiation applied to each one point of the object to be examined to prevent said object from being altered by the application of excessive irradiation.
Claim 10
Dependent Claim
30 words
An apparatus according to claim 7, wherein the driving device is adapted to permit the electron beam to continuously scan the surface of the object in a continuous raster pattern.
Claim 11
Dependent Claim
202 words
An apparatus according to claim 7, wherein the said driving device comprises an object slide driving device for moving the object slide in a plane transverse to the focussed electron beam, the object slide driving device comprising a first shaft, the rotation of which moves the object slide via a first driving connection in a first coordinate direction in the movement plane, and a second shaft, the rotation of which moves the object slide via a second driving connection in a second coordinate direction in the movement plane, said object slide driving device further comprising a first motor coupled to the first shaft to automatically drive the first shaft A, a second driving device coupled to the second shaft B to automatically drive the second shaft B, a first sensor device coupled to the first shaft to determine the respective position of the object slide in the first coordinate direction, a second sensor device coupled to the second shaft B to determine the respective position of the object slide in the second coordinate direction, and a control device connected to both the driving and sensor devices to effect programmed control of both the driving devices dependent on signals from both sensor devices.
Claim 12
Dependent Claim
34 words
An apparatus according to claim 9, wherein each driving device has an electromotor which is coupled to the respective shaft of the object slide adjusting device via a gear and a slip friction clutch.
Claim 13
Dependent Claim
47 words
An apparatus according to claim 10, wherein each electromotor is also coupled to a tacho-generator 41 and is coupled together with the tacho-generator to a motor control circuit adapted to maintain the velocity of the electromotor constant by switching over the direction of rotation of the electromotor.
Claim 14
Dependent Claim
22 words
An apparatus according to claim 9, wherein each driving device can be decoupled from the respective shaft independent of the sensor devices.
Claim 15
Independent Claim
219 words
An apparatus for producing electron beam diffraction patterns, comprising an electron beam device for producing a focussed electron beam, said electron beam having a density of less than one electron per square Angstrom; an object slide for the object to be examined, the object slide being located in the path of the focussed electron beam in a plane running transversely to the electron beam; an integrating image device or an integrating image material for producing an image of the electrons of the electron beam diffracted by the object, said object being a organic or biological substance having a periodic structure; an electrically controllable electron beam interruption device; and an interval tracing circuit coupled to the electron beam interruption device to periodically interrupt the focussed electron beam such that the beam interruption time is between one and ten seconds and the irradiation period is between 0.2 and two seconds, the interval tracing circuit including a first control circuit for adjusting the duration of the period during which the focussed electron beam is interrupted and a second control circuit for adjusting the duration of the irradiation period during which a pre-determined region of the object is to be irradiated by the focussed electron beam to thereby prevent said pre-determined region of said object from being altered by excessive or continuous irradiation.
Claim 16
Independent Claim
219 words
An apparatus for producing electron beam diffraction patterns, comprising an electron beam device for producing a focussed electron beam, said electron beam having a density of less than one electron per square Angstrom; an object slide for the object to be examined, the object slide being located in the path of the focussed electron beam in a plane running transversely to the electron beam; an integrating image device or an integrating image material for producing an image of the electrons of the electron beam diffracted by the object, said object being a organic or biological substance having a periodic structure; an electrically controllable electron beam interruption device; and an interval tracing circuit coupled to the electron beam interruption device to periodically interrupt the focussed electron beam such that the beam interruption time is between one and ten seconds and the irradiation period is between 0.2 and two seconds, the interval tracing circuit including a first control circuit for adjusting the duration of the period during which the focussed electron beam is interrupted and a second control circuit for adjusting the duration of the irradiation period during which a pre-determined region of the object is to be irradiated by the focussed electron beam to thereby prevent said pre-determined region of said object from being altered by excessive or continuous irradiation.
Claim 17
Independent Claim
60 words
An apparatus according to any one of claims 10 or 13 comprising a timewise controlled disconnection device which is coupled to the electron beam device and also to the control device or interval tracing circuit, to interrupt the focussed electron beam or to swing the beam out of the region of the object and optionally to disconnect the driving devices.
Claim 18
Dependent Claim
59 words
The method of claim 1 wherein at least one region of the object corresponding in size to the cross section of the electron beam is irradiated intermittently with said electron beam; and wherein one point of the object which absorbs energy during irradiation has an opportunity to cool during the periods in which said point is not being irradiated.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1986-03-14 | 1986-09-13 | 1987-03-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1990-03-14 | 1990-09-13 | 1991-03-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1994-03-14 | 1994-09-13 | 1995-03-15 | $7700.00 | Window Closed / Lapsed |