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Plasma etching of aluminum

Assignee: Intersil Corp
•
Filing: 1982-03-25
•
Granted: 1983-03-01
•
Expires: 2002-03-25
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Abstract

Abstract A method of improving uniformity of etching in the plasma etching of a substrate of aluminum and its alloys by supporting the substrate on a getter plate of a metal such as tantalum. The getter plate extends beyond the substrate for a distance sufficient to improve the uniformity of etching across the substrate.

Inventors

  • 👤 Bernard Halon

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 14:37
CPC Classifications
H; H10; H10P; H10P50/00; H10P50/20; H10P50/26; H10P50/264; H10P50/266; H10P50/267; C; C23; C23F; C23F4/00

Claims Analysis

Total Claims: 10
Claim 1
Independent Claim 56 words
In a process of plasma etching a substrate of aluminum or an alloy thereof with an etchant gas containing boron trichloride, the improvement comprising supporting the substrate on a metal getter plate which extends outwardly from the edges of the substrate for a distance sufficient to cause substantially uniform etching across the substrate having improved uniformity.
Claim 2
Dependent Claim 56 words
In a process of plasma etching a substrate of aluminum or an alloy thereof with an etchant gas containing boron trichloride, the improvement comprising supporting the substrate on a metal getter plate which extends outwardly from the edges of the substrate for a distance sufficient to cause substantially uniform etching across the substrate having improved uniformity.
Claim 3
Dependent Claim 19 words
A process in accordance with claim 1, wherein the substrate and the getter plate have substantially the same shape.
Claim 4
Dependent Claim 39 words
A process in accordance with claim 2, wherein the substrate and the getter plate are in the shape of a disc and the diameter of the getter plate is at least about one-sixth greater than that of the substrate.
Claim 5
Dependent Claim 23 words
A process in accordance with claim 3, wherein the diameter of the getter plate is about one-third greater than that of the substrate.
Claim 6
Dependent Claim 28 words
A process in accordance with claim 1, wherein the metal of the plate is selected from the group consisting of tantalum, stainless steel, molybdenum, nickel, tungsten and gold.
Claim 7
Dependent Claim 12 words
A process in accordance with claim 5, wherein the metal is tantalum.
Claim 8
Dependent Claim 30 words
A process in accordance with claim 1, wherein said etchant gas contains a gaseous hydrocarbon which will polymerize under conditions of glow discharge in an amount effective to reduce undercutting.
Claim 9
Dependent Claim 23 words
A process in accordance with claim 7, wherein said gaseous hydrocarbon is selected from the group consisting of ethylene, cyclopropane and mixtures thereof.
Claim 10
Dependent Claim 13 words
A process in accordance with claim 8, wherein said gaseous hydrocarbon is cyclopropane.

References Cited (Backward Citations)

US4073669A Cited
US4148705A Cited
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US4337132A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1986-02-28 1986-08-30 1987-03-01 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1990-02-28 1990-08-30 1991-03-01 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1994-02-28 1994-08-30 1995-03-01 $7700.00 Window Closed / Lapsed

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