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US4364077A Expired / Lapsed US ⏱️ 0.0 years remaining

P+ N Gallium phosphide photodiodes

Assignee: United States Department of the Air Force
•
Filing: 1980-09-09
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Granted: 1982-12-14
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Expires: 2000-09-09
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Abstract

Abstract A photodiode detector apparatus having a Gallium Phosphide ion implantation junction thereon to provide high quantum efficiency at wavelengths equal to or less than 0.5 micron incident wavelength while utilizing a shallow junction.

Inventors

  • 👤 Alice M. Chiang

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-06 04:31
CPC Classifications
H; H10; H10F; H10F30/00; H10F30/20; H10F30/21; H10F30/22; H10F30/221; H10F30/2215; H10F71/00; H10F71/127; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02E10/544

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 110 words
A photodiode detector apparatus with high quantum efficiency comprising in combination: a semiconductor body of Group III-V compound having a photoelectric-sensitive surface, a thin film deposition of a second group III-V compound atop said semiconductor body to form a p-n junction, said p-n junction forms a photodiode being highly responsive to upper-level ultraviolet light radiation, said p-n junction has a shallow junction depth, said photodiode has a quantum efficiency greater than 30% at a wavelength of 0.4 μm, said photodiode is responsive to ultraviolet radiation having a wavelength smaller than 0.4 μm, said photodiode junction is formed by a GaP ion implantation, and said photodiode junction depth equals 0.15 μm.
Claim 2
Dependent Claim 110 words
A photodiode detector apparatus with high quantum efficiency comprising in combination: a semiconductor body of Group III-V compound having a photoelectric-sensitive surface, a thin film deposition of a second group III-V compound atop said semiconductor body to form a p-n junction, said p-n junction forms a photodiode being highly responsive to upper-level ultraviolet light radiation, said p-n junction has a shallow junction depth, said photodiode has a quantum efficiency greater than 30% at a wavelength of 0.4 μm, said photodiode is responsive to ultraviolet radiation having a wavelength smaller than 0.4 μm, said photodiode junction is formed by a GaP ion implantation, and said photodiode junction depth equals 0.15 μm.

References Cited (Backward Citations)

US3900865A Cited
US3958143A Cited
US4141756A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1985-12-13 1986-06-14 1986-12-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1989-12-13 1990-06-14 1990-12-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1993-12-13 1994-06-14 1994-12-14 $7700.00 Window Closed / Lapsed

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