Claims Analysis
Total Claims: 7
Claim 1
Independent Claim
152 words
A method for the projection printing of masks onto a workpiece, particularly onto a wafer for the manufacture of integrated circuits, in which the pattern of said mask is imaged onto a photosensitive layer coating said workpiece by means of an exposure light directed through a projection lens, prior to said projection printing aligning relative to each other said mask and said workpiece, which has already been marked, by imaging into each other corresponding alignment marks of said mask and alignment patterns of said workpiece by means of alignment light reflected from said workpiece, said alignment light comprising at least two narrow wavelength ranges spaced from each other on the wavelength scale, in said ranges said photosensitive layer of said workpiece being non-sensitive or low-sensitive, determining the intensity of said alignment light reflected from said workpiece and generating an alignment signal from the wavelength range of said alignment light having highest intensity.
Claim 2
Independent Claim
152 words
A method for the projection printing of masks onto a workpiece, particularly onto a wafer for the manufacture of integrated circuits, in which the pattern of said mask is imaged onto a photosensitive layer coating said workpiece by means of an exposure light directed through a projection lens, prior to said projection printing aligning relative to each other said mask and said workpiece, which has already been marked, by imaging into each other corresponding alignment marks of said mask and alignment patterns of said workpiece by means of alignment light reflected from said workpiece, said alignment light comprising at least two narrow wavelength ranges spaced from each other on the wavelength scale, in said ranges said photosensitive layer of said workpiece being non-sensitive or low-sensitive, determining the intensity of said alignment light reflected from said workpiece and generating an alignment signal from the wavelength range of said alignment light having highest intensity.
Claim 3
Dependent Claim
21 words
A method according to claim 1, wherein said alignment light comprises three or more narrow wavelength ranges spaced from one another.
Claim 4
Dependent Claim
22 words
A method according to claim 1 or 2, wherein said narrow wavelength ranges of said alignment light are greater than 450 nm.
Claim 5
Dependent Claim
26 words
A method according to claim 1, wherein an argon-ion laser emits said alignment light comprising at least the spectral lines of 488 nm and 514.5 nm.
Claim 6
Independent Claim
136 words
A method for the projection printing of masks onto a workpiece, particularly onto a wafer for the manufacture of integrated circuits, in which the pattern of said mask is imaged onto a photosensitive layer coating said workpiece by means of an exposure light directed through a projection lens, prior to said projection printing focusing the image of said mask onto said workpiece by imaging alignment marks of said mask onto said workpiece by means of alignment light and by scanning said image, said alignment light comprising at least two narrow wavelength ranges spaced from each other, in said ranges said photosensitive layer of said workpiece being non-sensitive or low-sensitive, determining the intensity of said alignment light reflected from said workpiece and generating an alignment signal from the wavelength range of said alignment light having highest intensity.
Claim 7
Independent Claim
136 words
A method for the projection printing of masks onto a workpiece, particularly onto a wafer for the manufacture of integrated circuits, in which the pattern of said mask is imaged onto a photosensitive layer coating said workpiece by means of an exposure light directed through a projection lens, prior to said projection printing focusing the image of said mask onto said workpiece by imaging alignment marks of said mask onto said workpiece by means of alignment light and by scanning said image, said alignment light comprising at least two narrow wavelength ranges spaced from each other, in said ranges said photosensitive layer of said workpiece being non-sensitive or low-sensitive, determining the intensity of said alignment light reflected from said workpiece and generating an alignment signal from the wavelength range of said alignment light having highest intensity.