US4340461A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Modified RIE chamber for uniform silicon etching
Assignee: International Business Machines Corp
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Filing: 1980-09-10
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Granted: 1982-07-20
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Expires: 2000-09-10
Abstract
Abstract A plasma enhancing baffle plate is employed in conjunction with the anode of an RIE system to provide uniform silicon etching. The baffle plate is conductively coupled to and provided in relatively close proximity to the anode to form a constricted chamber region between anode and baffle plate. With the constricted chamber open to the RIE chamber through aperture means in the baffle plate the total surface area of the anode is increased, such that when the system is biased to operate in an RIE mode an increase in the generation of neutral etching species is effected. Various aperture arrangements may be employed to provide different patterns of neutral etching species generation, in accordance with the peculiar characteristics of the system employed.
Inventors
- 👤 Charles J. Hendricks
- 👤 William W. Hicks
- 👤 John H. Keller
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 23:15
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/32; H01J37/32431; H01J37/32623; H01J37/32633
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
130 words
In a reactive ion etching system including anode and target cathode means adapted to be biased to create an ionized plasma within a reaction chamber having ion species and neutral etching species, the improvement comprising a plasma enhancing baffle plate electrically coupled to said anode and arranged to form a constricted chamber region between said anode and baffle plate with said baffle plate being at least as close to said anode than as to said cathode and with said constricted chamber region being open to said reaction chamber through aperture means in said baffle plate to permit said plasma to be generated within said constricted chamber region such that the total surface area of said anode is increased thereby acting to increase the creation and distribution of said neutral species.
Claim 2
Dependent Claim
130 words
In a reactive ion etching system including anode and target cathode means adapted to be biased to create an ionized plasma within a reaction chamber having ion species and neutral etching species, the improvement comprising a plasma enhancing baffle plate electrically coupled to said anode and arranged to form a constricted chamber region between said anode and baffle plate with said baffle plate being at least as close to said anode than as to said cathode and with said constricted chamber region being open to said reaction chamber through aperture means in said baffle plate to permit said plasma to be generated within said constricted chamber region such that the total surface area of said anode is increased thereby acting to increase the creation and distribution of said neutral species.
Claim 3
Dependent Claim
17 words
The system as set forth in claim 1 wherein said aperture means comprise a plurality of apertures.
Claim 4
Dependent Claim
29 words
The system as set forth in claim 2 wherein said aperture means comprise a plurality of apertures decreasing in size from the central region of said baffle plate outwardly.
Claim 5
Dependent Claim
163 words
A reactive ion etching system for etching material through chemical and ionic action, said system including anode means and target cathode means adapted to be biased to form an electric field therebetween within a reaction chamber which acts to create a plasma containing ion species and neutral etching species, the improvement comprising; plasma enhancing baffle plate means electrically coupled to said anode means and arranged to be a distance from said anode means no greater than half the distance between said anode means and said cathode means so as to form a constricted chamber region between said anode means and said plasma enhancing baffle plate means, said plasma enhancing baffle plate means having aperture means therein which act to open said constricted chamber region to said reaction chamber and permit said plasma to be generated within said constricted chamber region over an enlarged anode surface area such that there is an increase in the creation and distribution of neutral species within said plasma.
Claim 6
Dependent Claim
163 words
A reactive ion etching system for etching material through chemical and ionic action, said system including anode means and target cathode means adapted to be biased to form an electric field therebetween within a reaction chamber which acts to create a plasma containing ion species and neutral etching species, the improvement comprising; plasma enhancing baffle plate means electrically coupled to said anode means and arranged to be a distance from said anode means no greater than half the distance between said anode means and said cathode means so as to form a constricted chamber region between said anode means and said plasma enhancing baffle plate means, said plasma enhancing baffle plate means having aperture means therein which act to open said constricted chamber region to said reaction chamber and permit said plasma to be generated within said constricted chamber region over an enlarged anode surface area such that there is an increase in the creation and distribution of neutral species within said plasma.
Claim 7
Dependent Claim
38 words
The system as set forth in claim 4 wherein said baffle plate means is arranged so as to be no greater in distance from said anode means than 25 percent of the diameter of said baffle plate means.
Claim 8
Dependent Claim
17 words
The system as set forth in claim 5 wherein said aperture means comprise a plurality of apertures.
Claim 9
Dependent Claim
32 words
The system as set forth in claim 6 wherein said plurality of apertures decrease in size from the central region of said plasma enhancing baffle plate means outwardly toward the periphery thereof.
Claim 10
Dependent Claim
17 words
The system as set forth in claim 4 wherein said aperture means comprise a plurality of apertures.
Claim 11
Dependent Claim
32 words
The system as set forth in claim 8 wherein said plurality of apertures decrease in size from the central region of said plasma enhancing baffle plate means outwardly toward the periphery thereof.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1985-07-19 | 1986-01-18 | 1986-07-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1989-07-19 | 1990-01-18 | 1990-07-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1993-07-19 | 1994-01-18 | 1994-07-20 | $7700.00 | Window Closed / Lapsed |