Orifice wear compensation

Claim 2

In a method for measuring the volumetric rate of flow of a gas through a conduit, which method employs a precision orifice disposed in the gas flow path and means for measuring the pressure differential across the orifice whereby the pressure differential may be utilized in a standard formula to obtain the volumetric rate of flow, the improvement comprising: (A) determining analagously the wear to the precision orifice by measuring the wear to a probe fixed in the gas flow path upstream of the precision orifice; (B) deriving an orifice wear correction factor from the measured wear on the probe; and (C) including the correction factor in a modified standard formula to obtain a volumetric rate of flow value corrected for orifice plate wear.

Claim 3

The method of claim 1 in which the probe wear is determined by measuring the change in an electrical characteristic of the probe brought about by wear thereto.

Claim 4

The method of claim 2 in which the measured electrical characteristic is the resistance across at least a part of the probe volume.

Claim 5

The method of claim 3 in which: (A) a first resistance measurement is taken across a first probe portion facing upstream; (B) a second resistance measurement is taken across a second probe portion facing downstream; and (C) the difference between the first and second resistance measurements is utilized to develop the correction factor.

Claim 6

In apparatus for measuring the volumetric rate of flow of a gas through a conduit, which apparatus includes: (A) a precision orifice disposed in the gas flow path; (B) means for measuring the pressure differential across said orifice; and (C) means employing predetermined characteristics of said orifice and said measured pressure differential in a standard formula to obtain the volumetric rate of flow; the improvement comprising: (D) a probe fixed in the gas flow path upstream of said precision orifice; (E) means for measuring wear to said probe; (F) means employing said measured probe wear for developing and orifice wear correction factor; and (G) means applying said correction factor to said standard formula; whereby a volumetric rate of flow is obtained which is corrected against wear of said precision orifice.

Claim 7

In apparatus for measuring the volumetric rate of flow of a gas through a conduit, which apparatus includes: (A) a precision orifice disposed in the gas flow path; (B) means for measuring the pressure differential across said orifice; and (C) means employing predetermined characteristics of said orifice and said measured pressure differential in a standard formula to obtain the volumetric rate of flow; the improvement comprising: (D) a probe fixed in the gas flow path upstream of said precision orifice; (E) means for measuring wear to said probe; (F) means employing said measured probe wear for developing and orifice wear correction factor; and (G) means applying said correction factor to said standard formula; whereby a volumetric rate of flow is obtained which is corrected against wear of said precision orifice.

Claim 8

The apparatus of claim 5 in which wear to said probe is measured indirectly by measuring a corresponding change in an electrical characteristic or said probe.

Claim 9

The apparatus of claim 6 in which said electrical characteristic comprises the resistance across at least a part of the volume of said probe.

Claim 10

The apparatus of claim 6 in which said probe includes: (A) a first portion facing upstream; and (B) a second portion facing downstream; and in which said electrical characteristic comprises resistance across each of said first and second probe portions.

Claim 11

The apparatus of claim 8 which further includes: (A) a d-c bridge circuit comprising (i) a first resistor; (ii) a second resistor having one end connected at a first junction to one end of said first resistor; (iii) said resistance across said first probe portion having a first side connected at a second junction to a second end of said first resistor; (iv) said resistance across said second probe portion having a first side connected at a third junction to a second end of said second resistor and a second side connected at a fourth junction to a second side of said resistance of said first probe portion; and (v) a source of d-c connected across said first and fourth junctions; whereby a change in the d-c potential measured between said second and third junctions represents a change in the ratio of said resistances across said first and second probe portions and is therefore representative of the wear to said first probe portion which is analagous to wear to said precision orifice.

Claim 12

The apparatus of claim 9 in which: (A) said resistances across said first and second probe portions are substantially equal prior to exposure to wear; and (B) said first and second resistors are substantially equal; whereby said d-c potential measured between said second and third junctions is substantially zero prior to exposure to said first and second probe portions to wear such that a d-c potential other than zero subsequently observed between said second and third junction is analagous to wear to said precision orifice.