← Back to Patent Explorer
US4323912A Expired / Lapsed US ⏱️ 0.0 years remaining

Solid-state imaging device

Assignee: Hitachi Ltd
•
Filing: 1980-05-23
•
Granted: 1982-04-06
•
Expires: 2000-05-23
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract In a solid-state imaging device having a semiconductor integrated circuit in which a plurality of switching elements for addressing positions of picture elements and scanning circuitry for turning the switching elements "on" and "off" in time sequence are disposed on an identical substrate, a photoconductive film which is disposed on the integrated circuit and which is connected with the respective switching elements, and a light transmitting electrode which is disposed on the photoconductive film, a voltage being applied to the light transmitting electrode thereby to bias a region of the photoconductive film on a light entrance side either positively or negatively with respect to a region thereof on the opposite side; a solid-state imaging device characterized in that said each switching element is an element which uses carriers of a polarity opposite to that of carriers having a greater mobility in said photoconductive film.

Inventors

  • 👤 Norio Koike
  • 👤 Toshihisa Tsukada
  • 👤 Haruhisa Ando
  • 👤 Hideaki Yamamoto
  • 👤 Tadaaki Hirai
  • 👤 Masaharu Kubo
  • 👤 Eiichi Maruyama
  • 👤 Toru Baji
  • 👤 Yukio Takasaki
  • 👤 Shusaku Nagahara

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-25 09:06
CPC Classifications
H; H10; H10F; H10F39/00; H10F39/10; H10F39/12; H10F39/191

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 144 words
In a solid-state imaging device having a semiconductor integrated circuit in which a plurality of switching elements for addressing positions of picture elements and scanning circuitry for turning the switching elements "on" and "off" in time sequence are disposed on an identical substrate, a photoconductive film which is disposed on the integrated circuit and which is connected with the respective switching elements, and a light transmitting electrode which is disposed on the photoconductive film, a voltage being applied to the light transmitting electrode thereby to bias a region of the photoconductive film on a light entrance side either positively or negatively with respect to a region thereof on the opposite side; a solid-state imaging device characterized in that said each switching element is an element which uses carriers of a polarity opposite to that of carriers having a greater mobility in said photoconductive film.
Claim 2
Dependent Claim 144 words
In a solid-state imaging device having a semiconductor integrated circuit in which a plurality of switching elements for addressing positions of picture elements and scanning circuitry for turning the switching elements "on" and "off" in time sequence are disposed on an identical substrate, a photoconductive film which is disposed on the integrated circuit and which is connected with the respective switching elements, and a light transmitting electrode which is disposed on the photoconductive film, a voltage being applied to the light transmitting electrode thereby to bias a region of the photoconductive film on a light entrance side either positively or negatively with respect to a region thereof on the opposite side; a solid-state imaging device characterized in that said each switching element is an element which uses carriers of a polarity opposite to that of carriers having a greater mobility in said photoconductive film.
Claim 3
Dependent Claim 43 words
A solid-state imaging device as defined in claim 1, wherein the light entrance side region of said photoconductive film is biased positively with respect to the opposite side region thereof, and said each switching element is an N-channel element whose carriers are electrons.
Claim 4
Dependent Claim 43 words
A solid-state imaging device as defined in claim 1, wherein the light entrance side region of said photoconductive film is biased negatively with respect to the opposite side region thereof, and said each switching element is a P-channel element whose carriers are holes.
Claim 5
Dependent Claim 31 words
A solid-state imaging device as defined in claim 1, 2 or 3, wherein said each switching element is either of an insulated-gate field effect transistor and a charge transfer device (CTD).
Claim 6
Dependent Claim 49 words
A solid-state imaging device as defined in claim 1, wherein said photoconductive film is a Se-As-Te amorphous film, the light entrance side region of said photoconductive film is biased positively with respect to the opposite side region thereof, and said each switching element is an N-channel field effect transistor.

References Cited (Backward Citations)

US4007473A Cited
US4143389A Cited
US4148051A Cited
US4223330A Cited
US4236829A Cited
US4268845A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1985-04-05 1985-10-05 1986-04-06 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1989-04-05 1989-10-05 1990-04-06 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1993-04-05 1993-10-05 1994-04-06 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag