Apparatus and method of testing CML circuits

Claim 2

Test apparatus for CML integrated circuit comprising: a. a first pulse generator capable of producing a first shaped pulse when actuated; b. a second pulse generator capable of producing a second shaped pulse when actuated; c. a first power splitter connected to receive said first shaped pulse and providing said first shaped pulse at two outputs thereof; d. a second power splitter connected to receive said second shaped pulse and providing said second shaped pulse at two outputs thereof; e. a plurality of electrically actuated relays, each relay movable between a first and second position from one electrical contact to another electrical contact in response to a switching signal, said plurality of relays being connected to said circuit, one output of said first power splitter, and one output of said second power splitter; said relays arranged in a matrix to connect said first and second shaped pulse to any pin of said circuit and provide an output waveform from any pin of said circuit at a waveform output thereof; f. a controller connected to said relays for providing said switching signal to each relay as required; and g. a test unit connected to other outputs of said first and second power splitters opposite to said one output thereof, and to said waveform output for measuring differences including time delays between said first and second shaped pulse and said waveform, said test unit providing control signals to said controller and actuating said first and second pulse generators.

Claim 3

Test apparatus as set forth in claim 1 including a third pulse generator producing a third pulse, and a third power splitter having an input connected to said third pulse generator for receiving said third pulse and one output connected to said test unit and another output connected to said circuit through said matrix.

Claim 4

Test apparatus as set forth in claim 1 wherein a first and second probe Tee are connected between said test unit, and said first and second power splitters, respectively.

Claim 5

Test apparatus as set forth in claim 3 including a power supply capable of providing a plurality of voltage configurations at outputs thereof in response to said test unit, said matrix connected to said outputs of said power supply for providing said voltage configurations to selected pins of said circuit in response to switching signals provided to said matrix by said controller.

Claim 8

A test apparatus for a CML integrated circuit comprising: a. a first pulse generator capable of producing a first shaped pulse when actuated; b. a second pulse generator capable of producing a second shaped pulse when actuated; c. a first power splitter connected to receive said first shaped pulse and providing said first shaped pulse at two outputs thereof; d. a second power splitter connected to receive said second shaped pulse and providing said second shaped pulse at two outputs thereof; e. a plurality of electrically actuated relays, each relay movable between a first and second position from one electrical contact to another electrical contact in response to a switching signal, said relays being connected to one output of said first power splitter, to one output of said second power splitter, and to said circuit, said relays arranged in a matrix to connect said first shaped pulse and said second shaped pulse to any pin of said circuit and providing the output waveform from any pin of said circuit at a waveform output thereof; f. a controller connected to said relays for providing said switching signal to each relay as required; g. a test unit connected to another output of said first power splitter opposite to said one output thereof, to another output of said second power splitter opposite to said one output thereof, and to said waveform output for measuring differences including time delays between said first and second shaped pulses and said waveform, said test unit connected to said controller for providing control signals thereto and connected to said first and second pulse generators for actuation thereof; and h. a variable power supply connected to selected pins of said circuit through said matrix of relays and connected to said test unit for responding thereto to provide a plurality of voltage configurations to said circuit.

Claim 9

A test apparatus for a CML integrated circuit comprising: a. a first pulse generator capable of producing a first shaped pulse when actuated; b. a second pulse generator capable of producing a second shaped pulse when actuated; c. a first power splitter connected to receive said first shaped pulse and providing said first shaped pulse at two outputs thereof; d. a second power splitter connected to receive said second shaped pulse and providing said second shaped pulse at two outputs thereof; e. a plurality of electrically actuated relays, each relay movable between a first and second position from one electrical contact to another electrical contact in response to a switching signal, said relays being connected to one output of said first power splitter, to one output of said second power splitter, and to said circuit, said relays arranged in a matrix to connect said first shaped pulse and said second shaped pulse to any pin of said circuit and providing the output waveform from any pin of said circuit at a waveform output thereof; f. a controller connected to said relays for providing said switching signal to each relay as required; g. a test unit connected to another output of said first power splitter opposite to said one output thereof, to another output of said second power splitter opposite to said one output thereof, and to said waveform output for measuring differences including time delays between said first and second shaped pulses and said waveform, said test unit connected to said controller for providing control signals thereto and connected to said first and second pulse generators for actuation thereof; and h. a variable power supply connected to selected pins of said circuit through said matrix of relays and connected to said test unit for responding thereto to provide a plurality of voltage configurations to said circuit.

Claim 10

Testing apparatus for CML integrated circuits having a plurality of pins, comprising: a. a first pulse generator capable of producing a first shaped pulse when actuated; b. a second pulse generator capable of producing a second shaped pulse when actuated; c. a first power splitter connected to receive said first shaped pulse and providing said first shaped pulse at two outputs thereof; d. a second power splitter connected to receive said second shaped pulse and providing said second shaped pulse at two outputs thereof; e. a plurality of electrically actuated relays forming a matrix, each relay movable between a first and second position in response to a switching signal, said matrix being divided into a plurality of submatrices and a pin connection matrix, said pin connection matrix connected to said submatrices and capable of selectively connecting each submatrix of said plurality of submatrices to any pin of said circuit, a first submatrix connected to one output of said first power splitter and to said pin connection matrix for providing said first shaped pulse selectively to one pin of said circuit, a second submatrix connected to one output of said second power splitter and to said pin connection matrix for providing said second shaped pulse selectively to another pin of said circuit; a third submatrix connected to said pin connection matrix for receiving an output waveform from a certain pin of said circuit and transferring said output waveform to a waveform output thereof; f. a controller connected to said relays for providing said switching signal to each relay as required; and g. a test unit connected to other outputs of said first and second power splitters opposite to said one output thereof and to said waveform output for measuring differences including time delays between said first and second shaped pulses and said output waveform, said test unit connected to said controller and said first and said second pulse generators for providing control signals to said controller and actuating said first and second pulse generators.

Claim 11

Testing apparatus for CML integrated circuits having a plurality of pins, comprising: a. a first pulse generator capable of producing a first shaped pulse when actuated; b. a second pulse generator capable of producing a second shaped pulse when actuated; c. a first power splitter connected to receive said first shaped pulse and providing said first shaped pulse at two outputs thereof; d. a second power splitter connected to receive said second shaped pulse and providing said second shaped pulse at two outputs thereof; e. a plurality of electrically actuated relays forming a matrix, each relay movable between a first and second position in response to a switching signal, said matrix being divided into a plurality of submatrices and a pin connection matrix, said pin connection matrix connected to said submatrices and capable of selectively connecting each submatrix of said plurality of submatrices to any pin of said circuit, a first submatrix connected to one output of said first power splitter and to said pin connection matrix for providing said first shaped pulse selectively to one pin of said circuit, a second submatrix connected to one output of said second power splitter and to said pin connection matrix for providing said second shaped pulse selectively to another pin of said circuit; a third submatrix connected to said pin connection matrix for receiving an output waveform from a certain pin of said circuit and transferring said output waveform to a waveform output thereof; f. a controller connected to said relays for providing said switching signal to each relay as required; and g. a test unit connected to other outputs of said first and second power splitters opposite to said one output thereof and to said waveform output for measuring differences including time delays between said first and second shaped pulses and said output waveform, said test unit connected to said controller and said first and said second pulse generators for providing control signals to said controller and actuating said first and second pulse generators.

Claim 12

Testing apparatus as set forth in claim 7 including a variable power supply, and a fourth and fifth submatrices connected between said variable power supply and said pin connection matrix for supplying variable voltage to selected pins of said circuits.

Claim 13

A testing apparatus determining the characteristics of a CML integrated circuit, which has a plurality of pins, comprising: a. a first pulse means generating a first shaped pulse upon actuation; b. a second pulse means generating a second shaped pulse upon actuation; c. a first power splitter means connected to receive said first shaped pulse for transferring said first shaped pulse to outputs thereof; d. a second power splitter means connected to receive said second shaped pulse for transferring said second shaped pulse to the outputs thereof; e. a matrix means connected to one output of said first and said second power splitter means and to said pins of said circuit, said matrix means adapted to selectively connect said first and second shaped pulses from said one output of said first and said one output of second power splitter means, respectively, to said pins of said circuit and to transfer an output waveform present on a pin of said circuit to a waveform output thereof; and f. a test means connected to other outputs of said first and second power splitter means and to said waveform output for determining differences between said first and second shaped pulses and said output waveform including time delays.

Claim 14

A testing apparatus determining the characteristics of a CML integrated circuit, which has a plurality of pins, comprising: a. a first pulse means generating a first shaped pulse upon actuation; b. a second pulse means generating a second shaped pulse upon actuation; c. a first power splitter means connected to receive said first shaped pulse for transferring said first shaped pulse to outputs thereof; d. a second power splitter means connected to receive said second shaped pulse for transferring said second shaped pulse to the outputs thereof; e. a matrix means connected to one output of said first and said second power splitter means and to said pins of said circuit, said matrix means adapted to selectively connect said first and second shaped pulses from said one output of said first and said one output of second power splitter means, respectively, to said pins of said circuit and to transfer an output waveform present on a pin of said circuit to a waveform output thereof; and f. a test means connected to other outputs of said first and second power splitter means and to said waveform output for determining differences between said first and second shaped pulses and said output waveform including time delays.

Claim 15

Testing apparatus as set forth in claim 9 including a variable power means supplying certain voltages and connected to said matrix, said matrix applying said certain voltage to selected pins of said circuit.

Claim 16

Testing apparatus as set forth in claim 10 wherein said test means is connected to said power means for determining the level of said certain voltages connected to said matrix means.