Method and apparatus for measurement of attenuation and distortion by a test object

Claim 3

The method according to claim 1, including the step of selecting a greater amplitude level for a reference frequency within the pass band of said filter characteristic than for the other components having frequencies lying within the pass band of said filter characteristic.

Claim 4

The method according to claim 1, including the step of selecting the amplitudes of said components in accordance with said filter characteristic, such that the amplitudes of all components as they are produced at the output of said object under test are approximately equal.

Claim 5

The method according to claim 1, wherein only two different amplitude values are employed for all of said components.

Claim 6

The method according to claim 1, including the step of applying said test pulse to the input of said object under test for an interval at least equal to the period of the lowest frequency component of said test pulse.

Claim 7

The method according to claim 1, including the step of applying successive test pulses to the input of said object under test, each test pulse after the first such test pulse beginning coincidentally with the end of the preceding test pulse.

Claim 8

The method according to claim 1, including the step of storing in a storage device sampling values corresponding to a succession of time intervals of a test pulse in a storage device, forming said test pulse by successively reading out from said storage device values for successive intervals, and performing said reading-out function at a rate which is more than twice the size of the highest frequency component of the test pulse.

Claim 9

The method according to claim 7, including the step of employing a plurality of frequency dividers connected to receive a signal having a frequency corresponding to said reading-out function, using the outputs of said frequency dividers for accessing said storage device, the lowest frequency obtained from said frequency dividers coinciding with the frequency of the component having the lowest frequency within said test pulse.

Claim 10

The method according to claim 7, including the step of sampling the test pulse as it is produced at the output of said object under test at the same rate as said reading-out function.

Claim 11

Apparatus for measuring the transmission characteristic of an object under test comprising in combination first storage means located near the input of said object under test, said first storage means storing a plurality of sampling values corresponding to the magnitude, at consecutive time intervals, of a test pulse formed of a plurality of individual components at a plurality of frequencies, means for reading out said sampling values from said first storage means in succession, said storage means located near the output of said object under test, said second storage means storing values corresponding to the initial amplitudes of all of the components of said test pulse, means for sampling sequential intervals of the test pulse as it arrives at the output of said device under test, means for deriving values corresponding to the modified amplitudes of said components as they are presented at the output of said device under test, and means for comparing said derived values with the values stored in said second storage means.

Claim 12

Apparatus for measuring the transmission characteristic of an object under test comprising in combination first storage means located near the input of said object under test, said first storage means storing a plurality of sampling values corresponding to the magnitude, at consecutive time intervals, of a test pulse formed of a plurality of individual components at a plurality of frequencies, means for reading out said sampling values from said first storage means in succession, said storage means located near the output of said object under test, said second storage means storing values corresponding to the initial amplitudes of all of the components of said test pulse, means for sampling sequential intervals of the test pulse as it arrives at the output of said device under test, means for deriving values corresponding to the modified amplitudes of said components as they are presented at the output of said device under test, and means for comparing said derived values with the values stored in said second storage means.

Claim 13

Apparatus according to claim 10, wherein said first storage means comprises a digital storage device and including a digital-to-analog converter and a low pass filter connected between said first storage means and said object under test.

Claim 14

Apparatus according to claim 10, including a control circuit interconnected between the output of said device under test and the input of said sampling means for holding the maximum amplitude of said test pulse to a uniform level as it is sampled.

Claim 15

Apparatus according to claim 10, wherein said first storage means stores time domain data relating to said test pulse and said second storage means stores frequency domain data relating to said test pulse.