US4263087A
Expired / Lapsed
US
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Process for producing epitaxial layers
Assignee: Fujitsu Ltd
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Filing: 1980-02-11
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Granted: 1981-04-21
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Expires: 2000-02-11
Abstract
Abstract Epitaxial layers are formed by introducing a reaction gas mixture into a reaction vessel in which semiconductor substrates are located, under a pressure of not higher than 1333 Pa (10 Torr), and heating said semiconductor substrates by high frequency induction power so that layers grow epitaxially on said semiconductor substrates. The frequency f of high frequency power is not higher than 50 kHz, and the pressure P in said reaction vessel is maintained in the following range ##STR1## wherein, P is the pressure in units of Pa or Torr in the reaction vessel and f is the frequency in kHz of said high frequency power.
Inventors
- 👤 Kaoru Tanabe
- 👤 Yoshifumi Nomura
- 👤 Mamoru Maeda
- 👤 Mikio Takagi
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-29 02:59
CPC Classifications
C; C30; C30B; C30B29/00; C30B29/02; C30B29/06; C30B25/00; C30B25/02; C30B25/10; C30B25/12; H; H10; H10P; H10P14/00; H10P14/20; H10P14/24; H10P14/29; H10P14/2901; H10P14/2902; H10P14/2905; H10P14/34; H10P14/3402; H10P14/3404; H10P14/3411
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
125 words
An improvement in a process for producing an epitaxial layer comprising the steps of introducing a reaction gas mixture into a reaction vessel in which semiconductor substrates are located and heating said semiconductor substrates by high frequency induction power so that layers grow epitaxially on said semiconductor substrates, the improvement comprising maintaining the frequency f of the high frequency power at not higher than 50 kHz, and maintaining the pressure P in said reaction vessel in the following range: ##STR2## wherein P is the pressure, in respective units of Pa and Torr respectively in the reaction vessel, and f is the frequency in kHz of said high frequency power whereby said epitaxial layer has a density of stacking faults of less than 10/cm 2 .
Claim 2
Dependent Claim
125 words
An improvement in a process for producing an epitaxial layer comprising the steps of introducing a reaction gas mixture into a reaction vessel in which semiconductor substrates are located and heating said semiconductor substrates by high frequency induction power so that layers grow epitaxially on said semiconductor substrates, the improvement comprising maintaining the frequency f of the high frequency power at not higher than 50 kHz, and maintaining the pressure P in said reaction vessel in the following range: ##STR2## wherein P is the pressure, in respective units of Pa and Torr respectively in the reaction vessel, and f is the frequency in kHz of said high frequency power whereby said epitaxial layer has a density of stacking faults of less than 10/cm 2 .
Claim 3
Dependent Claim
22 words
The process of claim 1, wherein the reaction gas mixture is a mixture of a silicon source gas and a carrier gas.
Claim 4
Dependent Claim
15 words
The process of claim 1 or 2, wherein said semiconductor substrate is made of silicon.
Claim 5
Dependent Claim
17 words
The process of claim 1 or 2, wherein said epitaxial layer is an epitaxial layer comprising silicon.
Claim 6
Dependent Claim
24 words
The process of claim 1 or 2, wherein said silicon source gas is selected from the group consisting of dichlorosilane, trichlorosilane, tetrachlorosilane, and monosilane.
Claim 7
Dependent Claim
19 words
The process of claim 2, wherein said carrier gas is selected from the group consisting of hydrogen and helium.
Claim 8
Dependent Claim
29 words
The process of claim 2 or 6 wherein the ratio of the silicon source gas to the carrier gas is in the range of 0.05 to 1.0% by volume.
Claim 9
Dependent Claim
24 words
The process of claim 1 or 2, comprising flowing a separate stream of said reaction gas mixture past the surface of each said substrate.
Claim 10
Dependent Claim
41 words
The process of claim 8, said reaction vessel having an axis of cylindrical symmetry, said method comprising mounting each said wafer at one face of a carbon susceptor, and aligning each said susceptor perpendicularly to the axis of the reaction vessel.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-04-20 | 1984-10-20 | 1985-04-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-04-20 | 1988-10-20 | 1989-04-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-04-20 | 1992-10-20 | 1993-04-21 | $7700.00 | Window Closed / Lapsed |