Process for automatic pattern evaluation with the aid of a rapid image processing and circuit for carrying out the process

Claim 2

A circuit for implementing a process for one-dimensional automatic pattern evaluation, particularly measuring data evaluation in technical and medical fields of application, with the aid of a rapid image processing, which comprises employing digitalized data as input quantity for the following transformation: ##EQU3## wherein x is the original pattern x is the transformed pattern N=2 n is the dimension of x r is the number of the processing step n is the quantity of the processing steps f 1 (A,B) is the Boolean AND connection A B (bitwise) f 2 (A,B) is the Boolean OR connection A B (bitwise) to signify that some structurally specific result coefficients of this transformation are selected with the aid of a known classification, whereby the comparison between the pattern and the actual data set is made on the basis of the selected coefficients, that the criterion for the similarity of two patterns is a distance measurement in the form of a numerical value, for example the Eucledian distance, and making the decision concerning the presence of the pattern being sought in the actual data set with the aid of a threshold value interrogation, said circuit comprising means connecting storage elements and AND/OR gates, each word being resolved into its individual bits which are processed sequentially separately and in parallel, and where for n pattern points (words) with a resolution of m bits in each case there are present a total of m·n one-bit memories (flip-flops) and 1/2m·n OR gates and 1/2m·n AND gates.

Claim 3

A circuit for implementing a process for two-dimensional pattern evaluation, particularly aerial picture evaluation as well as general image or picture evaluation in technical, commercial, and medical fields, with the aid of a rapid image processing, which comprises producing a digitalized image by means of an imaging sensor with subsequent analog-digital conversion which is used as input quantity for the following transformation: ##EQU4## wherein x is the original pattern x is the transformed pattern N=2 n is the dimension of x r is the number of the processing step n is the quantity of the processing steps f 1 (A,B) is the Boolean AND connection A B (bitwise) f 2 (A,B) is the Boolean OR connection A B (bitwise) to signify that some structurally specific result coefficients of this transformation are selected with the aid of a known classification, whereby the comparison between pattern and actual image is made on the basis of the selected coefficients, that the criterion for the similarity of two patterns is a distance measurement in the form of a numerical value, for example the Eucledian distance, and making the decision concerning the presence of the pattern sought in the image with the aid of a threshold value interrogation, said circuit comprising means connecting storage elements and AND/OR gates, each word being resolved into its individual bits which are processed separately and in parallel, and where for m·n pattern points (words) with a resolution of m bits in each case there are present a total of 2·n·n·m one-bit memories (flip-flops) and n·n·m OR gates and n·n·m AND gates.

Claim 4

A circuit for implementing a process for two-dimensional pattern evaluation, particularly aerial picture evaluation as well as general image or picture evaluation in technical, commercial, and medical fields, with the aid of a rapid image processing, which comprises producing a digitalized image by means of an imaging sensor with subsequent analog-digital conversion which is used as input quantity for the following transformation: ##EQU4## wherein x is the original pattern x is the transformed pattern N=2 n is the dimension of x r is the number of the processing step n is the quantity of the processing steps f 1 (A,B) is the Boolean AND connection A B (bitwise) f 2 (A,B) is the Boolean OR connection A B (bitwise) to signify that some structurally specific result coefficients of this transformation are selected with the aid of a known classification, whereby the comparison between pattern and actual image is made on the basis of the selected coefficients, that the criterion for the similarity of two patterns is a distance measurement in the form of a numerical value, for example the Eucledian distance, and making the decision concerning the presence of the pattern sought in the image with the aid of a threshold value interrogation, said circuit comprising means connecting storage elements and AND/OR gates, each word being resolved into its individual bits which are processed separately and in parallel, and where for m·n pattern points (words) with a resolution of m bits in each case there are present a total of 2·n·n·m one-bit memories (flip-flops) and n·n·m OR gates and n·n·m AND gates.