Patent US4245189A successfully refreshed from Google Patents.
US4245189A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Probe assembly for measuring conductivity of plated through holes
Assignee: VEECO INSTRUMENTS ACQUISITION CORP
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Filing: 1979-06-14
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Granted: 1981-01-13
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Expires: 1999-06-14
Abstract
Abstract An improved probe assembly for measuring the conductivity of a plated through hole in a circuit board. The probe assembly having a longitudinal housing and including at the forward end thereof a segmented current injection electrode, each segment being spring biased forwardly and capable of independent movement longitudinally with respect to the housing between a forward position and rearward position. The segmented current injection electrode injecting current into the through hole substantially 360° of the circular edge formed by the intersection of the walls defining the through hole and the surface of the circuit board. A voltage measurement electrode being a knife-blade electrode is positioned in the interstices between the segments of the current injection electrode. The voltage measurement electrode also being spring biased in a forward direction and capable of longitudinal movement between a forward position and a rearward position. The voltage measurement electrode contacting the circular edge of the through hole at multiple points to insure a good electrical contact for voltage measurement.
Inventors
- 👤 Robert O. Wahl
- 👤 Derek Lieber
- 👤 Jay M. Lesser
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 10:35
CPC Classifications
G; G01; G01R; G01R1/00; G01R1/02; G01R1/06; G01R1/067; G01R1/06788
Claims Analysis
Total Claims: 20
Claim 1
Independent Claim
191 words
In apparatus for measuring the conductivity of a plated coating on a wall defining a circular hole of a through hole in a circuit board workpiece, an improved electrode probe comprising: an elongate housing having a longitudinal axis; a segmented first electrode assembly having an interstice between adjacent segments and located in the housing with a forward tip portion of such first electrode assembly extending beyond a forward end of the housing; the tip portion of the first electrode assembly shaped to engage substantially 360° of a circular edge formed by the intersection of the wall defining the through hole and the surface of the circuit board workpiece; a second electrode assembly mounted in the housing in the interstice between segments of the first electrode assembly, the second electrode assembly having a forward tip portion disposed adjacent the tip portion of the first electrode assembly and shaped to engage multiple points of such circular edge when the forward tip portion of the first electrode assembly is positioned to engage the circular edge; and insulating means between the first and second electrode assemblies for electrically insulating these assemblies from one and another.
Claim 2
Dependent Claim
191 words
In apparatus for measuring the conductivity of a plated coating on a wall defining a circular hole of a through hole in a circuit board workpiece, an improved electrode probe comprising: an elongate housing having a longitudinal axis; a segmented first electrode assembly having an interstice between adjacent segments and located in the housing with a forward tip portion of such first electrode assembly extending beyond a forward end of the housing; the tip portion of the first electrode assembly shaped to engage substantially 360° of a circular edge formed by the intersection of the wall defining the through hole and the surface of the circuit board workpiece; a second electrode assembly mounted in the housing in the interstice between segments of the first electrode assembly, the second electrode assembly having a forward tip portion disposed adjacent the tip portion of the first electrode assembly and shaped to engage multiple points of such circular edge when the forward tip portion of the first electrode assembly is positioned to engage the circular edge; and insulating means between the first and second electrode assemblies for electrically insulating these assemblies from one and another.
Claim 3
Dependent Claim
40 words
The improved electrode probe according to claim 1 wherein the segments of the first electrode assembly are mounted in the housing for relative movement with respect to one another in a direction parallel to the longitudinal axis of the housing.
Claim 4
Dependent Claim
55 words
The improved electrode probe according to claim 2 further including biasing means mounted in the housing for biasing the first electrode assembly in the forward direction, first stop means for each segment for limiting the forward movement of each segment, and second stop means for each segment for limiting the rearward movement of each segment.
Claim 5
Dependent Claim
123 words
The improved electrode probe according to claim 3 wherein the forward tip portion of the second electrode assembly is disposed rearwardly of the forward tip portion of the first electrode assembly when the segments of the first electrode assembly are resting against the first stop means, whereby the forward tip portion of the second electrode assembly is protected by the forward tip portion of the first electrode assembly when the first electrode assembly is not positioned to engage the circular edge and further disposed such that when the forward tip portion of the first electrode assembly is positioned to engage the circular edge and the first electrode assembly is moved rearwardly the second electrode assembly is exposed for engagement with the circular edge.
Claim 6
Dependent Claim
26 words
The improved electrode probe according to claim 1 wherein the second electrode assembly is movable in a direction parallel to the longitudinal axis of the housing.
Claim 7
Dependent Claim
54 words
The improved electrode probe according to claim 5 further including a bias means mounted in the housing for biasing the second electrode assembly in the forward direction, first stop means for limiting the forward movement of the second electrode assembly and second stop means for limiting the rearward movement of this second electrode assembly.
Claim 8
Dependent Claim
25 words
The improved electrode probe according to claim 1 wherein the first electrode assembly comprises a pair of segments each constituting a half of such assembly.
Claim 9
Dependent Claim
45 words
The improved electrode probe according to claim 7 wherein the second electrode assembly comprises a knife blade with the forward tip portion shaped to conform to the contour of the adjacent portion of the forward tip portions of the halves of the first electrode assembly.
Claim 10
Dependent Claim
29 words
The improved electrode probe according to claim 1 wherein the forward tip portion of the first electrode assembly comprises a pair of segments forming two halves of a cone.
Claim 11
Dependent Claim
32 words
The improved electrode probe according to claim 9 wherein the second electrode assembly comprises a knife blade with a triangular shaped forward tip portion for contacting the circular edge at two points.
Claim 12
Dependent Claim
38 words
The improved electrode probe according to claim 1 wherein the first electrode assembly is used to inject current into the through hole and the second electrode assembly is used to measure the voltage drop across the through hole.
Claim 13
Dependent Claim
224 words
In apparatus for measuring the conductivity of a plated coating on a wall defining a circular hole of a through hole in a circuit board workpiece, an improved electrode probe comprising: an elongate housing having a longitudinal axis; a segmented first electrode assembly having an interstice between adjacent segments and located in the housing with a forward tip portion extending beyond a forward end of the housing; each segment mounted in the housing for relative movement with respect to one another in a direction parallel to the longitudinal axis of the housing; the tip portion of the first electrode assembly shaped to engage substantially 360° of a circular edge formed by the intersection of the wall defining the through hole and the surface of the circuit board workpiece; a second electrode assembly mounted in the housing in the interstice between segments of the first electrode assembly, the second electrode assembly movable in a direction parallel to the longitudinal axis of the housing and having a forward tip portion disposed adjacent the tip portion of the first electrode assembly and shaped to engage multiple points of such circular edge when the forward tip portion of the first electrode assembly is positioned to engage the circular edge; and insulating means between the first and second electrode assemblies for electrically insulating these assemblies from one and another.
Claim 14
Dependent Claim
224 words
In apparatus for measuring the conductivity of a plated coating on a wall defining a circular hole of a through hole in a circuit board workpiece, an improved electrode probe comprising: an elongate housing having a longitudinal axis; a segmented first electrode assembly having an interstice between adjacent segments and located in the housing with a forward tip portion extending beyond a forward end of the housing; each segment mounted in the housing for relative movement with respect to one another in a direction parallel to the longitudinal axis of the housing; the tip portion of the first electrode assembly shaped to engage substantially 360° of a circular edge formed by the intersection of the wall defining the through hole and the surface of the circuit board workpiece; a second electrode assembly mounted in the housing in the interstice between segments of the first electrode assembly, the second electrode assembly movable in a direction parallel to the longitudinal axis of the housing and having a forward tip portion disposed adjacent the tip portion of the first electrode assembly and shaped to engage multiple points of such circular edge when the forward tip portion of the first electrode assembly is positioned to engage the circular edge; and insulating means between the first and second electrode assemblies for electrically insulating these assemblies from one and another.
Claim 15
Dependent Claim
55 words
The improved electrode probe according to claim 12 further including biasing means mounted in the housing for biasing the first electrode assembly in the forward direction, first stop means for each segment for limiting the forward movement of each segment, and second stop means for each segment for limiting the rearward movement of each segment.
Claim 16
Dependent Claim
123 words
The improved electrode probe according to claim 13 wherein the forward tip portion of the second electrode assembly is disposed rearwardly of the forward tip portion of the first electrode assembly when the segments of the first electrode assembly are resting against the first stop means, whereby the forward tip portion of the second electrode assembly is protected by the forward tip portion of the first electrode assembly when the first electrode assembly is not positioned to engage the circular edge and further disposed such that when the forward tip portion of the first electrode assembly is positioned to engage the circular edge and the first electrode assembly is moved rearwardly the second electrode assembly is exposed for engagement with the circular edge.
Claim 17
Dependent Claim
54 words
The improved electrode probe according to claim 14 further including a bias means mounted in the housing for biasing the second electrode assembly in the forward direction, first stop means for limiting the forward movement of the second electrode assembly and second stop means for limiting the rearward movement of this second electrode assembly.
Claim 18
Dependent Claim
29 words
The improved electrode probe according to claim 15 wherein the forward tip portion of the first electrode assembly comprises a pair of segments forming two halves of a cone.
Claim 19
Dependent Claim
32 words
The improved electrode probe according to claim 16 wherein the second electrode assembly comprises a knife blade with a triangular shaped forward tip portion for contacting the circular edge at two points.
Claim 20
Dependent Claim
38 words
The improved electrode probe according to claim 17 wherein the first electrode assembly is used to inject current into the through hole and the second electrode assembly is used to measure the voltage drop across the through hole.
References Cited (Backward Citations)
US902753A
Cited
US4042880A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1984-01-13 | 1984-07-14 | 1985-01-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1988-01-13 | 1988-07-14 | 1989-01-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1992-01-13 | 1992-07-14 | 1993-01-13 | $7700.00 | Window Closed / Lapsed |