US4218532A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Photolithographic technique for depositing thin films
Assignee: AT&T Inc
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Filing: 1977-10-13
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Granted: 1980-08-19
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Expires: 1997-10-13
Abstract
Abstract A lift-off mask for the patterned deposition of thin films comprises a three layer sandwich of photoresist-aluminum-photoresist on a substrate. Deposition occurs through an opening in the top photoresist layer and through larger size (i.e., undercut) openings in the aluminum and bottom photoresist layers. The top layer of photoresist remains on the mask during deposition and defines the pattern, the bottom photoresist is fully exposed and in the openings provides an undercut which prevents edge tearing during lift-off, and the aluminum layer (typically 50-200 Angstroms thick) protects the bottom layer of photoresist from dissolving during formation of the top photoresist layer. Also described is a technique in which the edges of thin films are tapered by depositing them from a direction oblique to the substrate surface and by rotating the substrate during deposition. These techniques are specifically discussed in the context of fabricating Josephson junction devices.
Inventors
- 👤 LaRue N. Dunkleberger
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 11:07
CPC Classifications
H; H10; H10N; H10N60/00; H10N60/01; H10N60/0912; G; G03; G03F; G03F7/00; G03F7/004; G03F7/09; G03F7/094; G03F7/26; H10P; H10P76/00; H10P76/20; H10P76/202; H05; H05K; H05K3/00; H05K3/10; H05K3/14; H05K3/143
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
224 words
A method of depositing patterned thin films on a substrate comprising: (1) forming on said substrate a first layer of positive-acting photoresist material which can be patterned after exposure to optical radiation and which is soluble in a solvent which does not attack adjacent layers; and exposing said entire first layer to said radiation prior to step (2); (2) forming a protective second layer on said first layer to a thickness in the range of approximately 50-200 Angstroms effective to protect it from dissolution during the subsequent formation of the positive-acting photoresist of step (3); (3) forming a positive-acting photoresist third layer on said second layer; (4) patterning said positive-acting photoresist third layer to form openings therein which extend to said second layer; (5) patterning said second layer to form openings therein which extend to said first layer, and which are substantially aligned with said openings in said third layer and at least as large as said openings in said third layer; (6) patterning said first layer by exposure to said solvent, without removing said third layer, to form openings therein in substantial alignments with said openings in said third layer and of larger size than said openings in said third layer; and (7) depositing said thin films onto said substrate through said openings using said positive-acting photoresist third layer as a deposition mask.
Claim 2
Independent Claim
224 words
A method of depositing patterned thin films on a substrate comprising: (1) forming on said substrate a first layer of positive-acting photoresist material which can be patterned after exposure to optical radiation and which is soluble in a solvent which does not attack adjacent layers; and exposing said entire first layer to said radiation prior to step (2); (2) forming a protective second layer on said first layer to a thickness in the range of approximately 50-200 Angstroms effective to protect it from dissolution during the subsequent formation of the positive-acting photoresist of step (3); (3) forming a positive-acting photoresist third layer on said second layer; (4) patterning said positive-acting photoresist third layer to form openings therein which extend to said second layer; (5) patterning said second layer to form openings therein which extend to said first layer, and which are substantially aligned with said openings in said third layer and at least as large as said openings in said third layer; (6) patterning said first layer by exposure to said solvent, without removing said third layer, to form openings therein in substantial alignments with said openings in said third layer and of larger size than said openings in said third layer; and (7) depositing said thin films onto said substrate through said openings using said positive-acting photoresist third layer as a deposition mask.
Claim 3
Dependent Claim
13 words
The method of claim 1 wherein said protective layer comprises an etchable material.
Claim 4
Dependent Claim
19 words
The method of claim 1 wherein said protective layer has a thickness in the range of approximately 50-200 Angstroms.
Claim 5
Dependent Claim
25 words
The method of claim 3 wherein said protective layer comprises a layer of aluminum approximately 50 Angstroms thick so as to render it optically transparent.
Claim 6
Dependent Claim
21 words
The method of claim 1 including removing said first, second, and third layers after depositing said thin films in step (7).
Claim 7
Dependent Claim
12 words
The method of claim 1 wherein said protective layer is vacuum deposited.
Claim 8
Dependent Claim
26 words
The method of claim 1 wherein during step (7) said depositing occurs from a direction oblique to said substrate and said substrate is rotated during deposition.
Claim 9
Dependent Claim
26 words
The method of claim 1 wherein during step (1) said first layer is fabricated in an environment having a humidity in excess of approximately 35 percent.
Claim 10
Dependent Claim
12 words
The method of claim 1 wherein said deposited thin film is metallic.
Claim 11
Dependent Claim
12 words
The method of claim 1 wherein said deposited thin film is insulative.
Claim 12
Independent Claim
233 words
A method of depositing patterned thin films on a substrate comprising: (1) forming on said substrate a first layer of positive-acting photoresist material; (2) exposing said entire first layer to optical radiation; (3) vacuum depositing an aluminum second layer on said first layer to a thickness in the range of approximately 50-200 Angstroms effective to protect said first layer from dissolution during the subsequent formation of the positive-acting photoresist third layer of step (4): (4) forming a positive-acting photoresist third layer on said second layer; (5) patterning said third layer to form openings therein which extend to said second layer; (6) etching said second layer to form openings therein which extend to said first layer, and which are substantially aligned with said openings in said third layer and at least as large as said openings in said third layer; (7) patterning said positive-acting photoresist first layer, without removing said third layer, to form openings therein in substantial alignment with said openings in said third layer and of larger size than said openings in said third layer; (8) depositing said thin films onto said substrate through said openings using said positive-acting photoresist third layer as a deposition mask; (9) concurrent with said depositing step (8), rotating said substrate and depositing said thin films from a direction oblique to said substrate; and (10) removing said first, second, and third layers after depositing said thin films.
Claim 13
Independent Claim
233 words
A method of depositing patterned thin films on a substrate comprising: (1) forming on said substrate a first layer of positive-acting photoresist material; (2) exposing said entire first layer to optical radiation; (3) vacuum depositing an aluminum second layer on said first layer to a thickness in the range of approximately 50-200 Angstroms effective to protect said first layer from dissolution during the subsequent formation of the positive-acting photoresist third layer of step (4): (4) forming a positive-acting photoresist third layer on said second layer; (5) patterning said third layer to form openings therein which extend to said second layer; (6) etching said second layer to form openings therein which extend to said first layer, and which are substantially aligned with said openings in said third layer and at least as large as said openings in said third layer; (7) patterning said positive-acting photoresist first layer, without removing said third layer, to form openings therein in substantial alignment with said openings in said third layer and of larger size than said openings in said third layer; (8) depositing said thin films onto said substrate through said openings using said positive-acting photoresist third layer as a deposition mask; (9) concurrent with said depositing step (8), rotating said substrate and depositing said thin films from a direction oblique to said substrate; and (10) removing said first, second, and third layers after depositing said thin films.
Claim 14
Dependent Claim
23 words
The method of claim 11 wherein said first layer is deposited in an atmosphere having a humidity in excess of approximately 35 percent.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1983-08-19 | 1984-02-18 | 1984-08-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1987-08-19 | 1988-02-18 | 1988-08-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1991-08-19 | 1992-02-18 | 1992-08-19 | $7700.00 | Window Closed / Lapsed |