Patent US4206349A successfully refreshed from Google Patents.
US4206349A
Expired / Lapsed
US
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Electron microscope
Assignee: Hitachi Ltd
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Filing: 1978-11-30
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Granted: 1980-06-03
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Expires: 1998-11-30
Abstract
Abstract An electron microscope comprising an electron gun for generating an electron beam, an electron lens system for irradiating a specimen with the electron beam, an electron lens system for magnifying an electronic image transmitted through the specimen, a fluorescent plate arranged removably in the path of the magnified electron image for converting the magnified transmitted electron image into a visual image, a viewing window for observing the visual image, a CRT display unit for displaying data related to the transmitted electron image, which is arranged at a position where the data is visible from the viewing window, and an optical system for projecting the data on a photo-sensitive material which is exposed to the transmitted electron image.
Inventors
- 👤 Shoji Kamimura
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 11:19
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/02; H01J37/22; H01J37/224; H01J37/26; H01J37/28
Claims Analysis
Total Claims: 11
Claim 1
Independent Claim
123 words
An electron microscope comprising means for generating an electron beam, means for focusing said electron beam on a specimen to thereby transmit said electron beam through said specimen, means for magnifying said transmitted electron beam to thereby obtain an enlarged transmission electron image, means arranged removably in a path of said magnified transmitted beam for converting said transmission electron image into a visual image, a viewing window for observing said visual image, a cathode ray tube for displaying data associated with said visual image, said cathode ray tube being arranged in a position to be visible from said viewing window, and means for projecting said data displayed on said cathode ray tube onto a photographing element exposed to said enlarged transmission electron image.
Claim 2
Dependent Claim
123 words
An electron microscope comprising means for generating an electron beam, means for focusing said electron beam on a specimen to thereby transmit said electron beam through said specimen, means for magnifying said transmitted electron beam to thereby obtain an enlarged transmission electron image, means arranged removably in a path of said magnified transmitted beam for converting said transmission electron image into a visual image, a viewing window for observing said visual image, a cathode ray tube for displaying data associated with said visual image, said cathode ray tube being arranged in a position to be visible from said viewing window, and means for projecting said data displayed on said cathode ray tube onto a photographing element exposed to said enlarged transmission electron image.
Claim 3
Dependent Claim
55 words
An electron microscope according to claim 1, further comprising means for scanning said specimen with said electron beam to thereby extract an information signal characteristic of said specimen, and means for displaying a scanned image corresponding to a scanned area of said specimen on said cathode ray tube on the basis of said information signal.
Claim 4
Dependent Claim
21 words
An electron microscope according to claim 1, further comprising means for changing position of data displayed on said cathode ray tube.
Claim 5
Dependent Claim
24 words
An electron microscope according to claim 2, further comprising means for changing position of a scanned image of the scanned area of said specimen.
Claim 6
Dependent Claim
19 words
An electron microscope according to claim 3, in which said data associated with said specimen is a magnification value.
Claim 7
Dependent Claim
23 words
An electron microscope according to claim 3, in which said data associated with said specimen is a magnification value and a photographing number.
Claim 8
Dependent Claim
35 words
An electron microscope according to claim 3, in which said data associated with said specimen are a magnification value, a film number, a symbol representing a lens condition, an acceleration voltage and a camera length.
Claim 9
Dependent Claim
17 words
An electron microscope according to claim 2, in which said information signal is a transmitted electron signal.
Claim 10
Dependent Claim
17 words
An electron microscope according to claim 2, in which said information signal is a secondary electron signal.
Claim 11
Dependent Claim
137 words
An electron microscope according to claim 1, further comprising deflection coils for scanning said specimen with said electron beam to thereby extract a transmitted electron signal and a secondary electron signal which are characteristic of said specimen, a secondary electron detector for detecting said secondary electron signal, a transmitted electron signal detector for detecting said transmitted electron signal, a first mode change-over switch for switching an output of said secondary electron signal detector and an output of said scanning transmitted electron signal detector, a video converter for converting said switched electron signal into a video signal for display on said cathode ray tube, and a second mode change-over switch for switching an output of said video converter and an output of a circuit for displaying said data, in a manner interlocked with said first mode change-over switch.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1983-06-03 | 1983-12-03 | 1984-06-03 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1987-06-03 | 1987-12-03 | 1988-06-03 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1991-06-03 | 1991-12-03 | 1992-06-03 | $7700.00 | Window Closed / Lapsed |