Patent US4204117A successfully refreshed from Google Patents.
US4204117A
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US
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Sample analyzer
Assignee: Balzers und Leybold Deutschland Holding AG
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Filing: 1978-08-30
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Granted: 1980-05-20
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Expires: 1998-08-30
Abstract
Abstract A sample analyzer includes a microscope for alternatively focusing an electromagnetic radiation on the sample to cause ion emission therefrom and visually observing the sample; a mass spectrometer for the mass analysis of the emitted ions; an illuminating device for lighting the sample for the microscopic visual observation thereof; an ion optical system for directing the emitted ions into the mass spectrometer; and a displaceably supported carrier carrying the ion optical system and at least one part of the illuminating device. The carrier has a first position in which the ion optical system is in an operating position in alignment with the sample and a second position in which the illuminating device is in an operating position in alignment with the sample. There is further provided an actuator for selectively moving the carrier into its positions in a direction generally perpendicular to the axis of the ion optical system.
Inventors
- 👤 Lothar Aberle
- 👤 Walter Bank
- 👤 Franz Hillenkamp
- 👤 Raimund Kaufmann
- 👤 Rainer Nitsche
- 👤 Eberhard Unsold
- 👤 Reiner Wechsung
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 17:00
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/02; H01J49/06; G; G01; G01N; G01N21/00; H01J49/10; H01J49/16; H01J49/161; H01J49/164
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
155 words
In a sample analyzer including a microscope for focusing an electromagnetic radiation on the sample to cause ion emission therefrom and visually observing the sample; a mass spectrometer for the mass analysis of the emitted ions; an illuminating means for lighting the sample for the microscopic visual observation thereof; the improvement comprising (a) an ion optical system for directing ions emitted by the sample into the mass spectrometer; (b) displaceably supported carrier means carrying said ion optical system and at least one part of said illuminating means; said carrier means having a first position in which said ion optical system is in an operating position in alignment with the sample and a second position in which said illuminating means is in an operating position in alignment with the sample; and (c) actuating means for selectively moving said carrier means into said positions in a direction generally perpendicular to the axis of said ion optical system.
Claim 2
Dependent Claim
155 words
In a sample analyzer including a microscope for focusing an electromagnetic radiation on the sample to cause ion emission therefrom and visually observing the sample; a mass spectrometer for the mass analysis of the emitted ions; an illuminating means for lighting the sample for the microscopic visual observation thereof; the improvement comprising (a) an ion optical system for directing ions emitted by the sample into the mass spectrometer; (b) displaceably supported carrier means carrying said ion optical system and at least one part of said illuminating means; said carrier means having a first position in which said ion optical system is in an operating position in alignment with the sample and a second position in which said illuminating means is in an operating position in alignment with the sample; and (c) actuating means for selectively moving said carrier means into said positions in a direction generally perpendicular to the axis of said ion optical system.
Claim 3
Dependent Claim
17 words
A sample analyzer as defined in claim 1, wherein said mass spectrometer is a time-of-flight mass spectrometer.
Claim 4
Dependent Claim
16 words
A sample analyzer as defined in claim 1, wherein said illuminating means comprises a light conductor.
Claim 5
Dependent Claim
103 words
A sample analyzer as defined in claim 1, further comprising a housing defining a vacuum chamber accommodating said carrier means, said ion optical system, said part of said illuminating means and said mass spectrometer; an opening in one end of the housing; a covering glass sealingly closing off said opening and having an inner face being disposed in the vacuum chamber and an outer face being disposed externally thereof; the sample and the microscope being situated at said inner face and at said outer face, respectively; said actuating means comprising a rod attached to said carrier means and sealingly projecting from said housing.
Claim 6
Dependent Claim
18 words
A sample analyzer as defined in claim 4, further comprising means for linearly displaceably supporting said carrier means.
Claim 7
Dependent Claim
79 words
A sample analyzer as defined in claim 4, further comprising a closing plate slidably supported by said housing and movable into said vacuum chamber into a closed position in which it sealingly divides said vacuum chamber into a first chamber part accommodating said ion optical system and a second chamber part accommodating said mass spectrometer; said ion optical system and said mass spectrometer having facing ends arranged at a clearance providing an unobstructed traveling path for said closing plate.
Claim 8
Dependent Claim
65 words
A sample analyzer as defined in claim 4, wherein said mass spectrometer is a time-of-flight mass spectrometer including a time-of-flight tube disposed in said vacuum chamber; said ion optical system comprises a plurality of axially aligned tubes constituting lenses; said ion optical system and said time-of-flight tube having facing ends each carrying a collar having a width approximately corresponding to the diameter of said tubes.
Claim 9
Dependent Claim
30 words
A sample analyzer as defined in claim 4, wherein said actuating means further comprises a pneumatic power cylinder unit and wherein said rod constitutes a piston rod of said unit.
Claim 10
Dependent Claim
16 words
A sample analyzer as defined in claim 8, further comprising a spring bed supporting said unit.
Claim 11
Dependent Claim
109 words
A sample analyzer as defined in claim 4, wherein said illuminating means comprises first components including a light source and a first lens system; said first components being disposed externally of said housing; and second components including a reflecting mirror and a second lens system; said second components constituting said part of said illuminating means mounted on said carrier means; and a window in said housing for effecting passage, into said vacuum chamber, of a light beam emanating from said light source and directed onto said reflecting mirror; said second lens system being in alignment with the sample and the microscope in said second position of said carrier means.
Claim 12
Dependent Claim
18 words
A sample analyzer as defined in claim 10, wherein said second lens system consists of a single lens.
Claim 13
Dependent Claim
21 words
A sample analyzer as defined in claim 10, further comprising a spring bed supporting said first components of said illuminating means.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1983-05-20 | 1983-11-19 | 1984-05-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1987-05-20 | 1987-11-19 | 1988-05-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1991-05-20 | 1991-11-19 | 1992-05-20 | $7700.00 | Window Closed / Lapsed |