Patent US4183672A successfully refreshed from Google Patents.
US4183672A
Expired / Lapsed
US
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Optical inspection system employing spherical mirror
Assignee: Norden Systems Inc
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Filing: 1977-11-26
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Granted: 1980-01-15
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Expires: 1997-11-26
Abstract
Abstract An optical system having a spherical mirror is used to collect light from the surface of a turbine blade or the like which is to be contoured. The spherical mirror is located at an equal optical distance from both the test specimen and the linear diode array so that it operates at a one-to-one magnification ratio. The linear diode array is positioned behind the spherical mirror and it receives light focused by the mirror and reflected by a beam splitter through an opening in the center of the mirror. None of the optical elements of the inspection system are located in the plane of movement of the test specimen so that even particularly long items such as a helicopter rotor blade can be contoured. Indentical upper and lower optical systems allows both surfaces of the test specimen to be contoured simultaneously and each system is independently operable and oriented to prevent optical interference. An automatic gain control is provided to adjust the optical modulator so that the effective intensity of the spot presented to the diode array is maintained within predetermined limits.
Inventors
- 👤 Peter E. Raber
- 👤 Jason M. Gordon
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-24 10:22
CPC Classifications
G; G01; G01B; G01B11/00; G01B11/24; G01B11/245; G01B5/00; G01B5/20; G01B5/205
Claims Analysis
Total Claims: 9
Claim 1
Independent Claim
155 words
An optical system for use with apparatus for contouring the surface of a test specimen, comprising: jig means for moving said test specimen in a plane; source means for directing a beam of electromagnetic energy along an incident axis to the surface of said test specimen; beam splitter means situated along a collecting axis, and oriented normal thereto, at least a portion of said collecting axis being oblique to the plane in which the specimen is movable; spherical mirror means disposed normal to said collecting axis, and situated at an optical distance from the surface of said test specimen such that it operates at approximately a one-to-one magnification ratio, for focusing electromagnetic energy impinging thereon; and means disposed to receive electromagnetic energy from said spherical mirror for indicating the point relative to the plane of movement of the test specimen at which said beam of electromagnetic energy will intersect the surface of the test specimen.
Claim 2
Dependent Claim
155 words
An optical system for use with apparatus for contouring the surface of a test specimen, comprising: jig means for moving said test specimen in a plane; source means for directing a beam of electromagnetic energy along an incident axis to the surface of said test specimen; beam splitter means situated along a collecting axis, and oriented normal thereto, at least a portion of said collecting axis being oblique to the plane in which the specimen is movable; spherical mirror means disposed normal to said collecting axis, and situated at an optical distance from the surface of said test specimen such that it operates at approximately a one-to-one magnification ratio, for focusing electromagnetic energy impinging thereon; and means disposed to receive electromagnetic energy from said spherical mirror for indicating the point relative to the plane of movement of the test specimen at which said beam of electromagnetic energy will intersect the surface of the test specimen.
Claim 3
Dependent Claim
64 words
An optical system according to claim 1, wherein said means disposed to electromagnetic energy is a detector array which is positioned along said collecting axis behind said spherical mirror, and wherein said spherical mirror includes an opening along the axis thereof so that the portion of said electromagnetic energy reflected from said beam splitter means is directed through said opening to said detector array.
Claim 4
Dependent Claim
32 words
An optical system according to claim 1, wherein said system is a part of two separately operable and identical contouring devices disposed to contour the opposite sides of a test specimen simultaneously.
Claim 5
Dependent Claim
41 words
An optical system according to claim 1, wherein each of said optical systems for inspecting the surface of a test specimen includes two pickup channels, the collection axis of each pickup channel being disposed on opposite sides of said incident axis.
Claim 6
Dependent Claim
44 words
An optical system according to claim 1, further including an automatic gain control device for receiving at least a portion of the electromagnetic energy directed along said collecting axis, for adjusting the effective intensity of the beam of electromagnetic energy from said source means.
Claim 7
Dependent Claim
70 words
An optical system according to claim 5, wherein a second beam splitter means is situated along said collection axis for dividing electromagnetic energy incident thereon into a first part and a second part, and wherein said spherical mirror means is oriented to receive said first part of said electromagnetic energy from said beam splitter means, and wherein said automatic gain control means receives said second part of said electromagnetic energy.
Claim 8
Dependent Claim
35 words
An optical system according to claim 6, wherein said automatic gain control further includes an optical element for focusing said second portion of said electromagnetic energy so that it is incident upon a photoresponsive element.
Claim 9
Dependent Claim
86 words
An optical system according to claim 1, wherein said source means comprises a coherent light source for radiating a beam of electromagnetic energy along an axis skewed to the incident axis, an optical modulator for receiving light from said coherent source and redirecting it along an incident axis in response to a control signal, a spatial filler means for removing spurious electromagnetic energy of the beam along an incident axis, and wherein said spatial filter means includes means for focusing said beam on said test specimen.
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1983-01-14 | 1983-07-16 | 1984-01-15 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1987-01-14 | 1987-07-16 | 1988-01-15 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1991-01-14 | 1991-07-16 | 1992-01-15 | $7700.00 | Window Closed / Lapsed |