Analyzing electrical circuit boards

Claim 2

In apparatus for analyzing electrical circuit boards by measuring the voltage drops due to test currents flowing in opposite directions along the straight portion of the conductive lead of an integrated circuit element mounted on a board, that improvement comprising a probe having at least three contact tips mounted to simultaneously contact three equally spaced points on said lead, said points being spaced apart sufficiently to permit measurement of electrical activity in each of the lead segments between adjacent pairs of said tips, means for injecting an ac test signal through the tip nearest said element and for measuring the voltage drop between the two tips farthest therefrom due to test current flowing through one said lead segment, and means for injecting a test signal through the tip farthest from said element and for measuring the voltage drop between the two tips nearest thereto due to test current flowing through the other said lead segment, said means for measuring being sensitive enough to detect voltage differences as small as 10 microvolts.

Claim 3

In apparatus for analyzing electrical circuit boards, comprising a probe having a least two contact tips close enough to each other to simultaneously contact a conductor to an integrated circuit element mounted on said board, wherein said tips are spaced apart from each other sufficiently to permit measurement of the voltage drop therebetween resulting from the flow of test current through the resistance of the conductor segment between the tips, and wherein measurements are made of voltage drops due to test currents flowing in opposite directions through said conductor to determine the ratio R 1 /R 2 , where R 1 is the internal resistance of said integrated circuit element and R 2 is the combined parallel resistance of other integrated circuit elements connected to the same node on said board, that improvement comprising means for injecting a test signal into said conductor through a said probe and making at least one voltage measurement at a said tip to determine the combined parallel resistance R t of all said integrated circuit elements connected to said node, whereby the absolute values of R 1 and R 2 may be determined from R t and said ratio.

Claim 4

In apparatus for analyzing electrical circuit boards, comprising a probe having a least two contact tips close enough to each other to simultaneously contact a conductor to an integrated circuit element mounted on said board, wherein said tips are spaced apart from each other sufficiently to permit measurement of the voltage drop therebetween resulting from the flow of test current through the resistance of the conductor segment between the tips, and wherein measurements are made of voltage drops due to test currents flowing in opposite directions through said conductor to determine the ratio R 1 /R 2 , where R 1 is the internal resistance of said integrated circuit element and R 2 is the combined parallel resistance of other integrated circuit elements connected to the same node on said board, that improvement comprising means for injecting a test signal into said conductor through a said probe and making at least one voltage measurement at a said tip to determine the combined parallel resistance R t of all said integrated circuit elements connected to said node, whereby the absolute values of R 1 and R 2 may be determined from R t and said ratio.

Claim 5

The improvement of claim 2 wherein said test signal is dc.

Claim 6

The improvement of claim 2 wherein said means comprises means for measuring the difference between the voltages at said tip with and without injection of said test signal.

Claim 7

The improvement of claim 2 wherein said test signal is injected through said tip at which said one voltage measurement is made.

Claim 8

The improvement of claim 2 wherein said test signal injecting means comprises means for injecting test signals in the below 10 ma range, and said means for measuring comprises means for measuring voltages in the microvolt range, whereby said circuit boards can be tested while powered up without affecting their normal operation, so as to expose faults not otherwise easily detected.

Claim 9

The improvement of claim 6 wherein said injecting means comprises means for injecting ac test signals, and said measuring means comprises a synchronous detector coupled to said probe through a transformer.

Claim 10

The improvement of claim 6 wherein said means for injecting comprises means for injecting test signals as low as 0.1 ma.

Claim 11

The improvement of claim 6 wherein said means for measuring comprises means for measuring voltages in the nanovolt range.

Claim 12

The improvement of claim 7 wherein said ac test signals are in the KHz frequency range.

Claim 13

The improvement of claim 6 wherein said conductor is a lead of said element.

Claim 14

The improvement of claim 6 wherein said tips span a total distance of no more than 0.08 inch.

Claim 15

In apparatus for analyzing electrical circuit boards, comprising a probe having at least two contact tips close enough to each other to simultaneously contact a lead of an integrated circuit element mounted on said board, wherein said tips are spaced apart from each other sufficiently to permit measurement of the voltage drop therebetween resulting from the flow of test current through the resistance of the lead segment between the tips, that improvement comprising means operative during said measurement for monitoring the electrical contact between said tips and said conductor by comparing electrical outputs of said tips, and means for indicating whether said comparison is as expected.

Claim 16

In apparatus for analyzing electrical circuit boards, comprising a probe having at least two contact tips close enough to each other to simultaneously contact a lead of an integrated circuit element mounted on said board, wherein said tips are spaced apart from each other sufficiently to permit measurement of the voltage drop therebetween resulting from the flow of test current through the resistance of the lead segment between the tips, that improvement comprising means operative during said measurement for monitoring the electrical contact between said tips and said conductor by comparing electrical outputs of said tips, and means for indicating whether said comparison is as expected.

Claim 17

The improvement of claim 13 wherein means are provided for injecting into said tips 180° phase shifted versions of an ac signal differing sufficiently in frequency from said test signal so as not to interfere therewith, and said means for monitoring by comparing comprises means for indicating whether said ac signal versions have cancelled each other in the output of said probe.

Claim 18

The improvement of claim 14 wherein said test signal is ac and said first mentioned ac signal is of frequency an order of magnitude greater than that of said test signal.

Claim 19

The improvement of claim 14 wherein said test signal is ac and means for measuring said voltage drop comprises frequency discriminating means for selectively passing said test signal frequency.

Claim 20

The improvement of any of claims 1-5 or 13-16 wherein each said tip has a single contact member.

Claim 21

The improvement of any of claims 1-5 or 14-16 wherein said tips span a total distance of no greater than 0.08 inch.

Claim 23

The apparatus of claim 19 wherein said measuring tip is that adjacent to said injection tip.

Claim 25

The monitoring means of claim 21 wherein said two tips are said measuring tips.

Claim 26

The improvement of claim 21 wherein said test signal is ac and said 180° phase shifted ac signals are of frequency an order of magnitude greater than that of said test signal.

Claim 27

The improvement of claim 21 wherein said test signal is ac and means for measuring said voltage drop comprises frequency discriminating means for selectively passing said test signal frequency.

Claim 28

The improvement of any of claims 1-5 or 13-16 further comprising first and second means operative during said measurements for monitoring the electrical contacts between said tips and said conductor, said first means comprising means for monitoring the electrical contacts between said conductor and said injection tip and between said conductor and one of said measuring tips by comparing electrical outputs of said tips, and means for indicating whether said comparison is exceeded, and said second means comprising means for monitoring the electrical contact between said conductor and two of said contact tips, said monitoring means comprising means for injecting into said two tips 180° phase shifted versions of an ac signal differing sufficiently in frequency from said test signal so as not to interfere therewith, and means for indicating whether said ac signal versions have cancelled each other in the output of said probe.