Patent US4178195A successfully refreshed from Google Patents.
US4178195A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Semiconductor structure
Assignee: International Business Machines Corp
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Filing: 1978-06-22
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Granted: 1979-12-11
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Expires: 1998-06-22
Abstract
Abstract A technique for fabricating a semiconductor heterostructure by growth of a ternary semiconductor on a binary semiconductor substrate from a melt of the ternary semiconductor containing less than saturation of at least one common ingredient of both the binary and ternary semiconductors wherein in a single temperature step the binary semiconductor substrate is etched, a p-n junction with specific device characteristics is produced in the binary semiconductor substrate by diffusion of a dopant from the melt and a region of the ternary semiconductor of precise conductivity type and thickness is grown by virtue of a change in the melt characteristics when the etched binary semiconductor enters the melt.
Inventors
- 👤 Harold J. Hovel
- 👤 Jerry M. Woodall
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 12:45
CPC Classifications
H; H10; H10F; H10F10/00; H10F10/10; H10F10/14; H10F10/144; H10P; H10P14/00; H10P14/20; H10P14/26; H10P14/263; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2911; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3421; H10P14/3438; H10P14/3441; H10P14/3444; H10P14/3446; H10P14/36; Y; Y02; Y02E; Y02E10/00; Y02E10/50; Y02E10/544; Y10; Y10S; Y10S438/00; Y10S438/955
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
79 words
The process of fabrication of a semiconductor structure having epitaxially contiguous regions of first and second semiconductor materials comprising in combination, the steps of contacting a substrate of a first semiconductor material with a melt of a second semiconductor material having the characteristics that the melt is undersaturated at the contacting temperature and that it becomes supersaturated as a result of the presence of said first semiconductor material dissolved into said melt, and separating said substrate and said melt.
Claim 2
Dependent Claim
79 words
The process of fabrication of a semiconductor structure having epitaxially contiguous regions of first and second semiconductor materials comprising in combination, the steps of contacting a substrate of a first semiconductor material with a melt of a second semiconductor material having the characteristics that the melt is undersaturated at the contacting temperature and that it becomes supersaturated as a result of the presence of said first semiconductor material dissolved into said melt, and separating said substrate and said melt.
Claim 3
Dependent Claim
20 words
The process of claim 1 wherein said first semiconductor is gallium arsenide and said second semiconductor is gallium aluminum arsenide.
Claim 4
Dependent Claim
34 words
The process of claim 2 wherein said melt contains a conductivity type determining impurity compatible with both said first and said second semiconductor materials and opposite in type to that of said substrate material.
Claim 5
Dependent Claim
80 words
The process of fabrication of a semiconductor structure having epitaxially contiguous regions of a ternary and a binary semiconductor material having at least one common ingredient comprising in combination forming an unsaturated melt of said ternary semiconductor material, at least with respect to said common ingredient, etching a portion of a binary semiconductor material with said melt, growing from said same melt a region of said ternary semiconductor material epitaxially contiguous with said binary semiconductor material, and separating said melt.
Claim 6
Dependent Claim
80 words
The process of fabrication of a semiconductor structure having epitaxially contiguous regions of a ternary and a binary semiconductor material having at least one common ingredient comprising in combination forming an unsaturated melt of said ternary semiconductor material, at least with respect to said common ingredient, etching a portion of a binary semiconductor material with said melt, growing from said same melt a region of said ternary semiconductor material epitaxially contiguous with said binary semiconductor material, and separating said melt.
Claim 7
Dependent Claim
20 words
The process of claim 4 wherein said binary semiconductor is gallium arsenide and said ternary semiconductor is gallium aluminum arsenide.
Claim 8
Dependent Claim
33 words
The process of claim 5 wherein said melt includes a conductivity type determining impurity compatible with both said ternary and said binary semiconductor materials and opposite in type to said binary semiconductor material.
Claim 9
Dependent Claim
106 words
The process of fabricating a semiconductor structure having epitaxially contiguous regions of first and second semiconductor material comprising in combination the steps of forming a melt of a first semiconductor material at a first temperature in the presence of an excess of said second semiconductor material; contacting a substrate of a second semiconductor material with said melt at a temperature higher than said first temperature whereby an epitaxially contiguous region of said first semiconductor material is regrown on said second semiconductor material from said melt into which a portion of said second semiconductor material has dissolved; and separating said substrate and the remains of said melt.
Claim 10
Dependent Claim
106 words
The process of fabricating a semiconductor structure having epitaxially contiguous regions of first and second semiconductor material comprising in combination the steps of forming a melt of a first semiconductor material at a first temperature in the presence of an excess of said second semiconductor material; contacting a substrate of a second semiconductor material with said melt at a temperature higher than said first temperature whereby an epitaxially contiguous region of said first semiconductor material is regrown on said second semiconductor material from said melt into which a portion of said second semiconductor material has dissolved; and separating said substrate and the remains of said melt.
Claim 11
Dependent Claim
20 words
The process of claim 7 wherein said first semiconductor is gallium aluminum arsenide and said second semiconductor is gallium arsenide.
Claim 12
Dependent Claim
58 words
The process of claim 8 wherein said melt contains an impurity capable of serving as a conductivity type determining impurity in both said first and said second semiconductor materials of a type opposite to the conductivity type of said second semiconductor material, said impurity further being capable of diffusing into said second semiconductor material at said contacting temperature.
Claim 13
Dependent Claim
114 words
The process of fabricating a light-electrical energy converter comprising in combination: forming a melt of gallium, aluminum, arsenic and zinc at a first temperature in the presence of gallium arsenide; contacting for a period greater than 10 minutes, an n-conductivity type gallium arsenide substrate with said melt at a temperature higher than said first temperature whereby an epitaxially continguous zinc doped p-conductivity type region of gallium aluminum arsenide is regrown on said gallium arsenide substrate from said melt in which a portion of said substrate of gallium arsenide has dissolved; removing the remainder of said melt, and applying contacts to said gallium arsenide substrate and to a said regrown region of gallium aluminum arsenide.
Claim 14
Dependent Claim
114 words
The process of fabricating a light-electrical energy converter comprising in combination: forming a melt of gallium, aluminum, arsenic and zinc at a first temperature in the presence of gallium arsenide; contacting for a period greater than 10 minutes, an n-conductivity type gallium arsenide substrate with said melt at a temperature higher than said first temperature whereby an epitaxially continguous zinc doped p-conductivity type region of gallium aluminum arsenide is regrown on said gallium arsenide substrate from said melt in which a portion of said substrate of gallium arsenide has dissolved; removing the remainder of said melt, and applying contacts to said gallium arsenide substrate and to a said regrown region of gallium aluminum arsenide.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-12-10 | 1983-06-11 | 1983-12-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-12-10 | 1987-06-11 | 1987-12-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-12-10 | 1991-06-11 | 1991-12-11 | $7700.00 | Window Closed / Lapsed |