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US4169269A
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Junction field effect transistor
Assignee: Toshiba Corp
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Filing: 1977-12-01
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Granted: 1979-09-25
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Expires: 1997-12-01
Abstract
Abstract A junction field effect transistor has a first conductivity type substrate with high impurity concentration, a first conductivity type layer with low impurity concentration which is layered on the substrate, a first region of first conductivity type and with high impurity concentration which is formed in the surface region of the layer, and a second region of second conductivity type and with high impurity concentration which is formed in the surface region of the layer, substantially surrounding the side wall of the first region. The thickness of the layer is within the range from 4.0 to 6.0 μm. The minimum width of the portion surrounded by the second region and the impurity concentration of the layer fall within the area with four corners A, B, C and D where these corners correspond to the four coordinates (log 10 4×10 15 , 2.0), (log 10 18×10 15 , 1.2), (log 10 18×10 15 , 0.5) and (log 10 4×10 15 , 1.1) of a rectangular coordinates of which the Y-distance represents the minimum width and the X-distance is the impurity concentration in the logarithmic scale.
Inventors
- 👤 Kiyoshi Aoki
- 👤 Hisao Kamo
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 19:43
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/80; H10D30/83; H10D30/831
Claims Analysis
Total Claims: 4
Claim 1
Independent Claim
221 words
A junction field effect transistor comprising: a first conductivity type substrate with high impurity concentration; a first conductivity type layer with a low impurity concentration of 4×10 15 to 18×10 15 cm -3 which is layered on said substrate; a first region of first conductivity type and of high impurity concentration which is formed in the surface region of said layer; a second region of second conductivity type and of high impurity concentration which is formed in the surface region of said layer adjacent side walls of said first region in a manner not in contact with said first region; and wherein the thickness of said layer is 4.0 to 6.0 μm and the minimum channel width of that portion of said layer in contact with said second region and the impurity conentration of said layer fall within the area with four corners A, B, C and D where these corners correspond to the four points (log 10 4×10 15 , 2.0), (log 10 18×10 15 , 1.2), (log 10 18×10 15 , 0.5) and (log 10 4×10 15 , 1.1) of a rectangular coordinate system having X and Y axes of which the Y-distance is said minimum channel width in microns and the X-distance is the impurity concentration in atoms per cubic centimeter of said layer in the logarithmic scale.
Claim 2
Dependent Claim
221 words
A junction field effect transistor comprising: a first conductivity type substrate with high impurity concentration; a first conductivity type layer with a low impurity concentration of 4×10 15 to 18×10 15 cm -3 which is layered on said substrate; a first region of first conductivity type and of high impurity concentration which is formed in the surface region of said layer; a second region of second conductivity type and of high impurity concentration which is formed in the surface region of said layer adjacent side walls of said first region in a manner not in contact with said first region; and wherein the thickness of said layer is 4.0 to 6.0 μm and the minimum channel width of that portion of said layer in contact with said second region and the impurity conentration of said layer fall within the area with four corners A, B, C and D where these corners correspond to the four points (log 10 4×10 15 , 2.0), (log 10 18×10 15 , 1.2), (log 10 18×10 15 , 0.5) and (log 10 4×10 15 , 1.1) of a rectangular coordinate system having X and Y axes of which the Y-distance is said minimum channel width in microns and the X-distance is the impurity concentration in atoms per cubic centimeter of said layer in the logarithmic scale.
Claim 3
Dependent Claim
210 words
A junction field effect transistor comprising: a first conductivity type substrate with high impurity concentration; a first conductivity type layer with a low impurity concentration of 4×10 15 to 18×10 15 cm -3 which is layered on said substrate; a first region of first conductivity type and of high impurity concentration which is formed in the surface region of said layer; a second region of second conductivity type and of high impurity concentration which is formed in the surface region of said layer adjacent side walls of said first region in a manner not in contact with said first region; and wherein the minimum channel width of that portion of said layer in contact with said second region and the impurity concentration of said layer fall within the area with four corners A, B, C and D where these corners correspond to the four points (log 10 4×10 15 , 2.0), (log 10 18×10 15 , 1.2), (log 10 18×10 15 , 0.5) and (log 10 4×10 15 , 1.1) of a rectangular coordinate system having X and Y axes of which the Y-distance is said minimum channel width in microns and the X-distance is the impurity concentration in atoms per cubic centimeter of said layer in the logarithmic scale.
Claim 4
Dependent Claim
210 words
A junction field effect transistor comprising: a first conductivity type substrate with high impurity concentration; a first conductivity type layer with a low impurity concentration of 4×10 15 to 18×10 15 cm -3 which is layered on said substrate; a first region of first conductivity type and of high impurity concentration which is formed in the surface region of said layer; a second region of second conductivity type and of high impurity concentration which is formed in the surface region of said layer adjacent side walls of said first region in a manner not in contact with said first region; and wherein the minimum channel width of that portion of said layer in contact with said second region and the impurity concentration of said layer fall within the area with four corners A, B, C and D where these corners correspond to the four points (log 10 4×10 15 , 2.0), (log 10 18×10 15 , 1.2), (log 10 18×10 15 , 0.5) and (log 10 4×10 15 , 1.1) of a rectangular coordinate system having X and Y axes of which the Y-distance is said minimum channel width in microns and the X-distance is the impurity concentration in atoms per cubic centimeter of said layer in the logarithmic scale.
References Cited (Backward Citations)
US4041517A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-09-24 | 1983-03-26 | 1983-09-25 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-09-24 | 1987-03-26 | 1987-09-25 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-09-24 | 1991-03-26 | 1991-09-25 | $7700.00 | Window Closed / Lapsed |