US4152779A
Expired / Lapsed
US
⏱️ 0.0 years remaining
MOS ram cell having improved refresh time
Assignee: Texas Instruments Inc
•
Filing: 1978-04-06
•
Granted: 1979-05-01
•
Expires: 1998-04-06
Abstract
Abstract In a microelectronic, metal-oxide-semiconductor dynamic random access memory cell having an MOS capacitance signal storage region, leakage current has been found to have a critical dependence upon the voltage level at which the storage gate is operated (V STORE ). The leakage rate undergoes a sharp transition to a low state below a certain critical V STORE . This transition is due to the shutting off of the leakage from the periphery and field region around the cell. Consequently, maximum refresh time is achieved by modifying the cell to permit operation of the storage gate below the critical voltage, which may be at or near ground level. For an n-channel cell, permanently shifting the flatband voltage at the silicon-oxide interface of the storage capacitor in the negative direction can generate a potential well for charge storage with a very small V STORE . Preferably, this flatband voltage shift is achieved by a shallow implant of a donor impurity in the silicon surface of the storage region of an n-channel device, or an acceptor impurity for a p-channel device. The critical maximum V STORE is a function of the channel-stop doping level. Increasing the channel-stop doping level results in a higher critical V STORE without a significant increase in leakage; however, since circuit speed and breakdown voltage are reduced by increased channel-stop doping, such an alternative option cannot fully offset the need for a shift in the flatband voltage, so that the low leakage condition is achieved by a combination of increased channel-stop doping and shifted flatband to permit lower V STORE .
Inventors
- 👤 Al F. Tasch, Jr.
- 👤 Pallab K. Chatterjee
- 👤 Horng-Sen Fu
- 👤 Geoffrey W. Taylor
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 20:53
CPC Classifications
G; G11; G11C; G11C11/00; G11C11/21; G11C11/34; G11C11/40; G11C11/401; G11C11/403; G11C11/404; H; H10; H10B; H10B12/00; H10B12/30
Claims Analysis
Total Claims: 16
Claim 1
Independent Claim
174 words
A dynamic RAM cell having reduced leakage current and, consequently, improved refresh time, comprising a monocrystalline semiconductor substrate of one conductivity type, an adherent dielectric layer on one surface thereof, said dielectric layer including a relatively thick field region surrounding a relatively thin storage and transfer region, a storage gate electrode covering a first portion of said relatively thin dielectric and extending in part over said relatively thick dielectric, a transfer gate electrode covering a second portion of said relatively thin dielectric and insulated from said storage gate electrode, a charge storage region in said substrate aligned with the thin-dielectric portion of said storage gate electrode, said storage region including a shallow layer wherein the surface potential of the substrate is adjusted to provide a potential well for charge storage, and a channel-stop region surrounding the device wherein the doping level is between 5× 10 16 cm -3 and 5× 10 17 cm -3 , whereby operation of the storage gate at reduced voltage cuts off leakage current from the field and peripheral regions.
Claim 2
Dependent Claim
174 words
A dynamic RAM cell having reduced leakage current and, consequently, improved refresh time, comprising a monocrystalline semiconductor substrate of one conductivity type, an adherent dielectric layer on one surface thereof, said dielectric layer including a relatively thick field region surrounding a relatively thin storage and transfer region, a storage gate electrode covering a first portion of said relatively thin dielectric and extending in part over said relatively thick dielectric, a transfer gate electrode covering a second portion of said relatively thin dielectric and insulated from said storage gate electrode, a charge storage region in said substrate aligned with the thin-dielectric portion of said storage gate electrode, said storage region including a shallow layer wherein the surface potential of the substrate is adjusted to provide a potential well for charge storage, and a channel-stop region surrounding the device wherein the doping level is between 5× 10 16 cm -3 and 5× 10 17 cm -3 , whereby operation of the storage gate at reduced voltage cuts off leakage current from the field and peripheral regions.
Claim 3
Dependent Claim
30 words
A cell as in claim 1 wherein said storage gate electrode extends over said relatively thick dielectric a distance equal to at least twice the thickness of said thick dielectric.
Claim 4
Dependent Claim
54 words
A cell as in claim 1 wherein the surface potential of the substrate storage region is adjusted by implanting therein an electron donor impurity in a sufficient concentration to provide a surface potential of greater than φ.sub. s (V DD ) on transfer gate for V G = 0-(V DD /2) on storage gate.
Claim 5
Dependent Claim
19 words
A cell as in claim 1 wherein said transfer gate electrode extends in part above said storage gate electrode.
Claim 6
Dependent Claim
61 words
A cell as in claim 1 wherein said storage region includes a first shallow N-type implant and a somewhat deeper P-type implant; the relative dosage of the two implants being such as to provide a potential well in said storage region greater than φ.sub. s (V DD ) on transfer gate for V G = 0-(V DD /2) on storage gate.
Claim 7
Dependent Claim
145 words
An MOS dynamic RAM cell having reduced leakage current and, consequently, improved refresh time, comprising a monocrystalline semiconductor substrate of one conductivity type, an adherent dielectric layer on one surface thereof, said dielectric layer including a relatively thick field region surrounding a relatively thin storage and transfer region, a storage gate electrode covering a first portion of said relatively thin dielectric and extending in part over said relatively thick dielectric, a transfer gate electrode covering a second portion of said relatively thin dielectric and insulated from said storage gate electrode, a charge storage region in said substrate aligned with the thin-dielectric portion of said storage gate electrode, said storage region including a shallow layer wherein the surface potential of the substrate is adjusted to provide a potential well for charge storage, of at least 0.7- 7 volts with the storage gate in the "off" condition.
Claim 8
Dependent Claim
145 words
An MOS dynamic RAM cell having reduced leakage current and, consequently, improved refresh time, comprising a monocrystalline semiconductor substrate of one conductivity type, an adherent dielectric layer on one surface thereof, said dielectric layer including a relatively thick field region surrounding a relatively thin storage and transfer region, a storage gate electrode covering a first portion of said relatively thin dielectric and extending in part over said relatively thick dielectric, a transfer gate electrode covering a second portion of said relatively thin dielectric and insulated from said storage gate electrode, a charge storage region in said substrate aligned with the thin-dielectric portion of said storage gate electrode, said storage region including a shallow layer wherein the surface potential of the substrate is adjusted to provide a potential well for charge storage, of at least 0.7- 7 volts with the storage gate in the "off" condition.
Claim 9
Dependent Claim
14 words
A cell as in claim 6 wherein the signal channel is of N-type conductivity.
Claim 10
Dependent Claim
14 words
A cell as in claim 6 wherein the signal channel is of P-type conductivity.
Claim 11
Dependent Claim
14 words
A cell as in claim 6 selected from single-level and double-level polysilicon one-transistor types.
Claim 12
Dependent Claim
11 words
A cell as in claim 6 of the high-capacity one-transistor type.
Claim 13
Dependent Claim
26 words
A cell as in claim 6 wherein the semiconductor is selected from III-V compounds and II-VI compounds, including GaAs, InSb, and Hg x Cd 1-x Te.
Claim 14
Dependent Claim
26 words
A cell as in claim 1 wherein the semiconductor is selected from III-V compounds and II-VI compounds, including GaAs, InSb, and Hg x Cd 1-x Te.
Claim 15
Dependent Claim
23 words
A cell as in claim 6 wherein the insulation layers consist of a sandwich of Si 3 N 4 and SiO 2 .
Claim 16
Dependent Claim
23 words
A cell as in claim 1 wherein the insulation layers consist of a sandwich of Si 3 N 4 and SiO 2 .
References Cited (Backward Citations)
US3387286A
Cited
US3720922A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-04-30 | 1982-10-30 | 1983-05-01 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-04-30 | 1986-10-30 | 1987-05-01 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-04-30 | 1990-10-30 | 1991-05-01 | $7700.00 | Window Closed / Lapsed |