Abstract The fixture comprises an insulating housing of synthetic resinous material which carries two sets of switches which number, in total, the number of terminals on an integrated circuit (IC) to be tested. Each switch has a manually operable arm or lever which can be placed in three separate positions, an upper position, a center position, and a lower position; and the switch has three terminals, an upper terminal, a center terminal, and a lower terminal, one for each position of the operable arm. All of the upper switch terminals are connected together to a first common plug, and all of the lower switch terminals are connected together to a second common plug, the two plugs being adapted to be inserted into a test device such as a curve tracer. Each center terminal is connected separately to a terminal on a zero-insertion force socket, into which the pins of the integrated circuit under test can be inserted.
A test fixture comprising an insulating housing including a relatively large-area base, two parallel left and right L-shaped side walls, first and second insertion plugs secured to said base and adapted to couple said fixture to test apparatus, a socket for receiving an integrated circuit having an array of pins extending from the bottom thereof and secured to said base between said first and second plugs, an array of switches supported on said base adjacent to each of said side walls, each switch including an operating arm which extends through the side wall and first, second and third terminals, all of the first terminals being connected together and all of the third terminals being connected together, each second terminal being electrically connected to one of said pins, and a plurality of auxiliary pins secured to said side walls and each connected to a second terminal of a switch.
Claim 2
Dependent Claim
148 words
A test fixture comprising an insulating housing including a relatively large-area base, two parallel left and right L-shaped side walls, first and second insertion plugs secured to said base and adapted to couple said fixture to test apparatus, a socket for receiving an integrated circuit having an array of pins extending from the bottom thereof and secured to said base between said first and second plugs, an array of switches supported on said base adjacent to each of said side walls, each switch including an operating arm which extends through the side wall and first, second and third terminals, all of the first terminals being connected together and all of the third terminals being connected together, each second terminal being electrically connected to one of said pins, and a plurality of auxiliary pins secured to said side walls and each connected to a second terminal of a switch.