US4144493A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Integrated circuit test structure
Assignee: International Business Machines Corp
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Filing: 1976-06-30
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Granted: 1979-03-13
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Expires: 1996-06-30
Abstract
Abstract A complex test structure for integrated, semiconductor circuits in which the impurity regions of the test device are elongated, preferably in serpentine fashion. The elongated impurity regions emulate corresponding regions in regular integrated circuit devices. Additional regions are provided, each in elongated form, which, when impressed with appropriate voltages or currents, provide indications of defect levels and product yield in the regular devices. Advantageously, the serpentine test structure is fabricated on the same wafer and with the same process steps as the regular integrated circuit chips. In one embodiment, a plurality of such monitors are provided adjacent each other in the same test site. Regions in one monitor are selectively connected to regions in another monitor and to external contact pads by contact stations disposed between each monitor.
Inventors
- 👤 James H. Lee
- 👤 Bernd K. S. Lessmann
- 👤 Akella V. Satya
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 16:22
CPC Classifications
H; H10; H10P; H10P74/00; H10P74/27; H10P74/277; G; G01; G01R; G01R31/00; G01R31/28; G01R31/2851; G01R31/2884
Claims Analysis
Total Claims: 22
Claim 1
Independent Claim
96 words
A test structure in a semiconductor substrate for monitoring a plurality of regular monolithic integrated circuits, said test structure comprising: a plurality of impurity regions which correspond to like impurity regions of said regular circuits with respect to relative disposition and conductivity within said substrate, said corresponding regions being elongated with respect to, but having the same depth and width as, said regular impurity regions; and at least one other elongated impurity region within said test structure not corresponding to any of said regular impurity regions for providing indications of defect levels in said regular circuits.
Claim 2
Dependent Claim
96 words
A test structure in a semiconductor substrate for monitoring a plurality of regular monolithic integrated circuits, said test structure comprising: a plurality of impurity regions which correspond to like impurity regions of said regular circuits with respect to relative disposition and conductivity within said substrate, said corresponding regions being elongated with respect to, but having the same depth and width as, said regular impurity regions; and at least one other elongated impurity region within said test structure not corresponding to any of said regular impurity regions for providing indications of defect levels in said regular circuits.
Claim 3
Dependent Claim
64 words
A test structure as in claim 1 wherein: said regular circuits include dielectric isolation regions for isolating selected ones of said regular impurity regions; said test structure includes an elongated dielectric isolation region corresponding to said regular dielectric isolation regions, said elongated isolation region being contiguous to an elongated impurity region which corresponds to one of said selected ones of said regular impurity regions.
Claim 4
Dependent Claim
71 words
A test structure as in claim 2 wherein: said non-corresponding other impurity region is disposed contiguous to said elongated dielectric isolation region opposite from said corresponding elongated impurity region; and further comprising: an elongated conductive stripe disposed atop said elongated dielectric isolation region; and means for supplying electric potentials to said conductive stripe and said contiguous impurity regions, whereby shorts and leakage may be measured through said elongated dielectric isolation region.
Claim 5
Dependent Claim
19 words
A test structure as in claim 3 wherein: said contiguous elongated impurity regions are of the same conductivity type.
Claim 6
Dependent Claim
38 words
A test structure as in claim 4 wherein: said regular circuits include junction isolation regions disposed beneath said dielectric isolation regions; and said test structure includes an elongated junction isolation region disposed beneath said elongated dielectric isolation region.
Claim 7
Dependent Claim
63 words
A test structure as in claim 1 wherein: said regular circuits include: resistor regions; and conductive stripes disposed atop said resistor regions and insulated therefrom; and said test structure includes: a pair of spaced elongated resistor regions corresponding to said regular resistor regions; an elongated conductive stripe corresponding to said regular conductive stripes disposed atop both said elongated resistor regions and insulated therefrom.
Claim 8
Dependent Claim
36 words
A test structure as in claim 6 further comprising: means for supplying electric potentials to said elongated conductive stripe, whereby the effects of said elongated stripe on said pair of elongated resistor regions may be measured.
Claim 9
Dependent Claim
76 words
A test structure as in claim 1 wherein: one of said corresponding impurity regions is disposed at the surface of said substrate; and further comprising: a dielectric layer overlaying and in contact with said surface impurity region; an elongated conductive stripe disposed over said dielectric layer and in line with said surface region; and means for supplying a potential across said dielectric layer, whereby short circuits between said stripe and said surface region may be detected.
Claim 10
Dependent Claim
46 words
A test structure as in claim 1 wherein said at least one other non-corresponding elongated impurity region includes: a pair of regions of the same conductivity type separated by an elongated dielectric isolation region, and an elongated junction isolation region disposed beneath said dielectric isolation region.
Claim 11
Dependent Claim
46 words
A test structure as in claim 9 and further comprising: means for providing current flow between one of said pair of regions and said junction isolation region and for measuring the voltage therebetween, whereby misalignment between said junction isolation and dielectric isolation region may be determined.
Claim 12
Dependent Claim
28 words
A test structure as in claim 9 further comprising: an elongated buried region adjacent and spaced from said elongated junction isolation region and of opposite conductivity type thereto.
Claim 13
Dependent Claim
38 words
A test structure as in claim 11 further comprising: means for providing current flow between said buried and junction isolation regions and for measuring the voltage therebetween, whereby misalignment between said buried junction isolation regions may be determined.
Claim 14
Dependent Claim
23 words
A test structure as in claim 1 wherein: said test structure is substantially rectangular; and each said elongated region forms a serpentine pattern.
Claim 15
Dependent Claim
72 words
A test site for semiconductor circuits comprising: a set of monitoring structures disposed adjacent each other in a semiconductor substrate; each said structure including a plurality of co-extensive, elongated impurity regions within said substrate; contact pads located at the periphery of said structures for providing external contacts to the terminals of said elongated regions; and contact stations disposed between said monitoring structures for selectively interconnecting said elongated regions and said contact pads.
Claim 16
Dependent Claim
72 words
A test site for semiconductor circuits comprising: a set of monitoring structures disposed adjacent each other in a semiconductor substrate; each said structure including a plurality of co-extensive, elongated impurity regions within said substrate; contact pads located at the periphery of said structures for providing external contacts to the terminals of said elongated regions; and contact stations disposed between said monitoring structures for selectively interconnecting said elongated regions and said contact pads.
Claim 17
Dependent Claim
24 words
A test site as in claim 14 wherein: each said monitoring structure is substantially rectangular; and each said elongated region forms a serpentine pattern.
Claim 18
Dependent Claim
75 words
A test site as in claim 14 further comprising: at least one dielectric isolation region formed within said substrate and separating first and second elongated impurity regions in said monitoring structures; at least one elongated, conductive stripe disposed atop at least one of said monitoring structures, over and coextensive with said dielectric isolation regions; and another contact pad located at the periphery of said test site for providing an external contact to said conductive stripes.
Claim 19
Dependent Claim
20 words
A test site as in claim 16 wherein said first and second impurity regions are of the same conductivity type.
Claim 20
Dependent Claim
59 words
A test site as in claim 17 wherein: said first impurity regions in adjacent monitoring structures are electrically unconnected; each terminal of said first impurity region being connected to an associated contact pad; said second impurity regions in adjacent monitoring structures are electrically connected; the adjacent terminals of said second impurity regions being connected to a single contact pad.
Claim 21
Dependent Claim
40 words
A test site as in claim 17 wherein: said first and second impurity regions in one monitoring structure are connected to said second and first impurity regions, respectively, in an adjacent monitoring structure by first and second contact pads, respectively.
Claim 22
Dependent Claim
100 words
A test site as in claim 14 wherein: first impurity regions of one conductivity type at like locations in a pair of adjacent monitoring structures are electrically unconnected; each terminal of said first regions being connected to an associated contact pad; and second impurity regions of said one conductivity type at like locations in said pair of monitoring structures are electrically connected; the adjacent terminals of said second regions being connected to a single contact pad; whereby opens in each of said first and second regions and shorts therebetween may be electrically detected using a minimum number of contact pads.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1982-03-12 | 1982-09-11 | 1983-03-13 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1986-03-12 | 1986-09-11 | 1987-03-13 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1990-03-12 | 1990-09-11 | 1991-03-13 | $7700.00 | Window Closed / Lapsed |