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US4141764A Expired / Lapsed US ⏱️ 0.0 years remaining

Process for the manufacture of silicon of large surface area bonded to a substrate and silicon-bonded substrates so made

Assignee: Siltronic AG
•
Filing: 1977-10-11
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Granted: 1979-02-27
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Expires: 1997-10-11
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Abstract

Abstract Process for the manufacture of silicon of large surface area bonded to a substrate, which comprises depositing silicon to a thickness of from 30 to 500 μm onto panel-shaped substrates of glassy carbon (a glass-like carbon obtained by carbonizing a spatially cross-linked synthetic resin) that are heated by direct passage of an electric current to temperatures above the melting point of silicon, and thereafter cooling the silicon to a temperature below its melting point in the direction from its free surface toward the substrate. The invention also comprises the silicon panels so made which are especially useful in the manufacture of solar cells.

Inventors

  • 👤 Bernhard Authier
  • 👤 Heinz J. Rath
  • 👤 Dietrich Schmidt
  • 👤 Johann Hofer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-24 22:36
CPC Classifications
C; C30; C30B; C30B29/00; C30B29/02; C30B29/06; C30B11/00; C30B11/003; C30B11/04; C30B11/08; C30B11/12; C30B29/60

Claims Analysis

Total Claims: 6
Claim 1
Independent Claim 118 words
A process for the manufacture of silicon of large surface area bonded to a substrate by deposition from the gaseous phase onto panel-shaped substrates, wherein the silicon deposited is converted from its molten state into crystalline form under the influence of a temperature gradient at a right angle to the surface of the substrate, which comprises depositing silicon from decomposition of silicon-containing vapors to a thickness of from 30 to 500 μm onto panel-shaped substrates of glassy carbon that are heated by direct passage of an electric current to a temperature of from 1430° to 1500°C. and thereafter cooling the silicon to a temperature below its melting point in the direction from its free surface towards the substrate.
Claim 2
Dependent Claim 118 words
A process for the manufacture of silicon of large surface area bonded to a substrate by deposition from the gaseous phase onto panel-shaped substrates, wherein the silicon deposited is converted from its molten state into crystalline form under the influence of a temperature gradient at a right angle to the surface of the substrate, which comprises depositing silicon from decomposition of silicon-containing vapors to a thickness of from 30 to 500 μm onto panel-shaped substrates of glassy carbon that are heated by direct passage of an electric current to a temperature of from 1430° to 1500°C. and thereafter cooling the silicon to a temperature below its melting point in the direction from its free surface towards the substrate.
Claim 3
Dependent Claim 17 words
The process according to claim 1 wherein trichlorosilane in admixture with hydrogen is used as deposition gas.
Claim 4
Dependent Claim 13 words
The process according to claim 2, wherein the deposition gas contains a dopant.
Claim 5
Dependent Claim 12 words
The process according to claim 3, wherein the deposition gas contains boron.
Claim 6
Dependent Claim 48 words
Process according to claim 3 wherein, starting from the free surface of the silicon layer, dopants are incorporated up to a depth of from 0.5 to 3 μm, which dopants dope silicon oppositely to the dopants of the adjoining silicon layer, in order to produce a p, n-transition.

References Cited (Backward Citations)

US3141849A Cited
US3335038A Cited
US3808033A Cited
US3900943A Cited
US4059461A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-02-26 1982-08-28 1983-02-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-02-26 1986-08-28 1987-02-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-02-26 1990-08-28 1991-02-27 $7700.00 Window Closed / Lapsed

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