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US4139933A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for fabricating a scanning electron microscope micrometer scale

Assignee: United States Department of Commerce
•
Filing: 1977-11-03
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Granted: 1979-02-20
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Expires: 1997-11-03
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Abstract

Abstract A microscopic length scale typically about 50 μm long and graduated in several intervals ranging from 1 μm to 20 μm. The scale is useful in calibrating the magnification of scanning electron microscopes (SEMs) and other electron imaging instruments. The scale comprises alternating layers of two metals deposited on a substrate. The two metals have substantially different electron emission coefficients to provide contrasting emission signals when scanned by an electron beam. One of the metals, preferably gold, is deposited in uniform layers about 40-80 nm thick. The other metal, preferably nickel, is deposited in several layers ranging from 1 μm or so thick near the substrate to 20 μm thick in the outermost layer. The resultant multilayer composite is cut into one or more samples and each sample is mounted on edge. The exposed edge is ground and metallographically polished and a microscopic indentation is made in the substrate near the first gold layer. The indentation defines a reference region, and the distances between the first gold layer and the subsequent gold layers in the reference region are measured. The measurement is made using a similar sample which was previously calibrated with the aid of a polarizing layer interferometer.

Inventors

  • 👤 David B. Ballard
  • 👤 Fielding Ogburn
  • 👤 John P. Young

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-11-04 03:02
CPC Classifications
H; H01; H01J; H01J37/00; H01J37/26; H01J37/28; G; G01; G01B; G01B3/00; G01B3/30; H01J37/261; Y; Y10; Y10T; Y10T29/00; Y10T29/49; Y10T29/49002; Y10T29/49789

Claims Analysis

Total Claims: 8
Claim 1
Independent Claim 173 words
A method of fabricating a scanning electron microscope micrometer scale comprising: providing a durable, corrosion resistant substantially nonmagnetic substrate; electroplating a plurality of layers of two substantially nonmagnetic, corrosion resistant metals of substantially different electron emission coefficients in alternating succession on said substrate to form a composite; the layers of one of said two metals having a uniform thickness of about 40-80 nm; the layers of the other of said two metals having thicknesses ranging from about 1 μm near said substrate to many μm away from said substrate; heating said composite to about 250°-300° C at about 10 -3 - 10 -5 Torr for about 15-20 h; shearing said vacuum heat-treated composite into small samples; mounting said samples on edge in sections of substantially non-magnetic, corrosion resistant tubing; grinding and metallographically polishing said mounted samples; placing a microscopic indentation in the substrate of each sample adjacent said deposited layers to define a reference region; and measuring the distances between said layers of said one of said two mtals in said reference region.
Claim 2
Independent Claim 173 words
A method of fabricating a scanning electron microscope micrometer scale comprising: providing a durable, corrosion resistant substantially nonmagnetic substrate; electroplating a plurality of layers of two substantially nonmagnetic, corrosion resistant metals of substantially different electron emission coefficients in alternating succession on said substrate to form a composite; the layers of one of said two metals having a uniform thickness of about 40-80 nm; the layers of the other of said two metals having thicknesses ranging from about 1 μm near said substrate to many μm away from said substrate; heating said composite to about 250°-300° C at about 10 -3 - 10 -5 Torr for about 15-20 h; shearing said vacuum heat-treated composite into small samples; mounting said samples on edge in sections of substantially non-magnetic, corrosion resistant tubing; grinding and metallographically polishing said mounted samples; placing a microscopic indentation in the substrate of each sample adjacent said deposited layers to define a reference region; and measuring the distances between said layers of said one of said two mtals in said reference region.
Claim 3
Dependent Claim 16 words
The method set forth in claim 1, wherein said one of said two metals is gold.
Claim 4
Dependent Claim 16 words
The method set forth in claim 1, wherein said other of said two metals is nickel.
Claim 5
Dependent Claim 14 words
The method set forth in claim 1, wherein said substrate is a nickel-copper alloy.
Claim 6
Dependent Claim 12 words
The method set forth in claim 4, wherein said alloy is Monel.
Claim 7
Dependent Claim 20 words
The method set forth in claim 1, wherein said samples are mounted in said tubing sections with copper-filled diallyl phthalate.
Claim 8
Dependent Claim 16 words
The method set forth in claim 1, wherein said small samples are about 5-10 mm square.

References Cited (Backward Citations)

US2116927A Cited
US2859158A Cited
US3659098A Cited
US3987529A Cited
US3954420A Cited
US4005527A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1982-02-19 1982-08-21 1983-02-20 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1986-02-19 1986-08-21 1987-02-20 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1990-02-19 1990-08-21 1991-02-20 $7700.00 Window Closed / Lapsed

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