US4126782A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Electrostatic charged-particle analyzer
Assignee: Hitachi Ltd
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Filing: 1977-01-26
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Granted: 1978-11-21
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Expires: 1997-01-26
Abstract
Abstract An electrostatic charged-particle analyzer includes a deflecting electrode system which focuses charged particles emitted from a sample by irradiating the sample with a primary beam, the particles being focused on the axis of the primary beam or on an identical circumference about the axis, and a cylindrical mirror type analyzer whose object point is the focusing point, whereby the accepted solid angle for the charged particles is made large.
Inventors
- 👤 Katsuhisa Usami
- 👤 Isao Ishikawa
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-04 21:58
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/44; H01J49/46; H01J49/48; H01J49/482
Claims Analysis
Total Claims: 8
Claim 1
Independent Claim
109 words
In apparatus for analyzing charged particles emitted from a sample by irradiating it with a primary beam, an electrostatic charged-particle analyzer comprising a deflecting electrode system which focuses said charged particles on the axis of said primary beam or an extension thereof or on an identical circumference about said axis or said extension, a slit disposed at the focusing position of said charged particles, a cylindrical mirror type analyzing system having its object point at said focusing position, a detector which detects said charged particles received from said cylindrical mirror type analyzing system, and a mass analysing system which is coaxially arranged inside said cylindrical mirror type analyzing system.
Claim 2
Dependent Claim
109 words
In apparatus for analyzing charged particles emitted from a sample by irradiating it with a primary beam, an electrostatic charged-particle analyzer comprising a deflecting electrode system which focuses said charged particles on the axis of said primary beam or an extension thereof or on an identical circumference about said axis or said extension, a slit disposed at the focusing position of said charged particles, a cylindrical mirror type analyzing system having its object point at said focusing position, a detector which detects said charged particles received from said cylindrical mirror type analyzing system, and a mass analysing system which is coaxially arranged inside said cylindrical mirror type analyzing system.
Claim 3
Dependent Claim
34 words
The analyzer according to claim 1, wherein said deflecting electrode system is provided so as to focus said charged particles on a side opposite to the primary beam side with respect to said sample.
Claim 4
Dependent Claim
33 words
The analyzer according to claim 1, wherein said deflecting electrode system is constructed of two electrodes which are axially symmetric and whose sections in a plane containing the axis of symmetry are L-shaped.
Claim 5
Dependent Claim
149 words
In apparatus for analyzing charged particles emitted from a sample by irradiating it with a primary beam, an electrostatic charged-particle analyzer comprising a deflecting electrode system which focuses said charged particles on an axis of said primary beam or an extension thereof or on an identical circumference about said axis or said extension, a slit which, when said charged particles are Auger electrons, is disposed at the focusing position thereof, a cylindrical mirror type analyzing system having its object point coincident with said focusing position, an electrostatic lens means having a focus at the focusing position thereof for deflecting said secondary ions substantially in parallel, a mass analyzer coaxially arranged inside said cylindrical mirror type analyzing system in order to analyze the secondary ions having passed through said electrostatic lens, and a detector which detects the charged particles from said cylindrical mirror type analyzing system or said mass analyzer.
Claim 6
Dependent Claim
149 words
In apparatus for analyzing charged particles emitted from a sample by irradiating it with a primary beam, an electrostatic charged-particle analyzer comprising a deflecting electrode system which focuses said charged particles on an axis of said primary beam or an extension thereof or on an identical circumference about said axis or said extension, a slit which, when said charged particles are Auger electrons, is disposed at the focusing position thereof, a cylindrical mirror type analyzing system having its object point coincident with said focusing position, an electrostatic lens means having a focus at the focusing position thereof for deflecting said secondary ions substantially in parallel, a mass analyzer coaxially arranged inside said cylindrical mirror type analyzing system in order to analyze the secondary ions having passed through said electrostatic lens, and a detector which detects the charged particles from said cylindrical mirror type analyzing system or said mass analyzer.
Claim 7
Dependent Claim
29 words
The analyzer according to claim 4, wherein said deflecting electrode system includes means for focusing said charged particles on the side of said sample opposite to said primary beam.
Claim 8
Dependent Claim
33 words
The analyzer according to claim 4, wherein said deflecting electrode system is constructed of two electrodes which are axially symmetric and whose sections in a plane containing the axis of symmetry are L-shaped.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-11-20 | 1982-05-22 | 1982-11-21 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-11-20 | 1986-05-22 | 1986-11-21 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-11-20 | 1990-05-22 | 1990-11-21 | $7700.00 | Window Closed / Lapsed |