Semiconductor device and a method of fabricating the same

Claim 2

A semiconductor device comprising: a semiconductor body consisting of a III-V compound semiconductor material not including Al, having a major surface, and having a first conductivity type; a mesa-shaped multi-layered semiconductor crystal disposed upon a portion of the major surface of said body and including (i) a laser active layer having two opposite surfaces, a first surface of which faces towards the major surface of said body and a second surface of which faces away from the major surface of said body, a pair of said surfaces and a pair of end surfaces, (ii) an upper semiconductor layer of a second conductivity type, opposite to said first conductivity type, being a top layer of said mesa-shaped multi-layered semiconductor crystal, consisting of a material including Al and having a broader band gap than that of the material of said laser active layer, and disposed on the second surface of said laser active layer, and (iii) a lower semiconductor layer of said first conductivity type, consisting of a material different from and having a broader band gap than that of the material of said laser active layer, and disposed on the first surface of said laser active layer; a side semiconductor layer of said first conductivity type consisting of a material different from and having a broader band gap than that of the material of said laser active layer, and disposed on the remainder of said major surface of said body and contiguous with the laser active layer at the side surfaces thereof but not the top surface of said mesa-shaped multi-layered semiconductor crystal; and first and second layers disposed on said semiconductor body and said upper semiconductor layer, respectively.

Claim 3

A semiconductor device according to claim 1, wherein the materials of said laser active layer and said body are Ga 1-y Al y As (0 ≦ y < 1) and GaAs, respectively, and the materials of said upper, lower, and side semiconductor layers are selected from the group consisting of Ga 1-x Al x As (0 < x ≦ 1, x > y) and Ga 1-x Al x As 1-q P q (0 < x ≦ 1, 0 ≦ q 1, and x > y).

Claim 4

A semiconductor device according to claim 2, wherein the materials of said upper, lower, and side semiconductor layers are GaAlAs.

Claim 5

A semiconductor device according to claim 2, wherein said materials of said upper, side, and lower semiconductor layers are Ga 1-x Al x As (0 < x ≦ 1), Ga 1-z Al z As (x ≦ z ≦ 1), and Ga 1-x Al x As (0 < x ≦ 1), respectively.

Claim 6

A semiconductor device according to claim 1, wherein the distance between said first and second surfaces is less than 1 μm.

Claim 7

A semiconductor device according to claim 1, wherein said end surfaces are parallel to each other so as to form a cavity resonator.

Claim 8

A semiconductor device according to claim 1, wherein said laser active layer has said second conductivity type.

Claim 9

A semiconductor device according to claim 1, wherein the thickness of said side semiconductor layer exceeds the thickness of said upper semiconductor layer by the sum of the thicknesses of said laser active layer and said lower semiconductor layer.

Claim 10

A semiconductor device according to claim 1, wherein the area A of a section of said laser active layer, perpendicular to the direction in which light generated in said laser active layer is propagated therein, is less than 1 μm 2 .

Claim 11

A semiconductor device according to claim 1, further comprising a semiconductor region of a second conductivity type, having a higher impurity concentration than that of said upper semiconductor layer, formed in the surface region of said upper semiconductor layer, and wherein said second metal layer is in contact with said semiconductor region.

Claim 12

A semiconductor device comprising: a semiconductor body consisting of a III-V compound semiconductor material not including Al, having a major surface, and having a first conductivity type; a mesa-shaped multi-layered semiconductor crystal disposed upon a first portion of the major surface of said body and including (i) a laser active layer having two opposite surfaces, a first surface of which faces towards the major surface of said body and a second surface of which faces away from the major surface of said body, a pair of side surfaces and a pair of end surfaces, (ii) an upper semiconductor layer of a second conductivity type, opposite to said first conductivity type, being a top layer of said mesa-shaped multi-layered semiconductor crystal, consisting of a material including Al and having a broader band gap than that of the material of said laser active layer, and disposed on the second surface of said laser active layer, and (iii) a lower semiconductor layer of said first conductivity type, consisting of a material including Al, different from and having a broader band gap than that of the material of said laser active layer, and disposed on the first surface of said laser active layer; a side semiconductor layer of said first conductivity type consisting of a material including Al, different from and having a broader band gap than that of the material of said laser active layer and having a mole fraction of Al greater than the mole fraction of Al in the material of said upper and lower semiconductor layers, and disposed on the remaining portion of said major surface of said body and contiguous with the laser active layer at the side surfaces thereof but not the top surface of said mesa-shaped multi-layered semiconductor crystal; and first and second metal layers disposed on said semiconductor body and said upper semiconductor layer, respectively.

Claim 13

A semiconductor device comprising: a semiconductor body consisting of a III-V compound semiconductor material not including Al, having a major surface, and having a first conductivity type; a mesa-shaped multi-layered semiconductor crystal disposed upon a first portion of the major surface of said body and including (i) a laser active layer having two opposite surfaces, a first surface of which faces towards the major surface of said body and a second surface of which faces away from the major surface of said body, a pair of side surfaces and a pair of end surfaces, (ii) an upper semiconductor layer of a second conductivity type, opposite to said first conductivity type, being a top layer of said mesa-shaped multi-layered semiconductor crystal, consisting of a material including Al and having a broader band gap than that of the material of said laser active layer, and disposed on the second surface of said laser active layer, and (iii) a lower semiconductor layer of said first conductivity type, consisting of a material including Al, different from and having a broader band gap than that of the material of said laser active layer, and disposed on the first surface of said laser active layer; a side semiconductor layer of said first conductivity type consisting of a material including Al, different from and having a broader band gap than that of the material of said laser active layer and having a mole fraction of Al greater than the mole fraction of Al in the material of said upper and lower semiconductor layers, and disposed on the remaining portion of said major surface of said body and contiguous with the laser active layer at the side surfaces thereof but not the top surface of said mesa-shaped multi-layered semiconductor crystal; and first and second metal layers disposed on said semiconductor body and said upper semiconductor layer, respectively.

Claim 14

A semiconductor device according to claim 11, wherein the thickness of said side semiconductor layer exceeds the thickness of said upper semiconductor layer by the sum of the thicknesses of said laser active layer and said lower semiconductor layer.

Claim 15

A semiconductor device according to claim 11, wherein the area A of a section of said laser active layer, perpendicular to the direction in which light generated in said laser active layer is propagated therein, is less than 1 μm 2 .

Claim 16

A semiconductor device according to claim 11, further comprising a semiconductor region of a second conductivity type, having a higher impurity concentration than that of said upper semiconductor layer, formed in the surface region of said upper semiconductor layer, and wherein said second metal layer is in contact with said semiconductor region.