Test cell holder

Claim 1

A test assembly for light detecting wafer test cell with circumferential electrodes comprising: an optical bench means having an optical axis; a standard cathode ray oscilloscope with scanned dot light source mounted on said bench means substantially centered on said optical axis; a holding jig mounted on said bench means defining a passageway of a first uniform cross-section extending therethrough normal to said optical axis and also defining an aperture of a second smaller uniform cross-section substantially centered on said axis extending from the jig surface nearest said source into said passageway; and a holder for said test cell slideably mounted in said passageway, said holder including, a frame member with parallel sides, an outer cross-section normal thereto substantially equal to the cross-section of said passageway and a socket defined therein larger than and facing said aperture, said socket having the same shape but dimensions slightly greater than said test cell, a pair of electrical terminals mounted on an external surface of said frame insulated from one another; and fastening means attached to said frame member to secure said test cell in a fixed position within said socket and electrically attach each of said electrodes to a different one of said terminals.