Patent US4097160A successfully refreshed from Google Patents.
← Back to Patent Explorer
US4097160A Expired / Lapsed US ⏱️ 0.0 years remaining

Method for inspecting object defection by light beam

Assignee: Canon Inc
•
Filing: 1977-04-04
•
Granted: 1978-06-27
•
Expires: 1997-04-04
📄 Original PDF 🌐 Google Patents 🔄 Sync Now

Abstract

Abstract A narrow beam from a laser source-like light beam is projected on an object, the light scattered from the projected spot of the object is detected by light detecters at a plural number of the detecting positions. The distribution of the scattered light is detected by comparing the values of the densities of the scattered lights at the plural number of the detecting positions among each other in such a manner that it is determined from the distribution of the scattered light whether there is a defect on the projected spot or not.

Inventors

  • 👤 Masamichi Yataki
  • 👤 Hideyo Takahata
  • 👤 Norio Simomura

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 19:33
CPC Classifications
G; G01; G01N; G01N21/00; G01N21/17; G01N21/47; G01N21/4738

Claims Analysis

Total Claims: 2
Claim 1
Independent Claim 102 words
A method for inspecting a defect of an object comprising the steps of: projecting a narrow beam to the object, whereby a scattered light beam takes place from the spot on the object projected with the beam; scanning this scattered light beam for inspection along a certain predetermined circular line to obtain a serial DC output signal when a defect does not exist at the scanned spot and to obtain a serial AC output signal when a defect exists at the scanned spot; and detecting whether there exists a defect or not by determining whether the output signal is DC or AC.
Claim 2
Independent Claim 102 words
A method for inspecting a defect of an object comprising the steps of: projecting a narrow beam to the object, whereby a scattered light beam takes place from the spot on the object projected with the beam; scanning this scattered light beam for inspection along a certain predetermined circular line to obtain a serial DC output signal when a defect does not exist at the scanned spot and to obtain a serial AC output signal when a defect exists at the scanned spot; and detecting whether there exists a defect or not by determining whether the output signal is DC or AC.

References Cited (Backward Citations)

US3280692A Cited
US3834822A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1981-06-26 1981-12-26 1982-06-27 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1985-06-26 1985-12-26 1986-06-27 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1989-06-26 1989-12-26 1990-06-27 $7700.00 Window Closed / Lapsed

Assigned Categories & Tags

No categories assigned to this patent yet.

Assign Category Tag