US4084175A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Double implanted planar mos device with v-groove and process of manufacture thereof
Assignee: UNIVERSAL SEMICONDUCTOR Inc A CORPOF CA
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Filing: 1976-09-30
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Granted: 1978-04-11
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Expires: 1996-09-30
Abstract
Abstract An MOS transistor has a short vertical channel extending along the thickness of the transistor wafer and along the wall of a V-shaped groove, and has laterally disposed source, drain and gate electrodes on the same surface of the wafer. The channel is formed by a double ion implantation, or double diffusion operation. The source and drain electrodes are disposed on the same surface of the wafer and on opposite sides of the V-groove. The transistor has the speed capability of a bipolar transistor and high device density of a silicon gate MOS device, and has a shorter channel length (less than 1 micron) and higher punch-through voltage than has been previously available in a planar-MOS device.
Inventors
- 👤 Paul Hsiung Ouyang
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-23 13:41
CPC Classifications
H; H10; H10D; H10D62/00; H10D62/10; H10D62/17; H10D62/213; H10D62/221; H10D62/235; H10D62/299; H10D62/307; H10D30/00; H10D30/60; H10D64/00; H10D64/01; H10D64/025; H10D64/027; H10D64/20; H10D64/27; H10D64/311; H10D64/411; H10D64/511; H10D64/512; H10D64/513; Y; Y10; Y10S; Y10S148/00; Y10S148/168
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
197 words
A semiconductor device, comprising: a semiconductor wafer containing a first concentration of impurities of a first conductive type; first and second spaced regions adjacent one surface of said semiconductor wafer, each of said first and second spaced regions containing a concentration of impurities of a second conductive type; a V-groove extending from said one surface of said semiconductor wafer intermediate said first and second spaced regions, each of said first and second spaced regions terminating at an opposite surface of said V-groove; first and second substantially co-planar electrode means connected to said first and second spaced regions respectively, and third electrode means disposed within said V-groove; each of said first, second and third electrode means being insulated from one another; a third region underlying and adjacent to a portion of said first spaced regions and terminating on one side of said V-groove and extending for only a portion of the depth of said V-groove, said third region containing a higher concentration of impurities of said first conductive type than said first concentration, the side of said V-groove opposite to said one side having impurities of said first conductivity type at said first concentration along its full depth.
Claim 2
Dependent Claim
197 words
A semiconductor device, comprising: a semiconductor wafer containing a first concentration of impurities of a first conductive type; first and second spaced regions adjacent one surface of said semiconductor wafer, each of said first and second spaced regions containing a concentration of impurities of a second conductive type; a V-groove extending from said one surface of said semiconductor wafer intermediate said first and second spaced regions, each of said first and second spaced regions terminating at an opposite surface of said V-groove; first and second substantially co-planar electrode means connected to said first and second spaced regions respectively, and third electrode means disposed within said V-groove; each of said first, second and third electrode means being insulated from one another; a third region underlying and adjacent to a portion of said first spaced regions and terminating on one side of said V-groove and extending for only a portion of the depth of said V-groove, said third region containing a higher concentration of impurities of said first conductive type than said first concentration, the side of said V-groove opposite to said one side having impurities of said first conductivity type at said first concentration along its full depth.
Claim 3
Dependent Claim
38 words
A semiconductor device in accordance with claim 1, including a thin gate oxide on said V-groove; said third electrode means being deposited atop said thin gate oxide and insulated from said semiconductor wafer by said thin gate oxide.
Claim 4
Dependent Claim
24 words
A semiconductor device in accordance with claim 1, wherein the surfaces of said V-groove are both oriented on (1,1,1) planes of said semiconductor wafer.
Claim 5
Dependent Claim
16 words
A semiconductor device in accordance with claim 1, wherein said V-groove is formed by anisotropic etching.
Claim 6
Dependent Claim
30 words
A semiconductor wafer as claimed in claim 1, wherein said semiconductor wafer has (1,0,0) crystal orientation and wherein said V-groove is formed by anisotropic etching to form (1,1,1) oriented surfaces.
Claim 7
Dependent Claim
21 words
A semiconductor device in accordance with claim 1, wherein the vertical length of said third region is 0.15 - 1 μm.
Claim 8
Dependent Claim
133 words
A VD-MOS lateral transistor, comprising: a semiconductor wafer containing a first concentration of P-type impurities; source and drain regions adjacent one surface of said semiconductor wafer, each of said source and drain regions containing a concentration of N-type impurities; a V-groove extending from said one surface of said semiconductor wafer intermediate said source and drain regions, each of said source and drain regions terminating on a different (1,1,1) oriented surface of said V-groove; a single channel region underlying and adjacent to a portion of said source region and terminating on the same surface of said V-groove as said source region, said single channel region containing a higher concenration of P-type impurities than said first concentration, the surface of said V-groove extending from said drain region having said first concentration along its full length.
Claim 9
Dependent Claim
133 words
A VD-MOS lateral transistor, comprising: a semiconductor wafer containing a first concentration of P-type impurities; source and drain regions adjacent one surface of said semiconductor wafer, each of said source and drain regions containing a concentration of N-type impurities; a V-groove extending from said one surface of said semiconductor wafer intermediate said source and drain regions, each of said source and drain regions terminating on a different (1,1,1) oriented surface of said V-groove; a single channel region underlying and adjacent to a portion of said source region and terminating on the same surface of said V-groove as said source region, said single channel region containing a higher concenration of P-type impurities than said first concentration, the surface of said V-groove extending from said drain region having said first concentration along its full length.
Claim 10
Dependent Claim
16 words
A semiconductor device in accordance with claim 7, including a thin gate oxide on said V-groove.
Claim 11
Dependent Claim
21 words
A semiconductor device in accordance with claim 8, including a gate insulated from said semiconductor wafer by said thin gate oxide.
Claim 12
Dependent Claim
20 words
A semiconductor device in accordance with claim 7, wherein the vertical height of said channel is 0.15 - 1 μm.
Claim 13
Dependent Claim
16 words
A semiconductor device in accordance with claim 7 wherein said V-groove is formed by anisotropic etching.
References Cited (Backward Citations)
US3975752A
Cited
DE2441432A1
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1981-04-10 | 1981-10-10 | 1982-04-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1985-04-10 | 1985-10-10 | 1986-04-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1989-04-10 | 1989-10-10 | 1990-04-11 | $7700.00 | Window Closed / Lapsed |