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US4074139A Expired / Lapsed US ⏱️ 0.0 years remaining

Apparatus and method for maskless ion implantation

Assignee: RCA Corp
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Filing: 1976-12-27
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Granted: 1978-02-14
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Expires: 1996-12-27
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Abstract

Abstract A method and apparatus for implanting dopant material into a substrate of semiconductive material in a preselected pattern without utilizing a mask comprises the use of a source template which is formed of the desired dopant material in the configuration of the pattern to be implanted. Ions of the dopant material are sputtered from the template by bombardment with an ionized gas, and these dopant ions are then filtered from unwanted ion species and accelerated into the substrate while remaining in the original template pattern.

Inventors

  • 👤 Jacques I. Pankove

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-27 17:37
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/26; H01J49/28; H01J49/284; H01J49/286; H01J37/00; H01J37/30; H01J37/317; H01J37/3171; H01J37/3172

Claims Analysis

Total Claims: 9
Claim 1
Independent Claim 96 words
A method of implanting a dopant material into a substrate of semiconductive material in a preselected pattern without utilizing a mask, said method comprising the steps of: forming a source template having at least one dopant material formed thereon in said preselected pattern; sputtering ions of said dopant material from said template by ion bombardment from a primary ion source; filtering said ions of said dopant material from ions of other materials by means of an ionic filter; and implanting said ions of said dopant material into said substrate in the pattern of said source template.
Claim 2
Independent Claim 96 words
A method of implanting a dopant material into a substrate of semiconductive material in a preselected pattern without utilizing a mask, said method comprising the steps of: forming a source template having at least one dopant material formed thereon in said preselected pattern; sputtering ions of said dopant material from said template by ion bombardment from a primary ion source; filtering said ions of said dopant material from ions of other materials by means of an ionic filter; and implanting said ions of said dopant material into said substrate in the pattern of said source template.
Claim 3
Dependent Claim 22 words
The method of claim 1, wherein said filtering step is performed by utilizing a magnetic prism in combination with an electrostatic mirror.
Claim 4
Dependent Claim 16 words
The method of claim 1, wherein said implanting step comprises the step of accelerating said ions.
Claim 5
Independent Claim 84 words
An apparatus for implanting a dopant material into a substrate of semiconductive material in a preselected pattern without utilizing a mask, said apparatus comprising: a source template having at least one dopant material formed thereon in said preselected pattern; a means for sputtering ions of said dopant material from said template by ion bombardment from a primary ion source, an ionic filter capable of selecting desired dopant ions from ions of other materials; and means for implanting said desired dopant ions into said substrate.
Claim 6
Independent Claim 84 words
An apparatus for implanting a dopant material into a substrate of semiconductive material in a preselected pattern without utilizing a mask, said apparatus comprising: a source template having at least one dopant material formed thereon in said preselected pattern; a means for sputtering ions of said dopant material from said template by ion bombardment from a primary ion source, an ionic filter capable of selecting desired dopant ions from ions of other materials; and means for implanting said desired dopant ions into said substrate.
Claim 7
Dependent Claim 20 words
The apparatus of claim 4, wherein said ionic filter comprises the combination of a magnetic prism and an electrostatic mirror.
Claim 8
Dependent Claim 37 words
The apparatus of claim 4 wherein said primary ion source is directed toward template, said primary ions having sufficient energy to induce ions of said dopant material to be sputtered from said template by secondary ion emission.
Claim 9
Dependent Claim 21 words
The apparatus of claim 4, wherein said means for implanting comprises an electric field by which said dopant ions are accelerated.

References Cited (Backward Citations)

US3500042A Cited
US3866042A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1981-02-13 1981-08-15 1982-02-14 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1985-02-13 1985-08-15 1986-02-14 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1989-02-13 1989-08-15 1990-02-14 $7700.00 Window Closed / Lapsed

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