Scanning mass spectrometer having constant magnetic field

Claim 2

A mass spectrometer comprising an ion source for producing and ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means being provided between said ion source of said magnetic field so that as said ion beam is deflected, the point or angle of incidence on said first end face at which said ion beam enters said magnetic field is changed so as to change the radius of curvature of the trajectory of the ion that enters said ion detecting means.

Claim 3

The mass spectrometer of claim 1, wherein said ion beam deflecting means comprises a pair of electrostatic deflectors arranged in the direction of said ion beam and designed to deflect said ion beam to the same angle but in opposite directions.

Claim 4

The mass spectrometer of claim 1, wherein said ion beam deflecting means comprises a pair of coreless coils arranged in the direction of said ion beam and designed to deflect said ion beam to the same angle but in opposite directions.

Claim 5

The mass spectrometer of claim 1, further including between said magnetic field and said ion detecting means an electrostatic field which cooperates with said magnetic field to satisfy the energy and direction focusing condition for improvement of resolution.

Claim 6

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means comprising an electrostatic deflector disposed within said magnetic field so that as the electrostatic field strength of said deflector is changed, the radius of curvature of the trajectory of the ion that enters said ion detecting means is changed.

Claim 7

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means comprising an electrostatic deflector disposed within said magnetic field so that as the electrostatic field strength of said deflector is changed, the radius of curvature of the trajectory of the ion that enters said ion detecting means is changed.

Claim 8

The mass spectrometer of claim 5, wherein said electrostatic deflector comprises an opposed pair of electrode plates composed of parts of concentric hollow cylinders the center of which coincides with that of the circle of the ion trajectory in said magnetic field and means for impressing a variable voltage across said pair of electrodes.

Claim 9

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means being arranged between said magnetic field and said ion detecting means so that as said ion beam is deflected, the radius of curvature of the trajectory of the ion that enters said ion detecting means changes.

Claim 10

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means being arranged between said magnetic field and said ion detecting means so that as said ion beam is deflected, the radius of curvature of the trajectory of the ion that enters said ion detecting means changes.

Claim 11

The mass spectrometer of claim 7, wherein said ion beam deflecting means comprises a pair of electrostatic deflectors arranged in the direction of said ion beam designed to deflect said ion beam to the same angle but in opposite directions.

Claim 12

The mass spectrometer of claim 7, wherein said ion beam deflecting means comprises a pair of coreless coils arranged in the direction of said ion beam and designed to deflect said ion beam to the same angle but in opposite directions.

Claim 13

The mass spectrometer of claim 7, further including between said ion source and said magnetic field an electrostatic field which cooperates with said magnetic field to satisfy the energy and direction focusing condition for improvement of resolution.

Claim 14

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means comprising a first electrostatic deflector arranged between said ion source and said first end face of said magnetic field to deflect said ion beam, a second electrostatic deflector arranged between said second end face of said magnetic field and said ion detecting means and means for operating said first and second electrostatic deflectors in ganged relation to each other.

Claim 15

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said ion beam deflecting means comprising a first electrostatic deflector arranged between said ion source and said first end face of said magnetic field to deflect said ion beam, a second electrostatic deflector arranged between said second end face of said magnetic field and said ion detecting means and means for operating said first and second electrostatic deflectors in ganged relation to each other.

Claim 16

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample; and an electrostatic lens arranged between said ion source and said first end face of said magnetic field to converge said ion beam from said ion source.

Claim 17

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample; and an electrostatic lens arranged between said ion source and said first end face of said magnetic field to converge said ion beam from said ion source.

Claim 18

The mass spectrometer of claim 12, further including another electrostatic lens arranged between said second end face of said magnetic field and said ion detecting means to converge said ion beam to be detected by said ion detecting means.

Claim 19

A mass spectrometer comprising an ion source for producing an ion beam of a sample; and analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample; and an electrostatic lens arranged between said second end face of said magnetic field and said ion detecting means to converge said ion beam to be detected by said ion detecting means.

Claim 20

A mass spectrometer comprising an ion source for producing an ion beam of a sample; and analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample; and an electrostatic lens arranged between said second end face of said magnetic field and said ion detecting means to converge said ion beam to be detected by said ion detecting means.

Claim 21

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said magnetic field being so arranged that an ion of a predetermined mass number included in said ion beam emerges from said second end face of said magnetic field to advance at a small angle with said second end face while the ions of smaller mass numbers included in said ion beam do not emerge from said second end face, and said detecting means is so arranged as to detect said ion of said predetermined mass number.

Claim 22

A mass spectrometer comprising an ion source for producing an ion beam of a sample; an analyzer including a constant magnetic field having at least a first end face at which said ion beam enters said magnetic field and a second end face at which said ion beam emerges out of said magnetic field; means for detecting ions; and means for deflecting said ion beam for scanning of the mass spectrum or selection of predetermined mass numbers of said sample, said magnetic field being so arranged that an ion of a predetermined mass number included in said ion beam emerges from said second end face of said magnetic field to advance at a small angle with said second end face while the ions of smaller mass numbers included in said ion beam do not emerge from said second end face, and said detecting means is so arranged as to detect said ion of said predetermined mass number.

Claim 23

The mass spectrometer of claim 15, wherein said ion beam deflecting means comprises a pair of electrostatic deflectors arranged in the direction of said ion beam and so designed as to deflect said ion beam to the same angle but in opposite directions.

Claim 24

The mass spectrometer of claim 15, wherein said ion beam deflecting means comprises a pair of coreless coils arranged in the direction of said ion beam and so designed as to deflect said ion beam to the same angle but in opposite directions.

Claim 25

The mass spectrometer of claim 15, further including an electrostatic lens arranged between said ion source and said first end face of said magnetic field to converge said ion beam from said ion source.

Claim 26

The mass spectrometer of claim 18, further including another electrostatic lens arranged between said second end face of said magnetic field and said ion detecting means to converge said ion beam to be detected by said ion detecting means.