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US4057316A
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Reflection reducing multilayer system on a highly refractive infrared transmitting substrate
Assignee: Balzers Patent und Beteiligungs AG
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Filing: 1976-02-17
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Granted: 1977-11-08
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Expires: 1996-02-17
Abstract
Abstract A reflection reducing system on a highly refractive infrared transmitting substrate, comprises a germanium layer immediately adjacent the substrate, an adjoining layer of zinc selenide, and at least one layer of Al 2 O 3 terminating the layer system to the outside.
Inventors
- 👤 Dionys Hacman
- 👤 Adolf Keutschegger
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 05:49
CPC Classifications
G; G02; G02B; G02B13/00; G02B13/14; G02B1/00; G02B1/10; G02B1/11; G02B1/113; G02B1/115
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
29 words
A reflection reducing multilayer system on a germanium substrate, said system comprising four individual layers arranged in sequence as follows: Ge, ZnSe, Si and Al 2 O 3 .
Claim 2
Dependent Claim
29 words
A reflection reducing multilayer system on a germanium substrate, said system comprising four individual layers arranged in sequence as follows: Ge, ZnSe, Si and Al 2 O 3 .
Claim 3
Dependent Claim
16 words
A reflection reducing multilayer system according to claim 7, wherein said germanium layer is 1.5 nm.
Claim 4
Dependent Claim
16 words
A reflection reducing system according to claim 7, wherein the thickness of ZnSe is 135 nm.
Claim 5
Dependent Claim
19 words
A reflection reducing multilayer system according to claim 1, wherein the thickness of the Si layer is 119 nm.
Claim 6
Dependent Claim
22 words
A reflection reducing multilayer system according to claim 1, wherein the Al 2 O 3 layer has a thickness of 629 nm.
Claim 7
Dependent Claim
29 words
A reflection reducing multilayer system on a silicon substrate, said system comprising four successive individual layers in the following sequence: Ge, ZnSe, Ge, and Al 2 O 3 .
Claim 8
Dependent Claim
29 words
A reflection reducing multilayer system on a silicon substrate, said system comprising four successive individual layers in the following sequence: Ge, ZnSe, Ge, and Al 2 O 3 .
Claim 9
Dependent Claim
18 words
A reflection reducing multilayer system according to claim 6, wherein the Ge layers are 1.5 nm in thickness.
Claim 10
Dependent Claim
19 words
A reflection reducing multilayer system according to claim 6, wherein the ZnSe layer has a thickness of 207 nm.
Claim 11
Dependent Claim
39 words
A reflection reducing multilayer system according to claim 6, wherein the Ge layer arranged adjacent the substrate has a thickness of 1.5 nm and the Ge layer between the ZnSe and the Al 2 O 3 is 45 nm.
Claim 12
Dependent Claim
21 words
A reflection reducing layer according to claim 6, wherein the Al 2 O 3 layer has a thickness of 639 nm.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-11-07 | 1981-05-09 | 1981-11-08 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-11-07 | 1985-05-09 | 1985-11-08 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-11-07 | 1989-05-09 | 1989-11-08 | $7700.00 | Window Closed / Lapsed |