US4053334A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method for independent control of volatile dopants in liquid phase epitaxy
Assignee: General Electric Co
•
Filing: 1976-07-21
•
Granted: 1977-10-11
•
Expires: 1996-07-21
Abstract
Abstract A method for independent control of a plurality of volatile dopants in liquid phase epitaxial fabrication of doped layers of semiconductors upon a semiconductor substrate, utilizes spatially separated sources of each dopant, each source being independently temperature controlled. One dopant source is located in a melt of a carrier metal and of the elements required to form the desired semiconductor material and has the saturation concentration thereof determined by the temperature of the melt, while the remaining dopant is vaporized to create a partial pressure thereof over the melt, with control of the source temperature controlling partial pressure and therefore concentration, which is less than or equal to the solubility of the remaining dopant at the melt temperature, in the melt.
Inventors
- 👤 Roger S. Ehle
- 👤 Walter Garwacki
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 21:31
CPC Classifications
C; C30; C30B; C30B19/00; C30B19/06; C30B19/062; C30B19/10; C30B19/106; H; H10; H10P; H10P14/00; H10P14/20; H10P14/26; H10P14/263; H10P14/265; H10P14/29; H10P14/2901; H10P14/2907; H10P14/2909; H10P14/32; H10P14/3202; H10P14/3214; H10P14/3218; H10P14/34; H10P14/3402; H10P14/3414; H10P14/3418; H10P14/3438; H10P14/3441; H10P14/3442; H10P14/3444; H10P14/3446; Y; Y10; Y10S; Y10S438/00; Y10S438/914; Y10S438/925
Claims Analysis
Total Claims: 14
Claim 1
Independent Claim
213 words
A method for the independent control of the concentration of each of a plurality of volatile dopants in a doped layer of a semiconductor material fabricated by liquid phase epitaxy upon a semiconductor substrate, comprising the steps of: a. providing a substantially vapor-tight volume; b. providing a first quantity of at least one element of the semiconductor material within said volume; c. heating said first quantity to a selected temperature sufficient to melt said first quantity; d. saturating the molten first quantity with a desired quantity of a first volatile dopant; e. immersing said substrate in said molten first quantity; f. providing a source of a second volatile dopant at a position below and spatially removed from said molten first quantity; g. independently heating said source of said second volatile dopant to cause a vapor thereof to rise without use of a carrier gas and be present at a selected partial pressure above a surface of said molten first quantity to achieve a desired concentration of said second volatile dopant within said molten first quantity at the selected temperature thereof; and h. cooling said molten first quantity containing said substrate and said first and second volatile dopants in their respective concentrations, to fabricate a doped layer of said semiconductor material upon said substrate.
Claim 2
Independent Claim
213 words
A method for the independent control of the concentration of each of a plurality of volatile dopants in a doped layer of a semiconductor material fabricated by liquid phase epitaxy upon a semiconductor substrate, comprising the steps of: a. providing a substantially vapor-tight volume; b. providing a first quantity of at least one element of the semiconductor material within said volume; c. heating said first quantity to a selected temperature sufficient to melt said first quantity; d. saturating the molten first quantity with a desired quantity of a first volatile dopant; e. immersing said substrate in said molten first quantity; f. providing a source of a second volatile dopant at a position below and spatially removed from said molten first quantity; g. independently heating said source of said second volatile dopant to cause a vapor thereof to rise without use of a carrier gas and be present at a selected partial pressure above a surface of said molten first quantity to achieve a desired concentration of said second volatile dopant within said molten first quantity at the selected temperature thereof; and h. cooling said molten first quantity containing said substrate and said first and second volatile dopants in their respective concentrations, to fabricate a doped layer of said semiconductor material upon said substrate.
Claim 3
Dependent Claim
75 words
A method as set forth in claim 1, wherein step (d) comprises the steps of: introducing a quantity of a compound of at least one element of the semiconductor material and of the first volatile dopant into the molten first quantity, said compound being present in a quantity sufficient to saturate the molten first quantity; and controlling the temperature of said molten first quantity to achieve a selected concentration of said first volatile dopant therein.
Claim 4
Dependent Claim
17 words
A method as set forth in claim 2, wherein one element of said semiconductor material is gallium.
Claim 5
Dependent Claim
15 words
A method as set forth in claim 3, wherein said semi-conductor material is gallium phosphide.
Claim 6
Dependent Claim
15 words
A method as set forth in claim 3, wherein said first volatile dopant is oxygen.
Claim 7
Dependent Claim
19 words
A method as set forth in claim 5, wherein said compound is gallium oxide (Ga 2 O 3 ).
Claim 8
Dependent Claim
63 words
A method as set forth in claim 1, further comprising the steps of adjusting the temperature of said source of said second volatile dopant to establish the concentration of said second volatile dopant in said molten first quantity at a selected level between essentially zero and the saturation solubility of said second volatile dopant at said selected temperature in said molten first quantity.
Claim 9
Dependent Claim
15 words
A method as set forth in claim 7, wherein said second volatile dopant is zinc.
Claim 10
Dependent Claim
15 words
A method as set forth in claim 8, wherein said semiconductor material is gallium phosphide.
Claim 11
Dependent Claim
15 words
A method as set forth in claim 9, wherein said first volatile dopant is oxygen.
Claim 12
Dependent Claim
19 words
A method as set forth in claim 10, wherein said compound is gallium oxide (Ga 2 O 3 ).
Claim 13
Dependent Claim
148 words
A method as set forth in claim 1, further comprising the steps of: providing a quantity of each of at least one other material each containing another volatile dopant differing from said first and second volatile dopants; locating the quantity of each of said at least one other material below and spatially separated from both said quantity of material containing said second volatile dopant and from said molten first quantity; heating the quantity of each of said at least one other material to vaporize the volatile dopant thereof into said volume without use of a carrier gas; and independently controlling the temperature of the quantity of each of said at least one other material to regulate the partial vapor pressure therefrom upon a surface of, and the concentration within, said molten first quantity to independently control the concentration of each additional volatile dopant within said epitaxially fabricated layer.
Claim 14
Dependent Claim
18 words
A method as set forth in claim 1, wherein said substrate has a previously fabricated epitaxial layer thereon.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-10-10 | 1981-04-11 | 1981-10-11 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-10-10 | 1985-04-11 | 1985-10-11 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-10-10 | 1989-04-11 | 1989-10-11 | $7700.00 | Window Closed / Lapsed |