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US4049477A
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Method for fabricating a self-aligned metal oxide field effect transistor
Assignee: HP Inc
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Filing: 1976-03-02
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Granted: 1977-09-20
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Expires: 1996-03-02
Abstract
Abstract An improved and simplified method of fabricating field effect transistors in metal oxide semiconductor integrated circuits advantageously employs the differential growth rate, under certain temperature conditions, between oxide on silicon wherein phosphorous has been diffused, and on silicon without such diffusion. The improved method of fabrication reduces the number of fabrication steps required, while simultaneously producing field effect transistors with superior operation speeds.
Inventors
- 👤 Thomas R. Ligon
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-28 09:30
CPC Classifications
H; H10; H10D; H10D30/00; H10D30/01; H10D30/021; H10D30/027; H10P; H10P14/00; H10P14/60; H10P14/63; H10P14/6302; H10P14/6304; H10P14/6306; H10P14/6308; H10P14/6309; H10P14/6322; H10P14/65; H10P14/6502; Y; Y10; Y10S; Y10S438/00; Y10S438/981
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
110 words
A method for fabricating a metal oxide semiconductor field effect transistor, the method comprising: diffusing a phosphorous dopant into both a drain region and a source region of a silicon semiconductor substrate to produce a selected concentration of phosphorous in the drain and source regions; exposing a channel region of the silicon semiconductor substrate and simultaneously exposing the drain and source regions to an oxidizing medium at a temperature less than 1000° C. to form an oxide layer over the channel region; forming a gate electrode contacting the oxide layer over said channel region; and forming openings through the oxide layer to attach electrodes to the drain and source regions.
Claim 2
Independent Claim
110 words
A method for fabricating a metal oxide semiconductor field effect transistor, the method comprising: diffusing a phosphorous dopant into both a drain region and a source region of a silicon semiconductor substrate to produce a selected concentration of phosphorous in the drain and source regions; exposing a channel region of the silicon semiconductor substrate and simultaneously exposing the drain and source regions to an oxidizing medium at a temperature less than 1000° C. to form an oxide layer over the channel region; forming a gate electrode contacting the oxide layer over said channel region; and forming openings through the oxide layer to attach electrodes to the drain and source regions.
Claim 3
Dependent Claim
20 words
A method as in claim 1 wherein said exposing step is performed at a temperature between 600° and 900° C.
Claim 4
Dependent Claim
20 words
A method as in claim 1 wherein said exposing step is performed at a temperature between 825° and 875° C.
Claim 5
Dependent Claim
26 words
A method as in claim 1 wherein the selected concentration of phosphorous is between 3 × 10 18 and 3 × 10 20 atoms/cm 3 .
Claim 6
Dependent Claim
146 words
A process for fabricating a metal oxide field effect transistor comprising the steps, performed in sequence, of: depositing a diffusion barrier on the surface of a silicon semiconductor substrate; forming openings in the diffusion barrier to expose the silicon semiconductor substrate over source and drain regions; diffusing a phosphorous dopant into both the drain region and the source region of the silicon semiconductor substrate to produce a selected concentration of phosphorous in the drain and source regions; removing the diffusion barrier from the silicon semiconductor substrate over a channel region between the source and drain regions; exposing the channel region, and simultaneously exposing the drain region and the source region to an oxidizing medium at a temperature less than 1000° C. to form an oxide layer over the channel region; and forming openings through the oxide layer to attach electrodes to the drain and source regions.
Claim 7
Dependent Claim
146 words
A process for fabricating a metal oxide field effect transistor comprising the steps, performed in sequence, of: depositing a diffusion barrier on the surface of a silicon semiconductor substrate; forming openings in the diffusion barrier to expose the silicon semiconductor substrate over source and drain regions; diffusing a phosphorous dopant into both the drain region and the source region of the silicon semiconductor substrate to produce a selected concentration of phosphorous in the drain and source regions; removing the diffusion barrier from the silicon semiconductor substrate over a channel region between the source and drain regions; exposing the channel region, and simultaneously exposing the drain region and the source region to an oxidizing medium at a temperature less than 1000° C. to form an oxide layer over the channel region; and forming openings through the oxide layer to attach electrodes to the drain and source regions.
Claim 8
Dependent Claim
20 words
A process as in claim 5 wherein said exposing step is performed at a temperature between 600° and 900° C.
Claim 9
Dependent Claim
20 words
A process as in claim 5 wherein said exposing step is performed at a temperature between 825° and 875° C.
Claim 10
Dependent Claim
26 words
A process as in claim 5 wherein the selected concentration of phosphorous is between 3 × 10 18 and 3 × 10 20 atoms/cm 3 .
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-09-19 | 1981-03-21 | 1981-09-20 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-09-19 | 1985-03-21 | 1985-09-20 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-09-19 | 1989-03-21 | 1989-09-20 | $7700.00 | Window Closed / Lapsed |