US4046580A
Expired / Lapsed
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Silicon nitride-based sintered material and method for manufacturing the same
Assignee: Toshiba Corp
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Filing: 1975-06-25
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Granted: 1977-09-06
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Expires: 1995-06-25
Abstract
Abstract Disclosed is a silicon nitride-based sintered material having high heat resistance and containing crystal compounds prepared from the silicon nitride and at least one of oxides of the elements belonging to the III A group in the periodic table.
Inventors
- 👤 Takashi Ishii
- 👤 Katsutoshi Nishida
- 👤 Michiyasu Komatsu
- 👤 Akihiko Tsuge
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-05 04:16
CPC Classifications
C; C04; C04B; C04B35/00; C04B35/515; C04B35/58; C04B35/584; C04B35/593; F; F01; F01D; F01D25/00; F01D25/005; Y; Y02; Y02T; Y02T50/00; Y02T50/60
Claims Analysis
Total Claims: 12
Claim 1
Independent Claim
47 words
A silicon nitride-based sintered material containing silicon yttrium oxynitride crystal compounds prepared from silicon nitride and yttrium oxide, wherein the amount of yttrium present in said crystal compounds is 50 wt% or more based on the total amount of yttrium contained in said silicon nitride-based sintered material.
Claim 2
Dependent Claim
47 words
A silicon nitride-based sintered material containing silicon yttrium oxynitride crystal compounds prepared from silicon nitride and yttrium oxide, wherein the amount of yttrium present in said crystal compounds is 50 wt% or more based on the total amount of yttrium contained in said silicon nitride-based sintered material.
Claim 3
Dependent Claim
33 words
A silicon nitride-based sintered material containing a silicon yttrium oxynitride crystal compound prepared from silicon nitride and yttrium oxide, wherein said crystal compound is Si 3 N 4 .Y 2 O 3 .
Claim 4
Dependent Claim
33 words
A silicon nitride-based sintered material containing a silicon yttrium oxynitride crystal compound prepared from silicon nitride and yttrium oxide, wherein said crystal compound is Si 3 N 4 .Y 2 O 3 .
Claim 5
Dependent Claim
62 words
A silicon nitride-based sintered material according to claim 2, characterized in that, in a powder X-ray diffraction of said silicon nitride-based sintered material, the ratio of the highest X-ray diffraction intensity value of the Si 3 N 4 .Y 2 O 3 to the highest X-ray diffraction intensity value of β-Si 3 N 4 is in the range of 0.02 to 2.00.
Claim 6
Dependent Claim
80 words
A silicon nitride-based sintered material according to claim 1, characterized in that it contains Si 3 N 4 .Y 2 O 3 as one of said crystal compounds prepared from silicon nitride and yttrium oxide; and in its powder X-ray diffraction the ratio of the highest X-ray diffraction intensity value of the Si 3 N 4 .Y 2 O 3 to the highest X-ray diffraction intensity value of β-Si 3 N 4 is in the range of 0.02 to 2.00.
Claim 7
Dependent Claim
38 words
A sintered material consisting essentially of silicon nitride, yttrium oxide and silicon yttrium oxynitride crystalline compounds, wherein at least 50% of the total yttrium content in the sintered material is present in said crystalline silicon yttrium oxynitride compound.
Claim 8
Dependent Claim
38 words
A sintered material consisting essentially of silicon nitride, yttrium oxide and silicon yttrium oxynitride crystalline compounds, wherein at least 50% of the total yttrium content in the sintered material is present in said crystalline silicon yttrium oxynitride compound.
Claim 9
Dependent Claim
36 words
The sintered material of claim 5, which has been prepared by heat treating a mixture of silicon nitride and yttrium oxide in the presence of aluminum nitride at a temperature of from 1650° to 1800° C.
Claim 10
Dependent Claim
28 words
The sintered material of claim 5, wherein at least 70% of the total yttrium content of the sintered material is present in the crystalline silicon yttrium oxynitride compound.
Claim 11
Dependent Claim
25 words
The sintered material of claim 5, wherein the silicon yttrium oxynitride compound has the formula Si 3 N 4 . Y 2 O 3 .
Claim 12
Dependent Claim
51 words
The sintered material of claim 5, characterized by the ratio of the highest X-ray diffraction intensity value of the Si 3 N 4 . Y 2 O 3 to the highest X-ray diffraction intensity value of β-Si 3 N 4 of from 0.02 to 2.00, as determined by powder X-ray diffraction.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-09-05 | 1981-03-07 | 1981-09-06 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-09-05 | 1985-03-07 | 1985-09-06 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-09-05 | 1989-03-07 | 1989-09-06 | $7700.00 | Window Closed / Lapsed |