Patent US4037100A successfully refreshed from Google Patents.
US4037100A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Ultra-sensitive spectrometer for making mass and elemental analyses
Assignee: Sanwa Business Credit Corp
•
Filing: 1976-03-01
•
Granted: 1977-07-19
•
Expires: 1996-03-01
Abstract
Abstract The present invention comprehends an extremely sensitive apparatus which can be used for the detection of electronegative particles and provide data as to their elemental composition. A mass spectrometer selects negative ions of the required mass coming from an ion source. These ions are then directed into a dissociator which fragments complex molecules and strips electrons from the resulting products producing positively charged ions. These positively charged ions are filtered by a series of elements which independently measure some combination of the quantities: energy/charge, energy, momentum/charge, velocity, charge. Such measurement allows the actual mass of each particle to be uniquely defined and, if necessary, over-determined for reduction of backgrounds.
Inventors
- 👤 Kenneth H. Purser
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-26 07:47
CPC Classifications
H; H01; H01J; H01J49/00; H01J49/004; H01J49/0086; G; G21; G21K; G21K1/00; G21K1/14
Claims Analysis
Total Claims: 6
Claim 1
Independent Claim
80 words
An ultra-sensitive spectrometer for mass and elemental analysis comprising in combination: a thin target, means for directing a focussed beam of charged particles of the material to be analyzed through said thin target, whereby said particles are dissociated into positively charged components, means for accelerating said components comprising a substantially constant electric field, whereby said components acquire additional kinetic energy the quantity of which depends upon their charge, and means for filtering, detecting and measuring kinematic characteristics of said components.
Claim 2
Dependent Claim
80 words
An ultra-sensitive spectrometer for mass and elemental analysis comprising in combination: a thin target, means for directing a focussed beam of charged particles of the material to be analyzed through said thin target, whereby said particles are dissociated into positively charged components, means for accelerating said components comprising a substantially constant electric field, whereby said components acquire additional kinetic energy the quantity of which depends upon their charge, and means for filtering, detecting and measuring kinematic characteristics of said components.
Claim 3
Dependent Claim
42 words
A spectrometer according to claim 1 wherein said means for directing a focussed beam comprises a source of negative ions of the material to be analyzed and means for analyzing said negative ions into a focussed beam of particles of known mass.
Claim 4
Independent Claim
84 words
A method for mass and elemental analysis comprising the following steps: forming a charged beam of moderate and known energy of particles to be analyzed, subjecting said particles to mass analysis, accelerating the analyzed particles to a high voltage terminal of known voltage, stripping electrons from at least some of the particles to form positive ions of various integral multiples of the fundamental electronic charge, accelerating said positive ions through said voltage and filtering detecting and measuring kinematic characteristics of said accelerated positive ions.
Claim 5
Independent Claim
84 words
A method for mass and elemental analysis comprising the following steps: forming a charged beam of moderate and known energy of particles to be analyzed, subjecting said particles to mass analysis, accelerating the analyzed particles to a high voltage terminal of known voltage, stripping electrons from at least some of the particles to form positive ions of various integral multiples of the fundamental electronic charge, accelerating said positive ions through said voltage and filtering detecting and measuring kinematic characteristics of said accelerated positive ions.
Claim 6
Dependent Claim
19 words
A method according to claim 3 in which at least some of said particles are dissociated into fragment particles.
References Cited (Backward Citations)
US3786359A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-07-18 | 1981-01-17 | 1981-07-19 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-07-18 | 1985-01-17 | 1985-07-19 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-07-18 | 1989-01-17 | 1989-07-19 | $7700.00 | Window Closed / Lapsed |