US4035460A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Shaped bodies and production of semiconductor material
Assignee: Siemens AG
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Filing: 1975-05-21
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Granted: 1977-07-12
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Expires: 1995-05-21
Abstract
Abstract A technique for producing one or more shaped bodies of semiconductor material using the steps of depositing a layer of the semiconductor material from the gas phase onto the outer surface of a heated, hollow carrier body, or onto the mutually remote surfaces of two carrier bodies spaced from one another, and thereafter removing the carrier body or bodies from the layer or layers so formed. Each carrier body is heated indirectly by a heater body located within said hollow carrier body, or between said spaced carrier bodies, and heated to a temperature above the deposition temperature of the semiconductor material.
Inventors
- 👤 Wolfgang Dietze
- 👤 Andreas Kasper
- 👤 Ulrich Rucha
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-06 17:28
CPC Classifications
C; C23; C23C; C23C16/00; C23C16/22; C30; C30B; C30B25/00; C30B25/02; C30B25/08
Claims Analysis
Total Claims: 5
Claim 1
Independent Claim
272 words
In a method for selectively controlling the physical characteristics of hollow members of semiconductor material, in the production of hollow members of silicon with walls of nonuniform thickness, in which a hollow carrier member, or graphite, on which the hollow member is to be formed, is heated by radiation from a heating element, of graphite, disposed in the interior of the hollow carrier member with the heating element having an external surface disposed in spaced relation with respect to the internal surface of the hollow carrier member, and the heating element in turn being heated by the passage of a direct current therethrough, the combination of the steps of (a) heating said heating element to a temperature at least 200° C. higher than the maximum depositing temperature of the semiconductor material involved, (b) so selecting the respective parameters of wall thickness of the carrier member and spacing selected opposing portions of the internal surface of the carrier member and the external surface of the heating element at different distances to correspondingly vary the temperatures of the corresponding portions of the external surface of the carrier member, to thereby selectively control the temperatures at the external surface of the carrier member and correspondingly selectively control the physical characteristics and/or configuration of the semiconductor material deposited on the external surface of the carrier member, (c) supplying gaseous semiconductor material compound, in the presence of hydrogen, to the carrier member, with decomposition and deposition on the external carrier wall taking place in dependence upon the parameter selection, and (d) removing the carrier member from the hollow member so formed by heating in an oxygen-rich atmosphere.
Claim 2
Dependent Claim
272 words
In a method for selectively controlling the physical characteristics of hollow members of semiconductor material, in the production of hollow members of silicon with walls of nonuniform thickness, in which a hollow carrier member, or graphite, on which the hollow member is to be formed, is heated by radiation from a heating element, of graphite, disposed in the interior of the hollow carrier member with the heating element having an external surface disposed in spaced relation with respect to the internal surface of the hollow carrier member, and the heating element in turn being heated by the passage of a direct current therethrough, the combination of the steps of (a) heating said heating element to a temperature at least 200° C. higher than the maximum depositing temperature of the semiconductor material involved, (b) so selecting the respective parameters of wall thickness of the carrier member and spacing selected opposing portions of the internal surface of the carrier member and the external surface of the heating element at different distances to correspondingly vary the temperatures of the corresponding portions of the external surface of the carrier member, to thereby selectively control the temperatures at the external surface of the carrier member and correspondingly selectively control the physical characteristics and/or configuration of the semiconductor material deposited on the external surface of the carrier member, (c) supplying gaseous semiconductor material compound, in the presence of hydrogen, to the carrier member, with decomposition and deposition on the external carrier wall taking place in dependence upon the parameter selection, and (d) removing the carrier member from the hollow member so formed by heating in an oxygen-rich atmosphere.
Claim 3
Dependent Claim
262 words
In a method for selectively controlling the physical characteristics of hollow members of semiconductor material, in the production of hollow members of silicon with walls of nonuniform thickness, in which a hollow carrier member, of graphite, on which the hollow member is to be formed, is heated by radiation from a heating element, of graphite, disposed in the interior of the hollow carrier member, with the heating element having an external surface disposed in spaced relation with respect to the internal surface of the hollow carrier member, and the heating element in turn being heated by the passage of a direct current therethrough, the combination of the steps of (a) heating said heating element to a temperature at least 200° C. higher than the maximum depositing temperature of the semiconductor material involved, (b) so selecting the respective parameters of wall thickness of the carrier member, whereby the wall thickness of a selected portion thereof is of greater thickness than another thereof, and the spacing between opposing wall surfaces of the heating element and the carrier member, to thereby selectively control the temperatures at the external surface of the carrier member and correspondingly selectively control the physical characteristics and configuration of the semiconductor material deposited on the external surface of the carrier member, (c) supplying gaseous semiconductor material compound, in the presence of hydrogen, to the carrier member, with decomposition and deposition on the external carrier wall taking place in dependence upon the parameter selection, and (d) removing the carrier member from the hollow member so formed by heating in an oxygen-rich atmosphere.
Claim 4
Dependent Claim
262 words
In a method for selectively controlling the physical characteristics of hollow members of semiconductor material, in the production of hollow members of silicon with walls of nonuniform thickness, in which a hollow carrier member, of graphite, on which the hollow member is to be formed, is heated by radiation from a heating element, of graphite, disposed in the interior of the hollow carrier member, with the heating element having an external surface disposed in spaced relation with respect to the internal surface of the hollow carrier member, and the heating element in turn being heated by the passage of a direct current therethrough, the combination of the steps of (a) heating said heating element to a temperature at least 200° C. higher than the maximum depositing temperature of the semiconductor material involved, (b) so selecting the respective parameters of wall thickness of the carrier member, whereby the wall thickness of a selected portion thereof is of greater thickness than another thereof, and the spacing between opposing wall surfaces of the heating element and the carrier member, to thereby selectively control the temperatures at the external surface of the carrier member and correspondingly selectively control the physical characteristics and configuration of the semiconductor material deposited on the external surface of the carrier member, (c) supplying gaseous semiconductor material compound, in the presence of hydrogen, to the carrier member, with decomposition and deposition on the external carrier wall taking place in dependence upon the parameter selection, and (d) removing the carrier member from the hollow member so formed by heating in an oxygen-rich atmosphere.
Claim 5
Dependent Claim
40 words
A method according to claim 2, comprising providing areas on the wall of said hollow carrier member in the form of the openings therein, i.e., wall thickness of zero, whereby the hollow member will be formed with corresponding openings therein.
References Cited (Backward Citations)
US3751539A
Cited
US3747559A
Cited
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-07-11 | 1981-01-10 | 1981-07-12 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-07-11 | 1985-01-10 | 1985-07-12 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-07-11 | 1989-01-10 | 1989-07-12 | $7700.00 | Window Closed / Lapsed |