US4023931A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Means and method for measuring levels of ionic contamination
Assignee: Kenco Alloy and Chemical Co Inc
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Filing: 1976-02-17
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Granted: 1977-05-17
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Expires: 1996-02-17
Abstract
Abstract A system and method for measuring ionic contamination of an electronic assembly includes the steps of providing a test solution of a known ionic content; placing an electronic assembly of known exposed area into a predetermined static volume of the test solution; thereafter measuring the ionic content of the test solution to provide a measurement of the ionic contamination of said assembly.
Inventors
- 👤 Edgar W. Wolfgram
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-10-31 15:06
CPC Classifications
G; G01; G01R; G01R31/00; G01R31/28; G01R31/2801; G01R31/2806; G01N; G01N27/00; G01N27/02; G01N27/04; G01N27/06
Claims Analysis
Total Claims: 13
Claim 1
Independent Claim
61 words
A method for measuring the ionic contamination of an electronic assembly including the steps of providing a test solution of a known ionic content, placing an electronic assembly of known exposed area into a predetermined static volume of the test solution, thereafter measuring the ionic content of the test solution to provide a measurement of the ionic contamination of said assembly.
Claim 2
Independent Claim
61 words
A method for measuring the ionic contamination of an electronic assembly including the steps of providing a test solution of a known ionic content, placing an electronic assembly of known exposed area into a predetermined static volume of the test solution, thereafter measuring the ionic content of the test solution to provide a measurement of the ionic contamination of said assembly.
Claim 3
Dependent Claim
44 words
The method of claim 1 further characterized in that the step of providing a test solution of a known ionic content includes the subsidiary step of cycling the test solution through an ion removal system while continuously monitoring the ionic content of the solution.
Claim 4
Dependent Claim
36 words
The method of claim 1 further characterized in that said test solution is passed successively through a reservoir, an ion removal system and a test cell in bringing the test solution to a known ionic content.
Claim 5
Dependent Claim
29 words
The method of claim 1 further characterized by and including the step of timing the period in which the electronic assembly remains in the known volume of test solution.
Claim 6
Dependent Claim
43 words
The method of claim 1 further characterized by and including the step of agitating the test solution during the step of providing such a solution of a known ionic content and during the period that the electronic assembly is within the test solution.
Claim 7
Dependent Claim
32 words
The method of claim 1 further characterized in that the ionic content of the solution is determined by measuring the resistivity of the solution between electronic sensors positioned a predetermined distance apart.
Claim 8
Independent Claim
100 words
A system for measuring the ionic contamination of an electronic assembly including a test cell formed and adapted to contain an electronic assembly, a solution reservoir and ion removal means in fluid circuit with said test cell, a pump for circulating fluid through said circuit and test cell, means for measuring the ionic contamination of solution within said cell, and control means for causing said pump to cycle fluid through said test cell, ion removal means and reservoir, said control means further including means for causing said pump to place a predetermined static volume of fluid within said test cell.
Claim 9
Independent Claim
100 words
A system for measuring the ionic contamination of an electronic assembly including a test cell formed and adapted to contain an electronic assembly, a solution reservoir and ion removal means in fluid circuit with said test cell, a pump for circulating fluid through said circuit and test cell, means for measuring the ionic contamination of solution within said cell, and control means for causing said pump to cycle fluid through said test cell, ion removal means and reservoir, said control means further including means for causing said pump to place a predetermined static volume of fluid within said test cell.
Claim 10
Dependent Claim
29 words
The system of claim 7 further characterized in that said measuring means includes an electronic sensor for measuring the resistivity of said solution between a pair of spaced electrodes.
Claim 11
Dependent Claim
23 words
The system of claim 7 further characterized by and including means for agitating solution within said test cell to provide a homogeneous fluid.
Claim 12
Dependent Claim
34 words
The structure of claim 9 further characterized in that said agitating means includes a magnet positioned within the test cell and a motor positioned outside of the test cell and directly adjacent the magnet.
Claim 13
Dependent Claim
28 words
The system of claim 7 further characterized in that said ion removal means includes a plurality of ion columns connected in parallel between said reservoir and test cell.
References Cited (Backward Citations)
USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-05-16 | 1980-11-15 | 1981-05-17 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-05-16 | 1984-11-15 | 1985-05-17 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-05-16 | 1988-11-15 | 1989-05-17 | $7700.00 | Window Closed / Lapsed |