Electrical continuity and voltage testing device

Claim 2

In a circuit testing device, a. a casing, b. two probes, one of which projects from the casing c. a voltage level testing circuit operatively connected with said one probe, and d. electrical continuity testing circuitry connected between said two probes, e. said voltage level testing circuit including voltage level indicator means, transistor amplifier means connected with the indicator means to energize same in response to different voltages applied to said one probe, the indicator means connected in the emitter-collector circuitry of the transistor amplifier means, said one probe operatively coupled to the base electrode of said transistor amplifier means, and DC voltage means directly connected with the emitter-collector circuitry of said transistor amplifier means.

Claim 3

The device of claim 1 wherein said electrical continuity testing circuitry includes a sounder.

Claim 4

The device of claim 2 wherein the sounder includes a coil and said electrical continuity testing circuitry includes a Zener diode connected across said coil, and a battery connected in series with said diode and coil.

Claim 5

The device of claim 3 wherein the electrical continuity testing circuitry includes a meter connected in series with said coil and Zener diode.

Claim 6

The device of claim 2 wherein said electrical continuity testing circuitry includes a diode bridge connected in series between said one probe and said sounder in said continuity testing circuitry, said bridge also connected in series with said transistor amplifier means in said voltage level testing circuit.

Claim 7

The device of claim 1 wherein said indicator means includes multiple voltage level indicators.

Claim 8

The device of claim 6 wherein there are three of said indicators, and said transistor amplifier means includes three amplifiers respectively connected with said indicators to selectively energize same in response to 120, 240 and 480 volts respectively applied to said one probe.

Claim 9

The device of claim 7 wherein said voltage level testing circuit includes a gas discharge lamp and electrical resistance connected in series between said one probe and a common, and three photocells located to be illuminated by radiation from said lamp, said photocells respectively connected with the three amplifiers.

Claim 10

The device of claim 7 wherein said voltage level testing circuit includes three Zener diodes each connected in series between said one probe and a common, said amplifiers respectively connected with the three Zener diodes to be responsive to different voltage levels established by said Zener diodes.

Claim 11

The device of claim 9 wherein said voltage level testing circuit includes a sounder and a battery, and a controller connected with said battery and sounder and energizable in response to voltage application to said one probe to effect battery energization of said sounder.

Claim 12

The device of claim 10 including a switch connected in series between said battery and sounder.

Claim 13

The device of claim 10 wherein the controller comprises a semiconductor having base, emitter and collector terminals, and said voltage level testing circuit includes a rectifier bridge having a first junction connected with said one probe, second and third junctions connected with said base and emitter terminals, and a fourth junction connected with a common at the switch, the collector terminal connected with the sounder.

Claim 14

The device of claim 7 wherein each of said amplifiers includes primary and secondary transistors each having base, emitter and collector electrodes, the primary transistor connected in controlling relation with the secondary transistor, each indicator connected in the emitter-collector circuit of the secondary transistor, the one probe electrically connected with the base electrode of each primary transistor, DC voltage means connected in series with the emitter-collector circuit of each transistor, and a resistor connected between the emitter and said DC voltage means.

Claim 15

The device of claim 13 wherein the voltage level testing circuit includes three diode bridges each having a first junction connected with said one probe, the bridges having second junctions respectively connected with the base electrodes of the primary transistors, and the bridges having third junctions respectively connected with the DC voltage means.

Claim 16

In a circuit testing device, a. a casing, b. two probes, one of which projects from the casing, c. a voltage level testing circuit operatively connected with said one probe, and d. electrical continuity testing circuitry connected between said two probes, e. said voltage level testing circuit including voltage level indicator means, amplifier means connected with the indicator means to energize same in response to different voltages applied to said one probe, the amplifier means including primary and secondary transistor means, the primary transistor means connected in controlling relation with the secondary transistor means, the indicator means connected in the emitter-collector circuit of the secondary transistor means, diode bridge means having a first junction connected with the one probe and a second junction connected with the base electrode of the primary transistor means, and DC voltage means connected with a junction of said bridge means and also connected with the emitter-collector circuits of said primary and secondary transistor means.

Claim 17

In a circuit testing device, a. a casing, b. two probes, one of which projects from the casing, c. a voltage level testing circuit operatively connected with said one probe, and d. electrical continuity testing circuitry connected between said two probes, e. said voltage level testing circuit including voltage level indicator means, amplifier means connected with the indicator means to energize same in response to different voltages applied to said one probe, the amplifier means including primary and secondary transistor means, the primary transistor means connected in controlling relation with the secondary transistor means, the indicator means connected in the emitter-collector circuit of the secondary transistor means, diode bridge means having a first junction connected with the one probe and a second junction connected with the base electrode of the primary transistor means, and DC voltage means connected with a junction of said bridge means and also connected with the emitter-collector circuits of said primary and secondary transistor means.