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US4015175A Expired / Lapsed US ⏱️ 0.0 years remaining

Discrete, fixed-value capacitor

Assignee: Texas Instruments Inc
•
Filing: 1975-06-02
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Granted: 1977-03-29
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Expires: 1995-06-02
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Abstract

Abstract An axial-lead fixed-value capacitor comprising a metal-nitride-oxide-silicon chip in a standard diode package has been fabricated, having capacitance values in the 10 to 1000 pico-farad range. The device features a beveled-edge configuration which contributes to a low leakage current and also facilitates the sealing of the semiconductor chip in a double plug axial-lead package. The double layer dielectric medium comprises a thermally grown silicon oxide film typically 450 angstroms thick, for example, and a plasma deposited layer of silicon nitride typically 350 angstroms thick, for example.

Inventors

  • 👤 Don L. Kendall
  • 👤 Byron T. Ahlburn
  • 👤 Klaus C. Wiemer

Bibliographic Details

Application Number —
Jurisdiction US
Data Source google_patents
Last Synchronized 2026-10-28 09:35
CPC Classifications
H; H01; H01G; H01G4/00; H01G4/002; H01G4/018; H01G4/06; H01G4/08

Claims Analysis

Total Claims: 7
Claim 1
Independent Claim 95 words
A capacitor device comprising a double-plug, coaxial-lead, glass-sealed package having a semiconductor capacitor chip sealed therein said chip comprising a monocrystalline silicon body doped to a concentration in excess of 10 19 atoms per cm 3 and having first and second substantially parallel opposite faces, a first dielectric layer of thermally grown silicon oxide on said first face, a second dielectric layer on said oxide comprising silicon nitride, a first metal film comprising Ti:W on said nitride layer, a gold-comprising film on said Ti:W, and a metal contact comprising silver-coated nickel on said second face.
Claim 2
Dependent Claim 95 words
A capacitor device comprising a double-plug, coaxial-lead, glass-sealed package having a semiconductor capacitor chip sealed therein said chip comprising a monocrystalline silicon body doped to a concentration in excess of 10 19 atoms per cm 3 and having first and second substantially parallel opposite faces, a first dielectric layer of thermally grown silicon oxide on said first face, a second dielectric layer on said oxide comprising silicon nitride, a first metal film comprising Ti:W on said nitride layer, a gold-comprising film on said Ti:W, and a metal contact comprising silver-coated nickel on said second face.
Claim 3
Dependent Claim 16 words
A device as in claim 1, wherein said silicon oxide film is about 300-600 angstroms thick.
Claim 4
Dependent Claim 15 words
A device as in claim 2, wherein said silicon nitride is about 200-600 angstroms thick.
Claim 5
Dependent Claim 11 words
A device as in claim 1, wherein said dopant is arsenic.
Claim 6
Dependent Claim 89 words
A semiconductor capacitor chip comprising a monocrystalline silicon body doped to a concentration in excess of 10 19 atoms per cm 3 and having first and second substantially parallel opposite faces, a first dielectric layer of thermally grown silicon oxide about 300-600 angstroms thick on said first face, a second dielectric layer on said oxide comprising silicon nitride about 200-600 angstroms thick, a first metal film comprising Ti:W on said nitride layer, a gold-comprising film on said Ti:W, and a metal contact comprising silver-coated nickel on said second face.
Claim 7
Dependent Claim 89 words
A semiconductor capacitor chip comprising a monocrystalline silicon body doped to a concentration in excess of 10 19 atoms per cm 3 and having first and second substantially parallel opposite faces, a first dielectric layer of thermally grown silicon oxide about 300-600 angstroms thick on said first face, a second dielectric layer on said oxide comprising silicon nitride about 200-600 angstroms thick, a first metal film comprising Ti:W on said nitride layer, a gold-comprising film on said Ti:W, and a metal contact comprising silver-coated nickel on said second face.

References Cited (Backward Citations)

US2315199A Cited
US3256588A Cited
US3597667A Cited
US3471756A Cited
US3458783A Cited
US3518495A Cited
US3732469A Cited

USPTO Annuity & Maintenance Windows

Annuity Stage Window Opens Payment Deadline Surcharge Period Until Estimated Fee Status
3.5 Years (Year 4) 1980-03-28 1980-09-27 1981-03-29 $2000.00 Window Closed / Lapsed
7.5 Years (Year 8) 1984-03-28 1984-09-27 1985-03-29 $3760.00 Window Closed / Lapsed
11.5 Years (Year 12) 1988-03-28 1988-09-27 1989-03-29 $7700.00 Window Closed / Lapsed

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