US4014772A
Expired / Lapsed
US
⏱️ 0.0 years remaining
Method of radiation hardening semiconductor devices
Assignee: RCA Corp
•
Filing: 1975-04-24
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Granted: 1977-03-29
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Expires: 1995-04-24
Abstract
Abstract An electronic device, such as a metal-oxide-semiconductor (MOS) transistor, is radiation hardened by removing impurities such as sodium and other alkali species, from the oxide. The impurities are first caused to migrate to the surface of the oxide by exposure to electromagnetic radiation having an energy greater than the oxide band gap while the oxide is immersed in an electric field. The impurities are then rinsed from the surface of the oxide with a solvent.
Inventors
- 👤 Murray Henderson Woods
- 👤 Richard Williams
Bibliographic Details
Application Number
—
Jurisdiction
US
Data Source
google_patents
Last Synchronized
2026-11-01 21:18
CPC Classifications
H; H10; H10P; H10P95/00; H10D; H10D64/00; H10D64/01; H10D64/011
Claims Analysis
Total Claims: 10
Claim 1
Independent Claim
86 words
A method for enabling a metal-dielectric-semiconductor device, having alkali metal as atoms or compounds, and alkali metal ions in the dielectric to avoid ionization of the alkali metal atoms or compounds by ionizing radiation comprising the steps of: exposing the device to a flux of ionizing electromagnetic radiation sufficient to create alkali metal ions from the alkali metal atoms or compounds in the dielectric; charging a surface of the dielectric with a negative charge; and removing ions which have drifted to the surface of the dielectric.
Claim 2
Independent Claim
86 words
A method for enabling a metal-dielectric-semiconductor device, having alkali metal as atoms or compounds, and alkali metal ions in the dielectric to avoid ionization of the alkali metal atoms or compounds by ionizing radiation comprising the steps of: exposing the device to a flux of ionizing electromagnetic radiation sufficient to create alkali metal ions from the alkali metal atoms or compounds in the dielectric; charging a surface of the dielectric with a negative charge; and removing ions which have drifted to the surface of the dielectric.
Claim 3
Dependent Claim
31 words
The method of claim 1, wherein the radiation has a DeBroglie wave length corresponding to an energy greater than at least an 8.8 electron volt band gap energy for the dielectric.
Claim 4
Dependent Claim
14 words
The method of claim 2, wherein the radiation is sufficient to penetrate the dielectric.
Claim 5
Dependent Claim
30 words
The method of claim 3, wherein the surface of the dielectric is charged in a dielectric fluid and irradiated with a flux of ionizing electromagnetic radiation in a dielectric fluid.
Claim 6
Dependent Claim
14 words
The method of claim 4, wherein the ionizing electromagnetic radiation is ultraviolet electromagnetic radiation.
Claim 7
Dependent Claim
13 words
The method of claim 5, wherein the dielectric is an oxide of silicon.
Claim 8
Dependent Claim
11 words
The method of claim 6, wherein the dielectric fluid is air.
Claim 9
Dependent Claim
26 words
The method of claim 7, wherein the step of removing ions or atoms at a surface of the dielectric comprises contacting the dielectric with a solvent.
Claim 10
Dependent Claim
20 words
The method of claim 8, wherein the removing step further comprises the step of heating the device in a vacuum.
References Cited (Backward Citations)
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US3446722A
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USPTO Annuity & Maintenance Windows
| Annuity Stage | Window Opens | Payment Deadline | Surcharge Period Until | Estimated Fee | Status |
|---|---|---|---|---|---|
| 3.5 Years (Year 4) | 1980-03-28 | 1980-09-27 | 1981-03-29 | $2000.00 | Window Closed / Lapsed |
| 7.5 Years (Year 8) | 1984-03-28 | 1984-09-27 | 1985-03-29 | $3760.00 | Window Closed / Lapsed |
| 11.5 Years (Year 12) | 1988-03-28 | 1988-09-27 | 1989-03-29 | $7700.00 | Window Closed / Lapsed |